Charged particle lithography system

    公开(公告)号:US10297420B2

    公开(公告)日:2019-05-21

    申请号:US14287234

    申请日:2014-05-27

    摘要: A charged particle lithography system for exposing a wafer according to pattern data. The system comprises an electron optical column for generating a plurality of electron beamlets for exposing the wafer, the electron optical column including a beamlet blanker array for switching the beamlets on or off, a data path for transmitting beamlet control data for control of the switching of the beamlets, and a wafer positioning system for moving the wafer under the electron optical column in a scan direction. The wafer positioning system is provided with synchronization signals from the data path to align the wafer with the electron beams from the electron-optical column. The data path further comprises one or more processing units for generating the beamlet control data and one or more transmission channels for transmitting the beamlet control data to the beamlet blanker array.

    MODULATION DEVICE AND POWER SUPPLY ARRANGEMENT
    4.
    发明申请
    MODULATION DEVICE AND POWER SUPPLY ARRANGEMENT 有权
    调制装置和电源装置

    公开(公告)号:US20150136994A1

    公开(公告)日:2015-05-21

    申请号:US14400561

    申请日:2013-05-08

    IPC分类号: H01J37/317 H01J37/30

    摘要: The invention relates to a modulation device for modulating charged particle beamlets in accordance with pattern data in a multi-beamlet charged particle lithography system. The device comprises a plate-like body, an array of beamlet deflectors, a plurality of power supply terminals (202-205) for supplying at least two different voltages, a plurality of control circuits, and a conductive slab (201) for supplying electrical power to one or more of the power supply terminals (202-205). The plate-like body is divided into an elongated beam area (51) and an elongated non-beam area (52) positioned with their long edges adjacent to each other. The beamlet deflectors are located in the beam area. The control circuits are located in non-beam area. The conductive slab is connected to the control circuits in the non-beam area. The conductive slab comprises a plurality of thin conductive plates (202-205).

    摘要翻译: 本发明涉及一种用于根据多子束带电粒子光刻系统中的图案数据调制带电粒子子束的调制装置。 该装置包括板状主体,​​子束偏转器阵列,用于提供至少两个不同电压的多个电源端子(202-205),多个控制电路和用于提供电气的导电板(201) 一个或多个电源端子(202-205)的电力。 板状体被分成细长的射束区域(51)和长边相邻的细长非光束区域(52)。 子束偏转器位于光束区域中。 控制电路位于非光束区域。 导电板连接到非射束区域中的控制电路。 导电板包括多个薄导电板(202-205)。

    Modulation device and power supply arrangement
    5.
    发明授权
    Modulation device and power supply arrangement 有权
    调制装置和电源装置

    公开(公告)号:US09455122B2

    公开(公告)日:2016-09-27

    申请号:US14400561

    申请日:2013-05-08

    摘要: The invention relates to a modulation device for modulating charged particle beamlets in accordance with pattern data in a multi-beamlet charged particle lithography system. The device comprises a plate-like body, an array of beamlet deflectors, a plurality of power supply terminals (202-205) for supplying at least two different voltages, a plurality of control circuits, and a conductive slab (201) for supplying electrical power to one or more of the power supply terminals (202-205). The plate-like body is divided into an elongated beam area (51) and an elongated non-beam area (52) positioned with their long edges adjacent to each other. The beamlet deflectors are located in the beam area. The control circuits are located in non-beam area. The conductive slab is connected to the control circuits in the non-beam area. The conductive slab comprises a plurality of thin conductive plates (202-205).

    摘要翻译: 本发明涉及一种用于根据多子束带电粒子光刻系统中的图案数据调制带电粒子子束的调制装置。 该装置包括板状主体,​​子束偏转器阵列,用于提供至少两个不同电压的多个电源端子(202-205),多个控制电路和用于提供电气的导电板(201) 一个或多个电源端子(202-205)的电力。 板状体被分成细长的射束区域(51)和长边相邻的细长非光束区域(52)。 子束偏转器位于光束区域中。 控制电路位于非光束区域。 导电板连接到非射束区域中的控制电路。 导电板包括多个薄导电板(202-205)。