MULTI CHARGED PARTICLE BEAM WRITING APPARATUS

    公开(公告)号:US20220399181A1

    公开(公告)日:2022-12-15

    申请号:US17805887

    申请日:2022-06-08

    Abstract: In one embodiment, a multi charged particle beam writing apparatus includes a blanking aperture array substrate provided with a plurality of blankers configured to respectively perform blanking deflection on a plurality of charged particle beams included in a multi-beam, and a first shield member which is disposed downstream of the blanking aperture array substrate with respect to a travel direction of the multi-beam, has a cylindrical part in which the multi-beam passes through, and is composed of a high magnetic permeability material.

    HEAT TRANSFER PLATE AND WRITING APPARATUS
    2.
    发明申请

    公开(公告)号:US20170372869A1

    公开(公告)日:2017-12-28

    申请号:US15586858

    申请日:2017-05-04

    CPC classification number: H01J37/3007 H01J37/3177 H01J2237/002

    Abstract: A heat transfer plate according to the present embodiment includes a first heat transfer unit transferring heat generated in a member mounted on the first heat transfer unit, the heat being generated due to shaping or controlling of a beam generated by a light source in a decompressed atmosphere, a second heat transfer unit provided around the first heat transfer unit, and a plurality of third heat transfer units making the first heat transfer unit movable with respect to the second heat transfer unit, the plurality of third heat transfer units connecting the first and second heat transfer units.

    MULTIPLE-CHARGED PARTICLE-BEAM IRRADIATION APPARATUS AND MULTIPLE-CHARGED PARTICLE-BEAM IRRADIATION METHOD

    公开(公告)号:US20220102113A1

    公开(公告)日:2022-03-31

    申请号:US17448559

    申请日:2021-09-23

    Abstract: A multiple-charged particle-beam irradiation apparatus includes a shaping aperture array substrate that causes a charged particle beam to pass through a plurality of first apertures to form multi-beams, a plurality of blanking aperture array substrates each provided with a plurality of second apertures, which enable corresponding beams to pass, and including a blanker arranged at each of the second apertures, a movable table on which the blanking aperture array substrates are mounted so as to be spaced apart from each other in a second direction, which is orthogonal to a first direction along an optical axis, and that moves in the second direction to position one of the blanking aperture array substrates on the optical axis, and an alignment mechanism that performs an alignment adjustment between the blanking aperture array substrate on the optical axis and the shaping aperture array substrate.

    MULTI CHARGED PARTICLE BEAM WRITING APPARATUS

    公开(公告)号:US20200343073A1

    公开(公告)日:2020-10-29

    申请号:US16835369

    申请日:2020-03-31

    Abstract: Provided is a multi charged particle beam writing apparatus including: an emission unit emitting a charged particle beam; a restriction aperture unit having a first opening having a variable opening area, the restriction aperture unit shielding a portion of the charged particle beam; a shaping aperture array substrate having a plurality of second openings, the shaping aperture array substrate forming multiple beams by allowing the shaping aperture array substrate to be irradiated with the charged particle beam passing through the first opening and allowing a portion of the charged particle beam to pass through the plurality of second openings; and a blanking aperture array substrate having a plurality of third openings, each beam of the multiple beams passing through the plurality of third openings, the blanking aperture array substrate being capable of independently deflecting each beam of the multiple beams.

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