公开(公告)号：US20210354145A1

公开(公告)日：2021-11-18

申请号：US17308764

申请日：2021-05-05

Applicant: Leica Microsystems CMS GmbH

Inventor： Sebastian SIMMER ,  Stefan CHRIST

IPC: B01L9/00 ,  G02B21/34

Abstract: The present invention relates to a microscopic examination device comprising a microscope and a sample preparation arrangement for preparing one or more samples to be examined in said microscope, said preparing including pipetting one or more liquids into one or more sample receptacles for said one or more samples, said sample preparation arrangement comprising a base and a receiving structure adapted to receive said one or more sample receptacles, said sample preparation arrangement further comprising a pipetting guide movably fixed or fixable in relation to the receiving structure, said pipetting guide comprising one or more pipette guiding structures positionable in relation to said one or more sample receptacles by pivoting said pipetting guide in relation to said base. A method of preparing one or more samples for microscopic examination is also part of the present invention.

公开(公告)号：US20240201478A1

公开(公告)日：2024-06-20

申请号：US18287194

申请日：2022-02-24

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Sebastian SIMMER

IPC: G02B21/36 ,  G02B21/06 ,  G02B21/24

CPC classification number: G02B21/362 ,  G02B21/06 ,  G02B21/24

Abstract: A microscope for examining a sample includes a microscope stage for receiving the sample to be examined and further includes a microscope housing enclosing the microscope stage. The microscope housing includes a hinged door and an opening, the hinged door, in a closed state, covering the opening and including an inner surface and an outer surface, and, in an opened state, the inner surface or the outer surface becomes a top surface of an essentially horizontal work surface.

公开(公告)号：US20230086623A1

公开(公告)日：2023-03-23

申请号：US17939064

申请日：2022-09-07

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Florian FAHRBACH ,  Sebastian SIMMER ,  Stefan CHRIST ,  Nariman ANSARI

IPC: B01L3/00 ,  G02B21/36

Abstract: A microscope system includes a microscope stage having a top surface configured to have a sample carrier arranged thereon, the sample carrier being configured to receive at least one sample. The microscope system also includes an imaging system configured to image the at least one sample. The microscope system also includes an injector configured to inject a predetermined amount of a liquid into the sample carrier by injecting multiple successive and temporally spaced jets of the liquid into the sample carrier, each jet including a predetermined portion of the amount of liquid.