Invention Application
- Patent Title: INSPECTION APPARATUS, CONTROL METHOD, AND PROGRAM
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Application No.: US17615910Application Date: 2019-06-03
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Publication No.: US20220317055A1Publication Date: 2022-10-06
- Inventor: Kyota HIGA
- Applicant: NEC Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- International Application: PCT/JP2019/022037 WO 20190603
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G06T3/00 ; G06T7/168

Abstract:
An inspection apparatus (100) detects an inspection object (90) from first image data (10) in which the inspection object (90) is included. The inspection apparatus (100) generates second image data (20) by performing a geometric transform on the first image data (10) in such a way that a view of the detected inspection object (90) becomes a view satisfying a predetermined reference. In an inference phase, the inspection apparatus (100) detects, by using an identification model for detecting an abnormality of the inspection object (90), an abnormality of the inspection object (90) included in the second image data (20). Further, in a learning phase, the inspection apparatus (100) learns, by using the second image data (20), an identification model for detecting an abnormality of the inspection object (90).
Public/Granted literature
- US11906441B2 Inspection apparatus, control method, and program Public/Granted day:2024-02-20
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