METHOD FOR PERFORMING AUTOMATIC LAYOUT DEFECT CHECKING CONTROL REGARDING CIRCUIT DESIGN, ASSOCIATED APPARATUS AND ASSOCIATED COMPUTER-READABLE MEDIUM

    公开(公告)号:US20250005257A1

    公开(公告)日:2025-01-02

    申请号:US18739311

    申请日:2024-06-10

    Applicant: MEDIATEK INC.

    Abstract: A method for performing automatic layout defect checking (ALDC) control regarding circuit design, associated apparatus and an associated computer-readable medium are provided. The method applicable to a processing circuit may include: providing a web-based entry in an ALDC control system running on a processing circuit, for any user among multiple users to upload at least a layout file of a package substrate design of at least one package substrate to the ALDC control system, in order to obtain at least the layout file from a client electronic device through the web-based entry; utilizing at least one backend program module to check the layout file according to a plurality of predetermined layout defect checking rules to generate at least one checking result, and create a layout defect checking report of the package substrate design; and sending the layout defect checking report corresponding to the layout file to the client electronic device.

    ELECTRONIC PACKAGE WITH ROTATED SEMICONDUCTOR DIE

    公开(公告)号:US20220108954A1

    公开(公告)日:2022-04-07

    申请号:US17553760

    申请日:2021-12-16

    Applicant: MEDIATEK INC.

    Abstract: An electronic package includes a package substrate of a rectangular shape, and a chip package including a first interface circuit die and a second interface circuit die. The first interface circuit die and second interface circuit die are mounted on a redistribution layer structure and encapsulated within a molding compound. The chip package is mounted on a top surface of the package substrate and rotated relative to the package substrate above a vertical axis that is orthogonal to the top surface through a rotation offset angle. A metal ring is mounted on the top surface of the package substrate.

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