公开(公告)号：US20240280408A1

公开(公告)日：2024-08-22

申请号：US18571931

申请日：2022-06-13

Applicant: Konica Minolta, Inc.

Inventor： Takashi KAWASAKI ,  Hidehiko FUJII ,  Hitoshi NAGASAWA

IPC: G01J5/00 ,  G01J5/08 ,  G01J5/53

CPC classification number: G01J5/0003 ,  G01J5/0846 ,  G01J5/53

Abstract: A surface temperature measuring apparatus includes a radiation thermometer (11) that measures a surface temperature (Tm) of a measurement range larger than a measurement target region of a measurement target (100), the radiation thermometer (11) detecting, by a sensor, an infrared ray radiated from an object surface of a specified measurement range to measure a surface temperature of an object, a second temperature measuring means (11) that measures a surface temperature (Tn) of a region outside the measurement target region of the measurement target (100) but within the measurement range of the surface temperature (Tm) by the radiation thermometer (11), or a region having an identical or substantially identical temperature to a temperature of the region outside the measurement target region, and a correcting means (12) that corrects the surface temperature (Tm) that is measured using the surface temperature (Tn) that is measured into a surface temperature (T) of the measurement target (100).

公开(公告)号：US20210285818A1

公开(公告)日：2021-09-16

申请号：US17337710

申请日：2021-06-03

Applicant: Konica Minolta, Inc.

Inventor： Takashi KAWASAKI ,  Hidehiko FUJII ,  Katsutoshi TSURUTANI

IPC: G01J3/10 ,  G01J3/18

Abstract: A spectrophotometer having a light-receiving optical system that images light to be measured from a position for measurement and generates imaged light to be measured; a slit formation including a slit that causes the imaged light to be measured to pass and that generates light to be measured, which travels along a measurement optical path; a grating that diffracts the light to be measured, which travels along the measurement optical path, and generates diffracted light; a sensor that receives the diffracted light and outputs a signal representing a spectral spectrum; and an observation light source that is disposed on an optical path of zeroth light among the diffracted light and that emits observation light toward the grating at a time of observing the position for measurement.

公开(公告)号：US20200182693A1

公开(公告)日：2020-06-11

申请号：US16616151

申请日：2018-04-24

Applicant: Konica Minolta, Inc.

Inventor： Takashi KAWASAKI ,  Hidehiko FUJII ,  Katsutoshi TSURUTANI

IPC: G01J3/10 ,  G01J3/18

Abstract: Observation light can be applied to a position for measurement without providing large space in a spectrophotometer, and the position for measurement can be easily known. A slit is disposed at a position optically conjugate with the position for measurement in the spectrophotometer. Light from an object to be measured passes through the slit, travels along a measurement optical path, and is subject to wavelength dispersion by a wavelength dispersing element. An observation light source is retracted outside the measurement optical path at the time of measuring a spectral spectrum. At the time of observing the position for measurement, the observation light source is inserted into the measurement optical path, and emits observation light toward the slit. Alternatively, light from an object to be measured passes through the slit, and is diffracted by a grating. The observation light source is disposed on an optical path of zeroth light. The observation light source emits observation light toward the grating at the time of observing the position for measurement.