公开(公告)号：US20160202179A1

公开(公告)日：2016-07-14

申请号：US14982022

申请日：2015-12-29

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Atsushi NAKANISHI ,  Kazuki HORITA ,  Takashi YASUDA

IPC: G01N21/3586

CPC classification number: G01N21/3586 ,  G01N21/3563 ,  G01N21/3581 ,  G01N21/4795 ,  G01N2201/06113

Abstract: A terahertz wave temporal waveform acquisition apparatus includes a light source, a branch part, a terahertz wave generation element, a terahertz wave detection element, a delay providing medium, a temperature adjustment unit, and an analysis unit. The delay providing medium is disposed on an optical path of a terahertz wave from the terahertz wave generation element to the terahertz wave detection element, is formed of a material of which a refractive index for the terahertz wave depends on the temperature, and provides a delay according to the temperature to the terahertz wave.

Abstract translation: 太赫兹波时间波形获取装置包括光源，分支部分，太赫兹波发生元件，太赫兹波检测元件，延迟提供介质，温度调节单元和分析单元。 延迟提供介质设置在从太赫兹波发生元件到太赫兹波检测元件的太赫兹波的光路上，由其中太赫兹波的折射率取决于温度的材料形成，并提供延迟 根据太赫兹波的温度。

公开(公告)号：US20190025124A1

公开(公告)日：2019-01-24

申请号：US16039163

申请日：2018-07-18

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Takashi YASUDA ,  Yoichi KAWADA ,  Kazuki HORITA ,  Hironori TAKAHASHI ,  Takayoshi KUGA ,  Atsushi NAKANISHI ,  Kazutaka TOMARI

IPC: G01J3/42 ,  G01J3/02 ,  G01N21/3586

Abstract: A measurement auxiliary member is placed on an arrangement surface of a prism. A measurement object is placed on an upper surface of the measurement auxiliary member. The measurement auxiliary member totally reflects the terahertz wave input from a lower surface by the upper surface and outputs the totally-reflected terahertz wave from the lower surface. A main pulse of a terahertz wave totally reflected by the upper surface of the measurement auxiliary member without multiply-reflected inside any optical element on an optical path of the terahertz wave, and a noise pulse of a terahertz wave multiply-reflected inside any optical element on the optical path and reflected on an interface between the prism and the measurement auxiliary member, are temporally separated from each other when detecting a correlation by a terahertz wave detection element.

公开(公告)号：US20160154176A1

公开(公告)日：2016-06-02

申请号：US14906924

申请日：2014-05-20

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Yoichi KAWADA ,  Takashi YASUDA ,  Atsushi NAKANISHI

IPC: G02B6/10 ,  G02B5/30

Abstract: A wave plate comprising: a prism member having an entrance surface for receiving a terahertz wave T, and an exit surface for emitting the terahertz wave T received by the entrance surface; wherein the prism member is constituted by a plurality of waveguide regions having: a partial entrance surface for receiving a part of the terahertz wave T, a plurality of total reflection surfaces for totally reflecting the terahertz wave T from the partial entrance surface, and a partial exit surface for emitting the terahertz wave T totally reflected from the total reflection surfaces; and each of the partial entrance surfaces combine to constitute the entrance surface of the prism member, and each of the partial exit surfaces combine to constitute the exit surface of the prism member, by stacking waveguide regions.

Abstract translation: 一种波片，包括：具有用于接收太赫兹波T的入射表面的棱镜构件和用于发射由入射表面接收的太赫兹波T的出射表面; 其中所述棱镜部件由多个波导区域构成，所述多个波导区域具有用于接收太赫兹波T的一部分的部分入射面，用于从所述部分入射面全面反射太赫兹波T的多个全反射面， 出射面，用于发射从全反射面全反射的太赫兹波; 并且每个部分入射面组合成构成棱镜构件的入射面，并且通过堆叠波导区域，各部分出射面组合成构成棱镜构件的出射面。

公开(公告)号：US20200150339A1

公开(公告)日：2020-05-14

申请号：US16739214

申请日：2020-01-10

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Yoichi KAWADA ,  Takashi YASUDA ,  Atsushi NAKANISHI

IPC: G02B6/10 ,  H01Q15/04 ,  G02B5/30

Abstract: A wave plate comprising: a prism member having an entrance surface for receiving a terahertz wave T, and an exit surface for emitting the terahertz wave T received by the entrance surface; wherein the prism member is constituted by a plurality of waveguide regions having: a partial entrance surface for receiving a part of the terahertz wave T, a plurality of total reflection surfaces for totally reflecting the terahertz wave T from the partial entrance surface, and a partial exit surface for emitting the terahertz wave T totally reflected from the total reflection surfaces; and each of the partial entrance surfaces combine to constitute the entrance surface of the prism member, and each of the partial exit surfaces combine to constitute the exit surface of the prism member, by stacking waveguide regions.

