公开(公告)号：US20170023634A1

公开(公告)日：2017-01-26

申请号：US15168837

申请日：2016-05-31

Applicant: Renesas Electronics Corporation

Inventor： Yuji TAKEHARA ,  Takeo MIMURA ,  Tomohiro OONO

IPC: G01R31/26

CPC classification number: G01R31/2642 ,  G01R1/0458 ,  G01R1/06777 ,  G01R31/2608 ,  G01R31/2817 ,  G01R31/2874 ,  G01R31/2875

Abstract: There is a need to improve estimation accuracy of a failure estimation method or its failure estimation apparatus that performs failure estimation on a targeted instrument based on history information about several instruments mounted with the same type of semiconductor device as an instrument targeted at failure estimation. A failure estimation apparatus that includes a history information database storing history information about a plurality of instruments mounted with the same type of semiconductor device and performs failure estimation on a targeted instrument mounted with a semiconductor device whose type equals the type, wherein the history information contains operation information and failure information; wherein the operation information indicates a chronological operating state of the semiconductor device mounted on the instruments; wherein the failure information indicates a failure cause of a failed instrument; and wherein the operating state is categorized into a plurality of classifications.

Abstract translation: 需要提高故障估计方法的故障估计方法或其失效估计装置的故障估计装置，所述故障估计装置根据关于以与作为故障估计的仪器相同类型的半导体装置安装的几台仪器的历史信息，对目标仪器进行故障估计。 一种故障估计装置，包括历史信息数据库，其存储关于安装有相同类型的半导体装置的多个仪器的历史信息，并对安装有类型等于类型的半导体器件的目标仪器执行故障估计，其中历史信息包含 操作信息和故障信息; 其中操作信息指示安装在仪器上的半导体器件的按时间顺序的操作状态; 其中所述故障信息指示故障仪器的故障原因; 并且其中所述操作状态被分类为多个分类。

公开(公告)号：US20170003337A1

公开(公告)日：2017-01-05

申请号：US15098052

申请日：2016-04-13

Applicant: Renesas Electronics Corporation

Inventor： Katsutoshi BITO ,  Daisuke IIJIMA ,  Yuji TAKEHARA

IPC: G01R31/26 ,  H01L29/866 ,  H01L27/06 ,  H01L23/498 ,  H02P29/024 ,  H01L27/02 ,  H02P27/08 ,  H02M7/537 ,  H03K19/0185 ,  H01L29/739 ,  H01L23/34

CPC classification number: H02P29/024 ,  G01R31/30 ,  H01L23/36 ,  H01L23/3735 ,  H01L27/0255 ,  H01L27/0664 ,  H01L29/7395 ,  H01L29/866 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2924/19107 ,  H02M7/537 ,  H02M7/53871 ,  H02M2001/327 ,  H02P27/08 ,  H02P29/0241 ,  H02P29/68 ,  H03K19/018507 ,  H01L2924/00014

Abstract: An obtained margin is smaller than a margin to be kept for a fault period predicted by life prediction based on a power cycle test, extending a maintenance cycle for replacement and so on. A method of detecting a fault of a semiconductor device including a power device mounted on a metal base and a drive circuit for driving the power device, the method detecting a fault of the semiconductor device beforehand based on an increase in thermal resistance between the metal base and the power device. A state of the power device is measured immediately before and after the power device is driven by the drive circuit. A temperature difference of the power device before and after driving is calculated according to the result of measurement. An increase in thermal resistance between the metal base and the power device is detected based on the temperature difference and an amount of electricity inputted to the power device in the driving period, and a fault of the semiconductor device is detected beforehand according to the increase.

Abstract translation: 所获得的余量小于通过基于动力循环测试的寿命预测所预测的故障期间保持的余量，延长维修周期等。 一种检测包括安装在金属基座上的功率器件和用于驱动功率器件的驱动电路的半导体器件的故障的方法，该方法预先基于金属基底之间的热阻增加来检测半导体器件的故障 和电源设备。 功率器件的状态是在驱动电路驱动电力设备之前和之后立即测量的。 根据测量结果计算驱动前后功率器件的温差。 基于在驱动期间输入到功率器件的温度差和电量来检测金属基座和功率器件之间的热阻的增加，并且根据增加预先检测出半导体器件的故障。

公开(公告)号：US20140032942A1

公开(公告)日：2014-01-30

申请号：US13953306

申请日：2013-07-29

Applicant: RENESAS ELECTRONICS CORPORATION

Inventor： Yuji TAKEHARA ,  Koji SAIKUSA ,  Ryotaro KUDO ,  Toshio NAGASAWA

IPC: H02M3/156 ,  G06F1/26

CPC classification number: H02M3/156 ,  G06F1/26 ,  H02M3/1584 ,  H02M2001/0019

Abstract: A voltage regulator has a voltage converter circuit and a control unit. The control unit controls the voltage converter circuit so that an output voltage attains a target voltage when the voltage regulator is in a no-load condition so as to have a transition characteristic in which the output voltage decreases with increase in the load current. The control unit calculates deviation between the output voltage and an ideal value thereof when a load condition of the voltage regulator is a first load condition, and corrects the target voltage by the output voltage adjustment unit. so The control unit also calculates deviation between rate of change of the output voltage with respect to the load current and an ideal value thereof, and corrects the transition characteristic so that the deviation becomes small to minimize deviation.

Abstract translation: 电压调节器具有电压转换器电路和控制单元。 控制单元控制电压转换器电路，使得当电压调节器处于空载状态时，输出电压达到目标电压，从而具有输出电压随着负载电流的增加而降低的转变特性。 当电压调节器的负载条件为第一负载条件时，控制单元计算输出电压与其理想值之间的偏差，并且通过输出电压调节单元校正目标电压。 因此，控制单元还计算输出电压相对于负载电流的变化率和理想值之间的偏差，并且校正转移特性使得偏差变小以使偏差最小化。