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1.发明公开公开(公告)号：US20240280408A1
公开(公告)日：2024-08-22
申请号：US18571931
申请日：2022-06-13
Applicant: Konica Minolta, Inc.
Inventor： Takashi KAWASAKI , Hidehiko FUJII , Hitoshi NAGASAWA
CPC classification number: G01J5/0003 , G01J5/0846 , G01J5/53
Abstract: A surface temperature measuring apparatus includes a radiation thermometer (11) that measures a surface temperature (Tm) of a measurement range larger than a measurement target region of a measurement target (100), the radiation thermometer (11) detecting, by a sensor, an infrared ray radiated from an object surface of a specified measurement range to measure a surface temperature of an object, a second temperature measuring means (11) that measures a surface temperature (Tn) of a region outside the measurement target region of the measurement target (100) but within the measurement range of the surface temperature (Tm) by the radiation thermometer (11), or a region having an identical or substantially identical temperature to a temperature of the region outside the measurement target region, and a correcting means (12) that corrects the surface temperature (Tm) that is measured using the surface temperature (Tn) that is measured into a surface temperature (T) of the measurement target (100).
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公开(公告)号：US20240068870A1
公开(公告)日：2024-02-29
申请号：US18272256
申请日：2022-01-11
Applicant: Konica Minolta, Inc.
Inventor： Takashi KAWASAKI
CPC classification number: G01J3/2823 , G01J3/18
Abstract: A wavelength of incident light is measured based on signals from a plurality of pixels of a photoelectric conversion element that are arranged in a dispersion direction in which the incident light is dispersed by a spectroscopic section. In correction of a shift in wavelength, a measured amount of shift in wavelength that is a difference between a measured value obtained when an emission line wavelength of incident light from a light source for wavelength shift correction that emits light including an emission line at least one wavelength in a range of wavelengths into which light can be dispersed by the spectroscopic section is measured and an original emission line wavelength is calculated. A reference amount of shift in emission line wavelength is calculated by a polynomial in which a characteristic of a wavelength shift that occurs is represented by a linear or higher polynomial with a variable indicating the wavelength or a parameter relating to the wavelength. Each coefficient of the polynomial is determined based on the calculated measured amount of shift in emission line wavelength and the reference amount of shift in emission line wavelength, and the wavelength of the incident light is corrected based on the determined polynomial.
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公开(公告)号：US20210285818A1
公开(公告)日：2021-09-16
申请号：US17337710
申请日：2021-06-03
Applicant: Konica Minolta, Inc.
Inventor： Takashi KAWASAKI , Hidehiko FUJII , Katsutoshi TSURUTANI
Abstract: A spectrophotometer having a light-receiving optical system that images light to be measured from a position for measurement and generates imaged light to be measured; a slit formation including a slit that causes the imaged light to be measured to pass and that generates light to be measured, which travels along a measurement optical path; a grating that diffracts the light to be measured, which travels along the measurement optical path, and generates diffracted light; a sensor that receives the diffracted light and outputs a signal representing a spectral spectrum; and an observation light source that is disposed on an optical path of zeroth light among the diffracted light and that emits observation light toward the grating at a time of observing the position for measurement.
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公开(公告)号：US20210239532A1
公开(公告)日：2021-08-05
申请号：US17051842
申请日：2019-04-15
Applicant: Konica Minolta, Inc.
Inventor： Takashi KAWASAKI
Abstract: An optical characteristic measurement device has a measurement opening, includes a first optical measurement unit and a second optical measurement unit that measure different optical characteristics with different geometries with respect to a measurement target facing the measurement opening, and further includes a processing unit that corrects a measurement value obtained in the second optical measurement unit based on a measurement value obtained in the first optical measurement unit. The first optical measurement unit includes an illumination optical system that illuminates the measurement target facing the measurement opening, a first light receiving optical system that collects light reflected by the measurement target, and a first light receiving unit that receives light collected by the first light receiving optical system and outputs the light as a measurement signal, and has a diffuse reflection surface that diffuses and reflects incident light to the illumination optical system or the first light receiving optical system. The second optical measurement unit includes a light projecting optical system that projects light from a direction inclined by a predetermined angle with respect to a normal line of a measurement surface of the measurement target facing the measurement opening, a second light receiving optical system that collects light reflected by the measurement target in a regular reflection direction, and a second light receiving unit that receives light collected by the second light receiving optical system and outputs the light as a measurement signal.
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公开(公告)号：US20200182693A1
公开(公告)日：2020-06-11
申请号：US16616151
申请日：2018-04-24
Applicant: Konica Minolta, Inc.
Inventor： Takashi KAWASAKI , Hidehiko FUJII , Katsutoshi TSURUTANI
Abstract: Observation light can be applied to a position for measurement without providing large space in a spectrophotometer, and the position for measurement can be easily known. A slit is disposed at a position optically conjugate with the position for measurement in the spectrophotometer. Light from an object to be measured passes through the slit, travels along a measurement optical path, and is subject to wavelength dispersion by a wavelength dispersing element. An observation light source is retracted outside the measurement optical path at the time of measuring a spectral spectrum. At the time of observing the position for measurement, the observation light source is inserted into the measurement optical path, and emits observation light toward the slit. Alternatively, light from an object to be measured passes through the slit, and is diffracted by a grating. The observation light source is disposed on an optical path of zeroth light. The observation light source emits observation light toward the grating at the time of observing the position for measurement.
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Patent Agency Ranking
公开(公告)号：US20160041311A1
公开(公告)日：2016-02-11
申请号：US14779503
申请日：2014-03-14
Applicant: KONICA MINOLTA, INC.
