Abstract:
A method of manufacturing an electrical device in which a liquid electrically insulating filler substance is applied to a layer of electrically active grains which filler is allowed to contract thus exposing the peaks of the grains after which it is allowed to harden. The filler is preferably a resin hardenable by polymerization or by polycondensation in a liquid solution with a volatile solvent, for example polyurethane.
Abstract:
LAYER OF THE HALIDE OF THE II MATERIAL IS SUBSEQUENTLY REMOVED WITH A SOLVENT THEREOF.
A METHOD OF FORMING A HETEROJUNCTION IN A SEMICONDUCTOR DEVICE WHEREIN A SUBSTRATE OF A POLYCRYSATLLINE LAYER OF A II-VI MATERIAL COATED WITH A THIN LAYER OF A HALIDE OF COPPER, SILVER AND/OR GOLD IS HEATED TO EFFECT A SOLID-STATE REACTION WHEREIN A HALIDE LAYER OF THE II-VI MATERIAL IS FORMED IN THE THIN LAYER AND AT LEAST ONE OF THE METALS COPPER, SILVER, AND GOLD PENETRATES INTO THE SUBSTRATE TO FORM A COMPOUND WITH THE VI MATERIAL WHICH PROVIDES A HETEROJUNCTIN WITH THE SUBSTRATE. THE THIN
Abstract:
An electrode system comprising a semiconductive granular layer substantially one grain in thickness is manufactured by embedding a layer of this semiconductive material in an insulating material, e.g., polyurethane so that the peaks of the grains extend substantially above the insulating material i.e., the spaces between the grains are filled to a level well below the peaks of the grains. An electrode is formed on this layer by depositing an electrically conducting layer. The so-coated layer is thereafter subjected to an abrasive on a carrier comprising grains whose average diameter is smaller than the average diameter of the electrically active grains and whose diameter exceeds the average spacing between the active grains to remove only the electrode layer covering the exposed grain peaks without abrading the grains themselves. The grain size of the abrasive is critical to avoid grains of the abrasive being lodged in the depressions between the grains of the semiconductive material and to avoid removing portions of the semiconductive grains.