PHOTODETECTOR
    1.
    发明申请

    公开(公告)号:US20220013550A1

    公开(公告)日:2022-01-13

    申请号:US17485057

    申请日:2021-09-24

    Abstract: A photodetector includes: a pixel array in which a plurality of pixels are arranged in an array. Each of the plurality of pixels includes: a first semiconductor layer and a second semiconductor layer which are a first conductivity type, the second semiconductor layer located above the first semiconductor layer and having an impurity concentration lower than the impurity concentration of the first semiconductor layer; and a first semiconductor region, of a second conductivity type different from the first conductivity type, which is disposed in the second semiconductor layer and joined to the first semiconductor layer. The first semiconductor layer and the first semiconductor region constitute a multiplication region in which a charge is multiplied by avalanche multiplication. The pixel array includes a first separator of the first conductivity type disposed in the second semiconductor layer and a second separator of the first conductivity type disposed in the first semiconductor layer.

    PHOTO SENSOR AND DISTANCE MEASURING SYSTEM USING SAID PHOTO SENSOR

    公开(公告)号:US20220246782A1

    公开(公告)日:2022-08-04

    申请号:US17721854

    申请日:2022-04-15

    Abstract: A photosensor includes a plurality of avalanche photodiodes (APD) provided on a first main surface, a first isolation region that is provided on the first main surface and electrically separates the plurality of APDs from one another in a first direction, and a second isolation region that is provided on the first main surface and electrically separates the plurality of APDs from one another in a second direction different from a direction of the first isolation region. The first isolation region and the second isolation region are depleted. At least one of the first isolation region or the second isolation region is terminated at a first connection portion at which the first isolation region and the second isolation region are connected.

    DISTANCE MEASURING DEVICE AND SOLID-STATE IMAGING DEVICE

    公开(公告)号:US20240004037A1

    公开(公告)日:2024-01-04

    申请号:US18466458

    申请日:2023-09-13

    CPC classification number: G01S7/4816 G01S7/484 G01S17/10

    Abstract: A distance measuring device includes: a light emitting unit; a pixel array including a plurality of pixels arranged in a matrix; and a control unit calculating the distance to a measuring target. Each of the plurality of pixels includes: an avalanche photodiode; a primary accumulation region for temporarily holding a signal charge; and a plurality of memory elements provided in parallel with respect to the primary accumulation region. The control unit performs a plurality of times of light exposure at timings corresponding to different distance sections within one pulse period of outgoing light from the light emitting unit, allows signal charges generated after the respective times of light exposure to be accumulated in the different memory elements, and reads out the signal charges to calculate the distance to the measuring target.

    PHOTODETECTOR
    6.
    发明申请

    公开(公告)号:US20220271067A1

    公开(公告)日:2022-08-25

    申请号:US17733610

    申请日:2022-04-29

    Abstract: A solid-state image sensor includes at least two or more APDs formed on a substrate. First regions are arranged outside the APDs as viewed in plane. Adjacent ones of the APDs and the first regions are separated from each other through a separation region. A first voltage V21 is applied to a fourth semiconductor layer of the APD, and a second voltage V22 is applied to a fifth semiconductor layer of the first region. The first voltage V21 is higher than the second voltage V22.

    PHOTODETECTOR
    8.
    发明申请

    公开(公告)号:US20220005848A1

    公开(公告)日:2022-01-06

    申请号:US17479835

    申请日:2021-09-20

    Abstract: A photodetector includes: a semiconductor substrate having a first main surface and a second main surface; a first semiconductor layer that is of a first conductivity type, and is included in the semiconductor substrate and closer to the first main surface than to the second main surface; a second semiconductor layer that is of a second conductivity type different from the first conductivity type, and is included in the semiconductor substrate and interposed between the first semiconductor layer and the second main surface; a multiplication region that causes avalanche multiplication to a charge generated in the semiconductor substrate through photoelectric conversion; a circuit region disposed alongside the first semiconductor layer in a direction parallel to the first main surface; at least one isolation transistor disposed in the circuit region; and an isolation region interposed between the first semiconductor layer and the circuit region.

    PHOTODETECTOR
    9.
    发明申请

    公开(公告)号:US20210028202A1

    公开(公告)日:2021-01-28

    申请号:US17039128

    申请日:2020-09-30

    Abstract: A photodetector includes: a semiconductor substrate having a first main surface and a second main surface; a first semiconductor layer that is of a first conductivity type, and is included in the semiconductor substrate and closer to the first main surface than to the second main surface; a second semiconductor layer that is of a second conductivity type different from the first conductivity type, and is included in the semiconductor substrate and interposed between the first semiconductor layer and the second main surface; a multiplication region that causes avalanche multiplication to a charge generated in the semiconductor substrate through photoelectric conversion; a circuit region disposed alongside the first semiconductor layer in a direction parallel to the first main surface; at least one isolation transistor disposed in the circuit region; and an isolation region interposed between the first semiconductor layer and the circuit region.

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