Inventor： Shoji KOGO , Makoto JIN , Kenji KONNO , Takashi KAWASAKI
CPC classification number: G02B3/0043 , G02B3/0056 , G02B3/0062 , G02B13/005 , G02B27/0025 , G02B27/025 , G02B27/1066 , G02B27/123 , G06T5/50 , G06T2207/20212 , H01L27/14625 , H01L27/14627 , H04N5/23238 , H04N5/3572
Abstract: Provided is a compound optical system that can obtain high-resolution images by solving the problem of aberration in a field-of-view separation-type optical system, and that enables a super thin image pickup device to be achieved. Also provided is an image pickup device using the compound optical system. With respect to the image pickup range of a central individual-eye lens, by narrowing the image pickup range of a peripheral individual-eye lens, the field curvature amount at the image pickup region can be reduced, and therefore, the eccentricity amount of the lens surface (or the lens group) can be reduced. As a result, an individual-eye lens with little defocus and good image forming characteristics can be obtained, and a compound optical system with favorable image forming characteristics can be configured.
Abstract translation: 提供了一种通过解决视场分离型光学系统中的像差问题而能够获得高分辨率图像的复合光学系统，并且能够实现超薄图像拾取装置。 还提供了使用复合光学系统的图像拾取装置。 对于中央单眼透镜的图像拾取范围，通过缩小外围单眼透镜的摄像范围，可以减小摄像区域的场曲率量，因此，偏心量 透镜表面（或透镜组）可以减少。 结果，可以获得具有很小的散焦和良好的图像形成特性的单眼透镜，并且可以构造具有良好的图像形成特性的复合光学系统。
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公开(公告)号：US20220221697A1
公开(公告)日：2022-07-14
申请号：US17613344
申请日：2020-02-03
Applicant: Konica Minolta, Inc.
Inventor： Yusuke HIRAO , Takashi KAWASAKI
Abstract: An ultraviolet optical system includes an objective lens group that captures ultraviolet light for each angle from an ultraviolet light source and forms an intermediate image, and an imaging lens group that re-images the intermediate image. Neither the objective lens group nor the imaging lens group has a cemented surface, and all lenses included in the objective lens group and in the imaging lens group are single lenses that transmit ultraviolet light having a wavelength of 300 mn or shorter. A light distribution measuring apparatus includes the ultraviolet optical system and a sensor, and outputs light distribution of the ultraviolet light source by using a signal obtained by the sensor. The ultraviolet optical system is positioned such that the intermediate image is re-imaged on a light receiving sensor surface, and the sensor has light receiving sensitivity to ultraviolet light having a wavelength of 300 nm or shorter.
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8.发明申请公开(公告)号：US20200088575A1
公开(公告)日：2020-03-19
申请号：US15746216
申请日：2016-07-06
Applicant: KONICA MINOLTA, INC.
Inventor： Yoshiroh NAGAI , Toshio KAWANO , Takashi KAWASAKI
Abstract: Spectral apparatus includes sensors that output signals indicating the respective energy amounts of a plurality of wavelength components. For each of the sensors, its reference spectral sensitivity is acquired, and an indicator indicating the reference spectral sensitivity of the sensor, is acquired. The deviation of an indicator indicating the spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor, is expressed by a linear function of an indicator indicating a mechanical error in the spectral apparatus. The indicator indicating the mechanical error in the spectral apparatus, is acquired to adapt a spectral sensitivity set of sensors to a signal set output by the sensors. For each of the sensors, the deviation of the indicator indicating the spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor, is acquired, so that the spectral sensitivity of the sensor is acquired.
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公开(公告)号：US20190285540A1
公开(公告)日：2019-09-19
申请号：US16301966
申请日：2017-05-24
Applicant: KONICA MINOLTA, INC.
Inventor： Toshio KAWANO , Takashi KAWASAKI
Abstract: The reflection characteristic measuring device according to the present invention is a device that includes a diffuse reflecting surface and measures a plurality of mutually different types of reflection characteristics by using a plurality of optical systems having mutually different geometries, which corrects the reflection characteristics to be measured by an error generated when light emitted from an object of measurement is reflected from the diffuse reflecting surface and illuminates the object of measurement. The reflection characteristic measuring device according to the present invention is therefore capable of reducing errors resulting from recursive diffused illumination.
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公开(公告)号：US20160139362A1
公开(公告)日：2016-05-19
申请号：US14900022
申请日：2014-06-03
Applicant: KONICA MINOLTA, INC.
Inventor： Takashi KAWASAKI
CPC classification number: G02B13/004 , G02B9/34 , G02B13/06 , G02B13/16 , G02B27/0025
Abstract: Imaging lens including four lenses capable of widening an angle of view and reducing height compared to a conventional imaging lens while reducing cost and securing optical performance. The lens includes a first lens, a second lens, a third lens, and a fourth lens in order from an object side. The first lens and the second lens have negative refractive power. An object-side surface of the first lens has an aspherical shape. Moreover, the imaging lens satisfies the following conditional expressions: −2.8
Abstract translation: 成像透镜包括与传统成像透镜相比能够扩大视角并降低高度的四个透镜，同时降低成本并确保光学性能。 从物体侧开始，透镜包括第一透镜，第二透镜，第三透镜和第四透镜。 第一透镜和第二透镜具有负折光力。 第一透镜的物体侧表面具有非球面形状。 此外，成像透镜满足以下条件表达式：-2.8
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