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1.发明公开公开(公告)号：US20230394881A1
公开(公告)日：2023-12-07
申请号：US18202769
申请日：2023-05-26
Applicant: NEC Corporation
Inventor： Kyota HIGA , Yasunori BABAZAKI , Ryuhei ANDO
IPC: G06V40/20 , G06V10/77 , G06V10/778
CPC classification number: G06V40/20 , G06V10/7715 , G06V10/778
Abstract: An information processing apparatus includes at least one processor, and the at least one processor carries out: a detection process of detecting a person and an object based on sensor information; a recognition process of recognizing an action of the person based on a relevance between the person and the object; and a generation process of generating unsafety information pertaining to unsafety of the action with reference to a detection result and a recognition result.
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公开(公告)号：US20210166037A1
公开(公告)日：2021-06-03
申请号：US16769511
申请日：2018-09-26
Applicant: NEC Corporation
Inventor： Kyota HIGA
Abstract: An image processing device has: a change detecting unit configured to, based on a captured image in which an product to be monitored is shown, detect a change in display status of the product; and a display detecting unit configured to detect that the product is returned to a different place from a place where the product has been picked up based on the change in display status of the product detected by the change detecting unit and on a person included in the captured image.
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3.发明申请公开(公告)号：US20200167561A1
公开(公告)日：2020-05-28
申请号：US16776103
申请日：2020-01-29
Applicant: NEC Corporation
Inventor： Kyota HIGA , Ruihan BAO , Takami SATO , Ryota MASE , Kota IWAMOTO
IPC: G06K9/00 , G06Q10/08 , G06Q30/06 , G06F16/583
Abstract: Disclosed is a display condition analysis device which is capable of analyzing the display conditions of products. This display condition analysis device is provided with: a product recognition means for recognizing, from a display image taken of products on display, the products in the display image; and a display condition analysis means for analyzing, on the basis of the positions of the recognized products, the display conditions of the products on display.
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公开(公告)号：US20200013169A1
公开(公告)日：2020-01-09
申请号：US16491649
申请日：2017-03-31
Applicant: NEC Corporation
Inventor： Kyota HIGA
Abstract: A state of a display rack is evaluated accurately. An image processing device includes a detection unit configured to detect a change area related to a display rack from a captured image in which an image of the display rack is captured, a classification unit configured to classify a change related to the display rack in the change area, and an evaluation unit configured to evaluate a display state of goods, based on a classification result.
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5.发明公开公开(公告)号：US20230394557A1
公开(公告)日：2023-12-07
申请号：US18236534
申请日：2023-08-22
Applicant: NEC Corporation
Inventor： Kyota HIGA , Emi KITAGAWA
IPC: G06Q30/0601 , G06T7/73 , G06Q10/087 , G06Q20/18 , G06T7/00 , G06V20/52
CPC classification number: G06Q30/0633 , G06T7/74 , G06Q10/087 , G06T2207/30232 , G06T7/0008 , G06V20/52 , G06T2207/10024 , G06Q20/18
Abstract: A change detection means 840 detects an area of change in a product shelf on which a product has been arranged, on the basis of a captured image of the product. A classification means 850 classifies the change in the product shelf in the detected area of change. A shopping list generation means 860 generates a shopping list for a customer on the basis of the classification of the change in the product shelf and of shelving information on the product shelf.
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Patent Agency Ranking
6.发明申请公开(公告)号：US20200082193A1
公开(公告)日：2020-03-12
申请号：US16570809
申请日：2019-09-13
Applicant: NEC Corporation
Inventor： Kyota HIGA
Abstract: The present invention provides a function capable of detecting, with a higher degree of precision, a region that has a high probability of not having been recognized. An image processing apparatus according to the present invention is provided with: a recognition means for recognizing a product from a captured image obtained by capturing an image of a displayed product; and a detection means for detecting a region of a product that is included in the captured image but is not recognized by the recognition means, on the basis of furniture information related to furniture in which the product is displayed.
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公开(公告)号：US20200005492A1
公开(公告)日：2020-01-02
申请号：US16491656
申请日：2017-03-31
Applicant: NEC Corporation
Inventor： Kyota HIGA
Abstract: A state of a display rack is determined more accurately. An image processing device includes a detection unit configured to detect a change area related to a display rack from a captured image in which an image of the display rack is captured, and a classification unit configured to classify a change related to the display rack in the change area, based on a previously learned model of the change related to the display rack or distance information indicating an image captured before an image capturing time of the captured image.
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8.发明申请DISPLAY CONDITION ANALYSIS DEVICE, DISPLAY CONDITION ANALYSIS METHOD, AND PROGRAM RECORDING MEDIUM 审中-公开显示条件分析装置，显示条件分析方法和程序记录介质公开(公告)号：US20170017840A1
公开(公告)日：2017-01-19
申请号：US15124851
申请日：2015-02-19
Applicant: NEC CORPORATION
Inventor： Kyota HIGA , Ruihan BAO , Takami SATO , Ryota MASE , Kota IWAMOTO
Abstract: Disclosed is a display condition analysis device which is capable of analyzing the display conditions of products. This display condition analysis device is provided with: a product recognition means for recognizing, from a display image taken of products on display, the products in the display image; and a display condition analysis means for analyzing, on the basis of the positions of the recognized products, the display conditions of the products on display.
Abstract translation: 公开了能够分析产品的显示条件的显示条件分析装置。 该显示条件分析装置设置有：产品识别装置，用于从显示器上拍摄的产品的显示图像识别显示图像中的产品; 以及显示条件分析装置，用于基于所识别的产品的位置来分析显示的产品的显示条件。
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公开(公告)号：US20220317055A1
公开(公告)日：2022-10-06
申请号：US17615910
申请日：2019-06-03
Applicant: NEC Corporation
Inventor： Kyota HIGA
Abstract: An inspection apparatus (100) detects an inspection object (90) from first image data (10) in which the inspection object (90) is included. The inspection apparatus (100) generates second image data (20) by performing a geometric transform on the first image data (10) in such a way that a view of the detected inspection object (90) becomes a view satisfying a predetermined reference. In an inference phase, the inspection apparatus (100) detects, by using an identification model for detecting an abnormality of the inspection object (90), an abnormality of the inspection object (90) included in the second image data (20). Further, in a learning phase, the inspection apparatus (100) learns, by using the second image data (20), an identification model for detecting an abnormality of the inspection object (90).
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公开(公告)号：US20200089988A1
公开(公告)日：2020-03-19
申请号：US16692083
申请日：2019-11-22
Applicant: NEC Corporation
Inventor： Kyota HIGA
Abstract: An image processing apparatus, an image processing method, and a program, provide accurate collation even when an image contains a number of identical or similar subjects. The image processing apparatus generates, with respect to feature points to be detected from a first image, a first local feature amount group including local feature amounts representing feature amounts of local regions containing the respective feature points, and a first coordinate position information group including coordinate position information. The image processing apparatus clusters the feature points of the first image based on the first coordinate position information group. The image processing apparatus collates, in units of clusters, the first local feature amount group with a second local feature amount group formed from local feature amounts of feature points detected from a second image.
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