公开(公告)号：US20190204356A1

公开(公告)日：2019-07-04

申请号：US15859596

申请日：2017-12-31

申请人： Tektronix, Inc.

发明人： Michael J. Mende ,  Daniel G. Knierim ,  Richard A. Booman

IPC分类号： G01R1/07 ,  G01R1/28

CPC分类号： G01R15/241 ,  G01R29/0885 ,  G01R31/308 ,  G01R31/31728

摘要： A mechanism is included for receiving a phase modulated optical signal. The phase modulated signal is modulated by a remote electrical test signal at a sensor head. A reference optical signal is also received. A phase difference between the phase modulated optical signal and the reference optical signal is then determined. The phase difference is employed to recover the remote electrical test signal from the sensor head. The phase difference may be determined by employing a phase modulator in a controller that tracks a phase modulator in the sensor head. The phase difference may also be determined by comparison of the signals in the complex signal domain.

公开(公告)号：US20170353248A1

公开(公告)日：2017-12-07

申请号：US15394670

申请日：2016-12-29

申请人： TEKTRONIX, INC.

发明人： Richard A. Booman ,  Michael J. Mende ,  Daniel G. Knierim

IPC分类号： H04B10/80 ,  H04B10/532

CPC分类号： H04B10/801 ,  G01R15/241 ,  G01R29/0885 ,  G01R31/308 ,  H04B10/532

摘要： An electro-optical sensor comprises an optical input configured to receive an optical carrier via an upstream fiber. The electro-optical sensor also includes an optical modulator configured to modulate an electrical signal onto the optical carrier to create an optical signal. The electro-optical sensor further includes an optical output configured to transmit the optical signal via a downstream fiber. The electro-optical sensor employs a variation output configured to transmit variation data indicating variation in the received optical carrier to support compensation for corresponding variation in the optical signal.

公开(公告)号：US20160377660A1

公开(公告)日：2016-12-29

申请号：US15187522

申请日：2016-06-20

申请人： ABB Technology AG

发明人： Georg Müller ,  Klaus Bohnert ,  Andreas Frank ,  Philippe Gabus

IPC分类号： G01R15/24 ,  G01R19/32

CPC分类号： G01R15/241 ,  G01R15/246 ,  G01R15/247 ,  G01R19/32

摘要： A fiber optic sensor and related method are described, with the sensor including a cross-coupling element in the optical path between a polarizing element and a sensing element, but separated from the sensing element itself; with the cross-coupling element generating a defined cross-coupling between the two orthogonal polarization states of the fundamental mode of a polarization maintaining fiber guiding light from the light source to the sensing element thus introducing a wavelength-dependent or temperature-dependent sensor signal shift to balance wavelength-dependent or temperature-dependent signal shifts due to other elements of the sensor, particularly signal shifts due to the wavelength dependence of the Faraday effect or the electro-optic effect constant.

摘要翻译： 描述了光纤传感器和相关方法，其中传感器包括在偏振元件和感测元件之间的光路中的交叉耦合元件，但是与感测元件本身分离; 交叉耦合元件在从光源到感测元件的保持光纤的基波模式的两个正交极化状态之间产生定义的交叉耦合，从而引入依赖于波长或依赖于温度的传感器信号 以平衡由于传感器的其他元件导致的波长依赖或温度依赖的信号偏移，特别是由于法拉第效应或电光效应常数的波长依赖性引起的信号偏移。

公开(公告)号：US09513315B2

公开(公告)日：2016-12-06

申请号：US14422417

申请日：2013-08-20

申请人： ABB Technology AG

发明人： William R. Verbanets

IPC分类号： G01R15/24

CPC分类号： G01R15/241 ,  G01R15/247

摘要： A system that measures a high electric voltage on an electrical transmission line has an electro optical voltage transducer sensor connected between the electrical transmission line and ground for providing in response to the measured high electric voltage a Sin optical intensity signal and a Cos optical intensity signal. The system also has a signal processor that operates in a first state to digitally process samples of the Sin and said Cos optical intensity signals. The process samples are used to provide a representation of the high electric voltage on the transmission line. The representation can be used for one or more of metering, relaying and transient capture.

