Apparatus and method for detecting integrity violation

    公开(公告)号:US10514892B2

    公开(公告)日:2019-12-24

    申请号:US13951635

    申请日:2013-07-26

    IPC分类号: G06F7/58 G06F21/71 G06F21/86

    摘要: An apparatus for detecting integrity violation includes a feedback shift register including a plurality of registers connected in series, and a feedback function unit connected between an output of a number of the registers and an input of at least one of the registers. The apparatus further includes an integrity violation detector adapted to determine as to whether a sequence of values at an input or output of at least one of the registers, or a logic combination thereof, is a non-constant sequence or a constant sequence. The apparatus is further adapted to output an indication that the feedback shift register is in an integral state if the sequence of values is a non-constant sequence, or to output an indication that the feedback shift register is subjected to an integrity violation if the sequence of values is a constant sequence.

    Apparatus Comprising a Pair of an Alarm Condition Generator and an Associated Alarm Circuit, Chip Card, and Method
    4.
    发明申请
    Apparatus Comprising a Pair of an Alarm Condition Generator and an Associated Alarm Circuit, Chip Card, and Method 有权
    包括一对报警条件发生器和相关报警电路,芯片卡和方法的装置

    公开(公告)号:US20140306823A1

    公开(公告)日:2014-10-16

    申请号:US13862882

    申请日:2013-04-15

    IPC分类号: G08B23/00

    摘要: An apparatus includes a pair of an alarm condition generator and an associated alarm circuit and a test circuit. The alarm circuit is configured to generate an alarm signal in response to a detection of an associated alarm condition. The alarm condition generator is configured to generate the associated alarm condition for its associated alarm circuit in response to a reception of a first reset of a first type of reset. The test circuit is configured to receive the alarm signal and the first reset and to generate in response to a reception of both the first reset and the alarm signal a second reset of a second type of reset.

    摘要翻译: 一种装置包括一对报警条件发生器和相关联的报警电路和测试电路。 报警电路被配置为响应于相关警报状况的检测而产生报警信号。 报警条件发生器被配置为响应于接收到第一类型的复位的第一复位而为其相关联的报警电路产生相关联的报警条件。 测试电路被配置为接收报警信号和第一复位,并响应于第一复位和报警信号两者的接收产生第二类型复位的第二复位。

    Storage Device and Method for Modifying Memory Cells of a Storage Device

    公开(公告)号:US20220261176A1

    公开(公告)日:2022-08-18

    申请号:US17666762

    申请日:2022-02-08

    发明人: Steffen Sonnekalb

    IPC分类号: G06F3/06

    摘要: A storage device comprises a plurality of bitwise-modifiable memory cells. A control device is also provided, which, in order to modify existing data content written to a group of memory cells with new data content to be written, is designed to compare the existing data content and the data content to be written in order to obtain a comparison result. The control device is designed to determine a subset of the group of memory cells for modification and a remaining length based on the comparison result, and to write the data content to be written to the subset, leaving the remaining set at least partially unchanged. For modifying the existing data content, the storage device is designed to read from a memory location of the storage device and to verify the correctness of the memory location.

    VERIFYING MEMORY ACCESS
    6.
    发明申请

    公开(公告)号:US20190114111A1

    公开(公告)日:2019-04-18

    申请号:US16156046

    申请日:2018-10-10

    IPC分类号: G06F3/06 G11C8/08 G06F11/10

    摘要: A memory arrangement having a memory cell field with columns and rows of writable memory cells, a memory controller which is configured to initiate an access to a first group of memory cells of a row of memory cells and, together with the access to the first group of memory cells, to initiate a read access to a second group of memory cells of the row of memory cells, and a verification circuit which is configured to check whether the access to the first group of memory cells has been performed on the correct row of memory cells on the basis of whether values read during the read access to the second group of memory cells match values previously stored by the second group of memory cells.

    Storage device and method for modifying memory cells of a storage device

    公开(公告)号:US12079507B2

    公开(公告)日:2024-09-03

    申请号:US17666762

    申请日:2022-02-08

    发明人: Steffen Sonnekalb

    IPC分类号: G06F3/06

    摘要: A storage device comprises a plurality of bitwise-modifiable memory cells. A control device is also provided, which, in order to modify existing data content written to a group of memory cells with new data content to be written, is designed to compare the existing data content and the data content to be written in order to obtain a comparison result. The control device is designed to determine a subset of the group of memory cells for modification and a remaining length based on the comparison result, and to write the data content to be written to the subset, leaving the remaining set at least partially unchanged. For modifying the existing data content, the storage device is designed to read from a memory location of the storage device and to verify the correctness of the memory location.

    Memory integrity check
    9.
    发明授权

    公开(公告)号:US12038808B2

    公开(公告)日:2024-07-16

    申请号:US18305497

    申请日:2023-04-24

    发明人: Steffen Sonnekalb

    IPC分类号: G06F11/10

    CPC分类号: G06F11/1068 G06F11/1004

    摘要: A data processing device including a memory having a plurality of memory locations for respectively storing a value, wherein the data processing device has, for each memory location, an associated error detection memory area, a memory controller which is configured, when a value is written to a memory location, to store an associated error detection code in the error detection memory area associated with the memory location, a memory access element, and an integrity checker configured to perform an EDC check.

    SEMICONDUCTOR CHIP APPARATUS AND METHOD FOR CHECKING THE INTEGRITY OF A MEMORY

    公开(公告)号:US20230367912A1

    公开(公告)日:2023-11-16

    申请号:US18311981

    申请日:2023-05-04

    IPC分类号: G06F21/64 G06F21/79

    CPC分类号: G06F21/64 G06F21/79

    摘要: A semiconductor chip apparatus including a memory having a plurality of memory locations, a memory access element, and an integrity check device configured to store a reference value for a check function over values stored in the memory locations and, in a case of write access to a memory location, configured to update a check value with the value to be written by the write access if the check value represents the value stored in the memory location prior to the write access, and configured to compare the reference value with the check value after the check value has been generated and output a signal depending on a result of the comparison.