公开(公告)号：US20170248833A1

公开(公告)日：2017-08-31

申请号：US15505963

申请日：2015-08-28

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Kouichiro AKIYAMA ,  Yoichi KAWADA ,  Takashi YASUDA ,  Atsushi NAKANISHI ,  Hironori TAKAHASHI

IPC: G02F1/361 ,  G02F1/355 ,  G01N21/3581

CPC classification number: G02F1/3612 ,  C07C309/30 ,  C07D213/38 ,  G01N21/3581 ,  G02F1/3551 ,  G02F1/3613

Abstract: Disclosed is a non-linear optical crystal containing pyridinium represented by the following Formula (1), 4-substituted phenylsulfonate represented by the following Formula (2a), and 2,4,6-substituted phenylsulfonate represented by the following Formula (2b).

公开(公告)号：US20230130965A1

公开(公告)日：2023-04-27

申请号：US17968964

申请日：2022-10-19

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Yoichi KAWADA ,  Takashi YASUDA ,  Hiroshi SATOZONO

IPC: G02B1/08 ,  G02B5/30

Abstract: The optical element for a low frequency band includes a substrate including a first main face and a second main face, the substrate having birefringence, and an antireflection film located on the first main face, wherein the low frequency band is lower than a reststrahlen band of the antireflection film, wherein an absolute value of a difference between a first refractive index and a second refractive index of the substrate in the low frequency band is 0.2 or more, and wherein a thickness of the substrate is 15 μm or more and 4000 μm or less.

公开(公告)号：US20160146666A1

公开(公告)日：2016-05-26

申请号：US14950617

申请日：2015-11-24

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Yoichi KAWADA ,  Takashi YASUDA ,  Hironori TAKAHASHI

IPC: G01J1/44 ,  G01J1/42 ,  G01J1/04 ,  G01J4/04

CPC classification number: G01J1/44 ,  G01J1/0429 ,  G01J1/4228 ,  G01J3/0224 ,  G01J3/0262 ,  G01J3/42 ,  G01J3/433 ,  G01J3/4338 ,  G01J4/04 ,  G01J2001/4242 ,  G01N21/3581 ,  G01R15/241 ,  G01R29/0871

Abstract: In this electric field vector detection method, an electro-optic crystal, where a (111) surface of an optical isotropic medium is cut out, is used as a terahertz wave detection element. The method includes: causing polarization of probe light of ultrashort pulsed light to be circular polarization; allowing the probe light having circular polarization to enter the terahertz wave detection element and probing the terahertz wave; modulating the probe light, having probed the terahertz wave, by a rotating analyzer and detecting the modulated probe light by a photodetector; performing lock-in detection of a detection signal from the photodetector by a lock-in detector using a frequency based on a rotational frequency of the rotating analyzer as a reference signal; and detecting an electric field vector of the terahertz wave based on a detection signal from the lock-in detector.

Abstract translation: 在该电场矢量检测方法中，将光学各向同性介质的（111）面切出的电光晶体用作太赫兹波检测元件。 该方法包括：使超短脉冲光的探测光的极化成圆极化; 允许具有圆极化的探测光进入太赫兹波检测元件并探测太赫兹波; 通过旋转分析仪调制探测太赫兹波的探测器，并通过光电检测器检测调制的探测光; 通过锁定检测器使用基于旋转分析仪的旋转频率的频率作为参考信号来执行来自光电检测器的检测信号的锁定检测; 以及基于来自锁定检测器的检测信号检测太赫兹波的电场矢量。

公开(公告)号：US20220404274A1

公开(公告)日：2022-12-22

申请号：US17839542

申请日：2022-06-14

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Takayoshi KUGA ,  Yoichi KAWADA ,  Takashi YASUDA ,  Kazutaka TOMARI ,  Masatoshi FUJIMOTO

IPC: G01N21/3581

Abstract: A spectroscopic measurement device includes: a light source unit configured to output pump light and probe light; a terahertz wave generation unit configured to generate a terahertz wave by the input of the pump light; a terahertz wave detection unit to which the terahertz wave and the probe light are input and configured to modulate the probe light based on a refractive index that changes due to an electro-optical effect according to the input of the terahertz wave; and a light detection unit configured to detect the probe light modulated by the terahertz wave detection unit. A main body unit is configured to include the light source unit and the light detection unit. A measurement unit is configured to include the terahertz wave generation unit and the terahertz wave detection unit. The main body unit and the measurement unit are optically connected to each other by a polarization maintaining fiber.