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公开(公告)号：US20230244069A1
公开(公告)日：2023-08-03
申请号：US18018907
申请日：2021-08-04
Applicant: LEICA MICROSYSTEMS CMS GMBH
Inventor： Stefan CHRIST
CPC classification number: G02B21/0088 , G02B21/28 , G02B21/30 , G02B21/086
Abstract: An inverted microscope is provided, the inverted microscope including a microscope stage which includes an opening prepared for transmitted light illumination and which is designed to receive a sample holder and an imaging optical unit arranged below the microscope stage. A closed lower incubation space which surrounds at least the imaging optical unit is arranged adjacent to a lower side of the microscope stage. The inverted microscope is configured such that a temperature in the lower incubation space is adjustable to a specifiable target temperature, for the purposes of which at least one temperature sensor is arranged in the lower incubation space, the measurement signal of the at least one temperature sensor serving to set the specifiable target temperature.
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公开(公告)号：US20210333197A1
公开(公告)日：2021-10-28
申请号：US17233400
申请日：2021-04-16
Applicant: Leica Microsystems CMS GmbH
Inventor： Stefan CHRIST
Abstract: A system for microscopic examination of a sample has a microscope and an incubation environment conditioning unit connected to the microscope. The microscope has a microscope housing enclosing an illumination optics, a microscope stage and an imaging optics, an integrated sample chamber located within the microscope housing and formed by a separated housing section within the microscope housing. The housing section has a microscope interface for connecting the incubation environment conditioning unit to the sample chamber and/or to a stage top chamber for placing within the sample chamber and for receiving the sample. The system provides a first and a second incubation modes. In the first incubation mode the sample chamber is incubated by supply of a first incubation atmosphere by the incubation environment conditioning unit. In the second incubation mode the stage top chamber is incubated by supply of a second incubation atmosphere by the incubation environment conditioning unit.
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公开(公告)号：US20230054212A1
公开(公告)日：2023-02-23
申请号：US17876584
申请日：2022-07-29
Applicant: LEICA MICROSYSTEMS CMS GMBH
Inventor： Stefan CHRIST
Abstract: A microscope system includes: an enclosed sample chamber for receiving a sample carrier in an examining position in which a sample arranged on the sample carrier is microscopically examinable; an enclosed incubation chamber that is separated from the sample chamber and that receives the sample carrier in at least one storing position; and a sample carrier transfer unit including an enclosed transfer chamber that is connected to the sample chamber by a first opening, and to the incubation chamber by a second opening, and a sample carrier handling device arranged within the transfer chamber for moving the sample carrier between the storing position and the examination position.
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公开(公告)号：US20220397753A1
公开(公告)日：2022-12-15
申请号：US17829392
申请日：2022-06-01
Applicant: Leica Microsystems CMS GmbH
Inventor： Stefan CHRIST
Abstract: A microscope includes: a sample chamber; a microscope stage arranged below the sample chamber for having a sample carrier arranged thereon; a pipetting device for pipetting the sample carrier; and a moving mechanism for moving the pipetting device between a non-operating position in which the pipetting device is arranged outside the sample chamber sample carrier and an operating position in which the pipetting device is arranged inside the sample chamber facing the sample carrier.
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5.发明申请公开(公告)号：US20220308329A1
公开(公告)日：2022-09-29
申请号：US17701715
申请日：2022-03-23
Applicant: LEICA MICROSYSTEMS CMS GMBH
Inventor： Stefan CHRIST
Abstract: A microscope for microscopic examination of a sample includes an illumination optics for illuminating the sample, an imaging optics for imaging the sample, a sample chamber for receiving the sample. The sample chamber has a door providing access into the sample chamber. The microscope further includes a first fan assembly arranged on a first side of the sample chamber for blowing atmosphere into the sample chamber or for draining atmosphere out of the sample chamber, through at least one first opening arranged on the first side in a first side wall of the sample chamber, and at least one second opening arranged on a second side in a second side wall of the sample chamber for allowing atmosphere from inside the sample chamber to exit the sample chamber or for allowing atmosphere from outside the sample chamber to enter the sample chamber.
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Patent Agency Ranking
公开(公告)号：US20240060892A1
公开(公告)日：2024-02-22
申请号：US18349224
申请日：2023-07-10
Applicant: LEICA MICROSYSTEMS CMS GMBH
Inventor： Stefan CHRIST
CPC classification number: G01N21/6428 , B01L3/50851 , G01N35/0099 , B01L2200/025 , B01L2300/0609 , B01L2300/0832 , G01N2021/6439 , G01N2035/00356
Abstract: An imaging device for imaging samples received in a sample carrier includes an imaging position configured to receive the sample carrier. The sample carrier includes at least one sample receiving compartment configured to receive a sample. The imaging device further includes an optical detection system configured to image the sample when the sample carrier is received in the imaging position, an annealing position configured to receive the sample carrier, and a temperature control unit configured to control a temperature of the sample receiving compartment when the sample carrier is received in the annealing position.
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7.发明申请公开(公告)号：US20210354145A1
公开(公告)日：2021-11-18
申请号：US17308764
申请日：2021-05-05
Applicant: Leica Microsystems CMS GmbH
Inventor： Sebastian SIMMER , Stefan CHRIST
Abstract: The present invention relates to a microscopic examination device comprising a microscope and a sample preparation arrangement for preparing one or more samples to be examined in said microscope, said preparing including pipetting one or more liquids into one or more sample receptacles for said one or more samples, said sample preparation arrangement comprising a base and a receiving structure adapted to receive said one or more sample receptacles, said sample preparation arrangement further comprising a pipetting guide movably fixed or fixable in relation to the receiving structure, said pipetting guide comprising one or more pipette guiding structures positionable in relation to said one or more sample receptacles by pivoting said pipetting guide in relation to said base. A method of preparing one or more samples for microscopic examination is also part of the present invention.
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公开(公告)号：US20230024600A1
公开(公告)日：2023-01-26
申请号：US17855830
申请日：2022-07-01
Applicant: Leica Microsystems CMS GmbH
Inventor： Stefan CHRIST
Abstract: A microscope for examining a sample received in a sample carrier having a lid includes: a sample chamber for receiving the sample carrier; a microscope stage arranged below the sample chamber, the microscope stage being arranged to have the sample carrier arranged thereon; and a sample carrier handling device that is at least partially arranged within the sample chamber and that removes the lid from the sample carrier to provide access to the sample.
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公开(公告)号：US20230014074A1
公开(公告)日：2023-01-19
申请号：US17857061
申请日：2022-07-04
Applicant: LEICA MICROSYSTEMS CMS GMBH
Inventor： Stefan CHRIST
IPC: G02B21/26
Abstract: A microscope includes: a sample chamber; a microscope stage arranged below the sample chamber, the microscope stage having a top surface for receiving a sample carrier in an examining position, in which a sample arranged on the sample carrier is microscopically examinable; a sample carrier storing unit arranged within the sample chamber for receiving the sample carrier in at least one storing position; and a sample carrier handling device for moving the sample carrier between the storing position and the examination position.
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公开(公告)号：US20220001380A1
公开(公告)日：2022-01-06
申请号：US17343837
申请日：2021-06-10
Applicant: Leica Microsystems CMS GmbH
Inventor： Stefan CHRIST
IPC: B01L3/00
Abstract: A microscope for microscopic examination of a sample includes: a microscope housing enclosing an illumination optics, a microscope stage, and an imaging optics; an integrated sample chamber located within the microscope housing; and an integrated reagent chamber located within the microscope housing, the integrated reagent chamber supplying a reagent to the sample.
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