摘要翻译： 测量电传输线路上的高电压的系统具有连接在电传输线和地之间的电光电压传感器传感器，用于响应于所测量的高电压提供Sin光强度信号和Cos光强度信号。 该系统还具有操作在第一状态的数字处理Sin和所述Cos光强信号的样本的信号处理器。 过程样本用于提供传输线上高电压的表示。 该表示可以用于计量，中继和瞬态捕获中的一个或多个。

公开(公告)号：US20150212118A1

公开(公告)日：2015-07-30

申请号：US14422417

申请日：2013-08-20

申请人： ABB Technology AG

发明人： William R. Verbanets

IPC分类号： G01R15/24

CPC分类号： G01R15/241 ,  G01R15/247

摘要： A system that measures a high electric voltage on an electrical transmission line has an electro optical voltage transducer sensor connected between the electrical transmission line and ground for providing in response to the measured high electric voltage a Sin optical intensity signal and a Cos optical intensity signal. The system also has a signal processor that operates in a first state to digitally process samples of the Sin and said Cos optical intensity signals. The process samples are used to provide a representation of the high electric voltage on the transmission line. The representation can be used for one or more of metering, relaying and transient capture.

摘要翻译： 测量电传输线路上的高电压的系统具有连接在电传输线和地之间的电光电压传感器传感器，用于响应于所测量的高电压提供Sin光强度信号和Cos光强度信号。 该系统还具有操作在第一状态的数字处理Sin和所述Cos光强信号的样本的信号处理器。 过程样本用于提供传输线上高电压的表示。 该表示可以用于计量，中继和瞬态捕获中的一个或多个。

公开(公告)号：US20130181722A1

公开(公告)日：2013-07-18

申请号：US13786176

申请日：2013-03-05

申请人： Paul L. Pfaff

发明人： Paul L. Pfaff

IPC分类号： G01R31/265

CPC分类号： G01R31/311 ,  G01R15/241 ,  G01R31/2653 ,  G01R31/2656 ,  G03H2260/53

摘要： Analysis and characterization of semiconductor and free-metal devices using a plurality of “live” and stored interference patterns or data detected to determine or generate two-dimensional or three-dimensional information of at least one internal stress or signal, or determining the effects thereof of internal or external stresses acting upon or within the electrical signals applied to a device under test or evaluation having exterior surfaces, interior structures, electronic features as well as determining the effects thereof of chemicals, bioelectric materials, or substances, placed adjacent to the surface of the devices under test.

摘要翻译： 使用多个“实时”和存储的干涉图案或检测到的数据来确定或生成至少一个内部应力或信号的二维或三维信息或确定其影响的半导体和自由金属器件的分析和表征 内部或外部应力作用在施加到被测设备或评估设备的电信号之上或之内，其具有外表面，内部结构，电子特征以及确定与表面相邻放置的化学物质，生物电材料或物质的影响 的被测设备。

公开(公告)号：US07923984B2

公开(公告)日：2011-04-12

申请号：US12015674

申请日：2008-01-17

申请人： Martin A. Philbert ,  Katherine M. Tyner ,  Raoul Kopelman

发明人： Martin A. Philbert ,  Katherine M. Tyner ,  Raoul Kopelman

IPC分类号： G01R19/02

CPC分类号： A61B5/04 ,  C09B67/0004 ,  G01R15/241 ,  Y10S977/788

摘要： A universal, wireless, nano-optical voltmeter comprises an organic core having at least one voltage-sensitive dye and at least one polymeric shell substantially surrounding the organic core. The nano-optical voltmeter can detect electric fields in cells. The nano-optical voltmeter allows three-dimensional E field profiling throughout the entire volume of living cells. The nano-optical voltmeter may be calibrated externally and then applied for E field determinations inside any live cell or cellular compartment, with no further calibration steps.

摘要翻译： 通用无线纳米光伏电压表包括具有至少一个电压敏感染料和至少一个基本上围绕有机芯的聚合物壳的有机芯。 纳米光伏电压表可以检测电池中的电场。 纳米光伏电压表允许在整个体积的活细胞中进行三维E场分析。 纳米光伏电压表可以在外部校准，然后用于任何活细胞或细胞室内的E场测定，无需进一步的校准步骤。

公开(公告)号：US07773230B2

公开(公告)日：2010-08-10

申请号：US12172629

申请日：2008-07-14

申请人： Paul Pfaff

发明人： Paul Pfaff

IPC分类号： G01B9/02 ,  G01B9/021

CPC分类号： G01R31/311 ,  G01R15/241 ,  G01R31/2653 ,  G01R31/2656 ,  G03H2260/53

摘要： An improved condition testing system and method includes a structure including a semiconductor material with a target portion and a second portion. The target portion has a first feature when at least one of the following occurs: an external force is received by the second portion of the structure and an internal condition occurs in the target portion. The system and method further has a interferogram shaped and located to produce a first optical interference pattern when the target portion and the interferogram are exposed to non-invasive illumination and when the target portion has the first feature. Further implementations use a second test interferogram spaced apart from the first test interferogram.

