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公开(公告)号：US20210140884A1
公开(公告)日：2021-05-13
申请号：US16492845
申请日：2018-03-01
Applicant: KONICA MINOLTA, INC.
Inventor： Kenji IMURA , Yoshiroh NAGAI
Abstract: An approximation B′f(Id,λ) of a fluorescence spectral emissivity coefficient by a standard illumination light Id is obtained at following steps from spectral power distributions R(Ik,λ) of sample radiation lights radiated from a fluorescence whitened sample when the fluorescence whitened sample is sequentially illuminated with a plurality of excitation lights Ik having different spectral power distributions, and a spectral power distribution Id(λ) of the standard illumination light Id. Spectral power distributions Rf(Ik,λ) of fluorescence are obtained from the spectral power distributions R(Ik,λ) by respective excitation lights Ik (first step). The spectral power distributions Rf(Ik,λ) of fluorescence by the respective excitation lights Ik are linearly combined with a given weighting coefficient Wk, and an approximation R′f(Id,λ) of a spectral power distribution of fluorescence by the standard illumination light Id is obtained by equation (second step: #11). From the approximation R′f(Id,λ) and the spectral power distribution Id(λ) of the standard illumination light Id, the approximation B′f(Id,λ) is obtained by equation (third step: #12).
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公开(公告)号：US20210123804A1
公开(公告)日：2021-04-29
申请号：US16640941
申请日：2018-05-29
Applicant: KONICA MINOLTA, INC.
Inventor： Yoshiroh NAGAI
IPC: G01J3/28
Abstract: A wavelength shift correction system and method includes a wavelength shift correction light source that emits wavelength shift correction light including a plurality of rays of wavelength shift correction emission-line light; and a spectrometer including a spectroscopic unit that receives the respective rays of dispersed spectral light obtained by dispersing incident light in accordance with wavelength with a plurality of photoelectric converters in the dispersion direction, and outputs electrical signals corresponding to the light intensities of the rays of dispersed spectral light. When the wavelength shift correction light is measured as the incident light with the spectrometer to be subjected to wavelength shift correction, a wavelength variation is determined on the basis of the respective electrical signals output from a plurality of specific photoelectric conversion elements that receive the plurality of rays of wavelength shift correction emission-line light in the plurality of photoelectric conversion elements.
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Patent Agency Ranking
3.发明申请公开(公告)号：US20180356286A1
公开(公告)日：2018-12-13
申请号：US15571376
申请日：2016-04-13
Applicant: KONICA MINOLTA, INC.
Inventor： Yoshiroh NAGAI
Abstract: In order to provide a technique by which a highly-accurate conversion rule of measurement values between different spectrocolorimetric devices can be easily set, the spectrocolorimetric device includes a light source, a light-receiving unit, and a conversion unit. The light-receiving unit spectroscopically disperses reflected light generated on a surface of an object according to irradiation of the object with illumination light emitted from the light source and measures a spectroscopic spectrum of the reflected light. The conversion unit calculates a spectral reflectance that can be acquired by another spectrocolorimetric device from the spectroscopic spectrum by using a calibrated spectral sensitivity of the other spectrocolorimetric device different from the spectrocolorimetric device and the spectroscopic spectrum.
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4.发明申请公开(公告)号：US20200088575A1
公开(公告)日：2020-03-19
申请号：US15746216
申请日：2016-07-06
Applicant: KONICA MINOLTA, INC.
Inventor： Yoshiroh NAGAI , Toshio KAWANO , Takashi KAWASAKI
Abstract: Spectral apparatus includes sensors that output signals indicating the respective energy amounts of a plurality of wavelength components. For each of the sensors, its reference spectral sensitivity is acquired, and an indicator indicating the reference spectral sensitivity of the sensor, is acquired. The deviation of an indicator indicating the spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor, is expressed by a linear function of an indicator indicating a mechanical error in the spectral apparatus. The indicator indicating the mechanical error in the spectral apparatus, is acquired to adapt a spectral sensitivity set of sensors to a signal set output by the sensors. For each of the sensors, the deviation of the indicator indicating the spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor, is acquired, so that the spectral sensitivity of the sensor is acquired.
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公开(公告)号：US20170052068A1
公开(公告)日：2017-02-23
申请号：US15307392
申请日：2015-04-14
Applicant: Konica Minolta, Inc.
Inventor： Yoshiroh NAGAI
Abstract: In this color measurement device and method, an entire image and a partial image of a color chart are acquired, respectively, during conveyance of the color chart by a conveyance unit and during re-conveyance of the color chart by the conveyance unit, and an amount of positional deviation of the color chart occurring between the conveyance and the re-conveyance is derived based on the acquired entire and partial images. Then, a color of each of a plurality of patches of the color chart is measured by a color measuring unit, while a measurement position of the color measuring unit is corrected according to the derived positional deviation amount.
Abstract translation: 在这种颜色测量装置和方法中，分别通过传送单元在输送颜色图表期间以及在通过传送单元重新传送颜色图表期间获取整个图像和颜色图的部分图像，并且 基于获取的全部和部分图像导出在输送和再输送之间发生的色图的位置偏差量。 然后，通过颜色测量单元测量彩色图表的多个色块中的每一个的颜色，同时根据导出的位置偏差量来校正色彩测量单元的测量位置。
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公开(公告)号：US20210033458A1
公开(公告)日：2021-02-04
申请号：US16641010
申请日：2018-05-29
Applicant: KONICA MINOLTA, INC.
Inventor： Yoshiroh NAGAI
Abstract: A system and method include a wavelength shift correction light source emitting wavelength shift correction emission-line light and a spectrometer including: a spectroscopic unit receiving with photoelectric conversion elements rays of dispersed spectral light obtained by dispersing incident light based on wavelength, and outputs electrical signals corresponding to light intensities of the rays of dispersed spectral light; and a unit that measures temperature of the spectroscopic unit. When the wavelength shift correction emission-line light is measured as the incident light with the spectrometer, this system and method determine wavelength shift correction time emission-line wavelength corresponding to wavelength shift correction emission-line light, based on electrical signals from photoelectric conversion elements receiving wavelength shift correction emission-line light, and the measured temperature. The system and method determine wavelength variation from the difference between determined wavelength shift correction time emission-line wavelength and known emission-line wavelength of the wavelength shift correction emission-line light.
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公开(公告)号：US20180136044A1
公开(公告)日：2018-05-17
申请号：US15571441
申请日：2016-04-14
Applicant: Konica Minolta, Inc.
Inventor： Yoshiroh NAGAI
IPC: G01J3/50
CPC classification number: G01J3/502 , G01J3/02 , G01J3/0264 , G01J3/462 , G01J3/50 , G01J3/524 , G01J2003/467
Abstract: Spectrocolorimetric device includes a light source, a light-receiving unit, a calculation unit, a storage unit, an acquisition unit, and a conversion unit. The light-receiving unit spectroscopically disperses reflected light generated on a surface and measures a spectroscopic spectrum relating to the reflected light. The calculation unit calculates a first spectral reflectance from the spectroscopic spectrum. The storage unit stores relationship information indicating a relationship between a reflectance and a reflectance difference for each wavelength. The acquisition unit acquires reflectance difference for each wavelength between the first spectral reflectance acquired using the spectrocolorimetric device and a second spectral reflectance acquired using a destination-of-conversion spectrocolorimetric device on the basis of the first spectral reflectance and the relationship information. The conversion unit converts the first spectral reflectance into the second spectral reflectance by adding or subtracting the reflectance difference for each wavelength acquired by the acquisition unit to or from the first spectral reflectance.
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