摘要翻译： 改进的状态测试系统和方法包括包括具有目标部分的半导体材料和第二部分的结构。 当发生以下中的至少一个时，目标部分具有第一特征：外力由结构的第二部分接收并且在目标部分中发生内部状况。 该系统和方法还具有一个干涉图形，并且定位成当目标部分和干涉图被暴露于无创照明时以及当目标部分具有第一特征时产生第一光学干涉图案。 另外的实施方案使用与第一测试干涉图间隔开的第二测试干涉图。

公开(公告)号：US07539361B2

公开(公告)日：2009-05-26

申请号：US11538954

申请日：2006-10-05

申请人： Timothy E. Dimmick ,  Kevin H. Smith ,  Douglas J. Markos

发明人： Timothy E. Dimmick ,  Kevin H. Smith ,  Douglas J. Markos

IPC分类号： G02B6/00

CPC分类号： G01K11/3206 ,  G01L1/246 ,  G01R15/241 ,  G01R33/032 ,  G02B6/021

摘要： An optical fiber (100) utilized as a sensor for measuring a parameter of interest 122 such as temperature, strain, photonic energy intensity, electric field intensity and magnetic field intensity is provided. A first optical cladding layer (104) is disposed on an optically transmissive core (102) that includes one or more optical gratings (114-1). The optical grating(s) (114-1) modifies a propagation path of selected wavelengths of light propagating through the core (102). The optical grating(s) (114-1) also varies the index of refraction of the first optical cladding layer (104). The selected wavelengths of light are determined in part by the index of refraction of the core material 105 as dependent upon a parameter of interest 122 applied to the core material 105 and as varied by the optical grating(s) (114-1). One or more detectors (410, 430, 450, 455) are used for determining the properties of the reflected and/or transmitted light. Knowing the properties of the reflected and/or transmitted light, a parameter of interest 122 can be determined.

摘要翻译： 提供了用作传感器的光纤（100），用于测量诸如温度，应变，光子能量强度，电场强度和磁场强度的感兴趣的参数122。 第一光学包层（104）设置在包括一个或多个光栅（114-1）的透光芯（102）上。 光栅（114-1）修改通过芯（102）传播的光的所选波长的传播路径。 光栅（114-1）也改变第一光学包层（104）的折射率。 所选择的光的波长部分地取决于应用于芯材料105的并由光栅（114-1）改变的感兴趣的参数122的芯材料105的折射率。 一个或多个检测器（410,430,450,455）用于确定反射和/或透射光的特性。 知道反射和/或透射光的性质，可以确定感兴趣的参数122。

公开(公告)号：US20090002717A1

公开(公告)日：2009-01-01

申请号：US12172629

申请日：2008-07-14

申请人： Paul Pfaff

发明人： Paul Pfaff

IPC分类号： G01B9/02

CPC分类号： G01R31/311 ,  G01R15/241 ,  G01R31/2653 ,  G01R31/2656 ,  G03H2260/53

摘要： An improved condition testing system and method includes a structure including a semiconductor material with a target portion and a second portion. The target portion has a first feature when at least one of the following occurs: an external force is received by the second portion of the structure and an internal condition occurs in the target portion. The system and method further has a grating shaped and located to produce a first optical interference pattern when the target portion and the grating are exposed to non-invasive illumination and when the target portion has the first feature. Further implementations use a second grating spaced apart from the first grating.

摘要翻译： 改进的状态测试系统和方法包括包括具有目标部分的半导体材料和第二部分的结构。 当发生以下中的至少一个时，目标部分具有第一特征：外力由结构的第二部分接收并且在目标部分中发生内部状况。 该系统和方法还具有光栅形状并定位成当目标部分和光栅暴露于无创照明时以及当目标部分具有第一特征时产生第一光学干涉图案。 另外的实施方式使用与第一光栅间隔开的第二光栅。