公开(公告)号：US20190025124A1

公开(公告)日：2019-01-24

申请号：US16039163

申请日：2018-07-18

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Takashi YASUDA ,  Yoichi KAWADA ,  Kazuki HORITA ,  Hironori TAKAHASHI ,  Takayoshi KUGA ,  Atsushi NAKANISHI ,  Kazutaka TOMARI

IPC: G01J3/42 ,  G01J3/02 ,  G01N21/3586

Abstract: A measurement auxiliary member is placed on an arrangement surface of a prism. A measurement object is placed on an upper surface of the measurement auxiliary member. The measurement auxiliary member totally reflects the terahertz wave input from a lower surface by the upper surface and outputs the totally-reflected terahertz wave from the lower surface. A main pulse of a terahertz wave totally reflected by the upper surface of the measurement auxiliary member without multiply-reflected inside any optical element on an optical path of the terahertz wave, and a noise pulse of a terahertz wave multiply-reflected inside any optical element on the optical path and reflected on an interface between the prism and the measurement auxiliary member, are temporally separated from each other when detecting a correlation by a terahertz wave detection element.

公开(公告)号：US20240175811A1

公开(公告)日：2024-05-30

申请号：US18283296

申请日：2022-01-31

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Kazuki HORITA ,  Kouichiro AKIYAMA ,  Yoichi KAWADA ,  Hiroshi SATOZONO

IPC: G01N21/3577 ,  G01N1/44

CPC classification number: G01N21/3577 ,  G01N1/44

Abstract: An ATR apparatus includes a prism having a reflection surface, a holding unit holding a sample including a suspension on the reflection surface, and an adjustment unit adjusting a fluidal state of the sample held on the reflection surface. The adjustment unit adjusts the fluidal state of the sample to a first fluidal state in order to acquire a first detection result relating to the sample in the first fluidal state and adjusts the fluidal state of the sample to a second fluidal state in order to acquire a second detection result relating to the sample in the second fluidal state.

公开(公告)号：US20200173916A1

公开(公告)日：2020-06-04

申请号：US16701242

申请日：2019-12-03

Applicant: HAMAMATSU PHOTONICS K.K. ,  National Institute of Health Sciences

Inventor： Kouichiro AKIYAMA ,  Kazuki HORITA ,  Hironori TAKAHASHI ,  Hiroshi SATOZONO ,  Tomoaki SAKAMOTO

IPC: G01N21/3581 ,  G01N21/55

Abstract: A fermentation state monitoring apparatus includes: a terahertz wave generation element that outputs inspection light using a terahertz wave to a fermented food under fermentation in a sealed product container; a terahertz wave detection element that detects return light of the inspection light reflected by the fermented food in the product container; and a determination unit that determines a fermentation progress of the fermented food based on an index value including a reflectance of the return light with respect to the inspection light or an absorption coefficient of the return light with respect to the inspection light.

公开(公告)号：US20160202179A1

公开(公告)日：2016-07-14

申请号：US14982022

申请日：2015-12-29

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Atsushi NAKANISHI ,  Kazuki HORITA ,  Takashi YASUDA

IPC: G01N21/3586

CPC classification number: G01N21/3586 ,  G01N21/3563 ,  G01N21/3581 ,  G01N21/4795 ,  G01N2201/06113

Abstract: A terahertz wave temporal waveform acquisition apparatus includes a light source, a branch part, a terahertz wave generation element, a terahertz wave detection element, a delay providing medium, a temperature adjustment unit, and an analysis unit. The delay providing medium is disposed on an optical path of a terahertz wave from the terahertz wave generation element to the terahertz wave detection element, is formed of a material of which a refractive index for the terahertz wave depends on the temperature, and provides a delay according to the temperature to the terahertz wave.

Abstract translation: 太赫兹波时间波形获取装置包括光源，分支部分，太赫兹波发生元件，太赫兹波检测元件，延迟提供介质，温度调节单元和分析单元。 延迟提供介质设置在从太赫兹波发生元件到太赫兹波检测元件的太赫兹波的光路上，由其中太赫兹波的折射率取决于温度的材料形成，并提供延迟 根据太赫兹波的温度。

公开(公告)号：US20190271642A1

公开(公告)日：2019-09-05

申请号：US16285274

申请日：2019-02-26

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Kazuki HORITA ,  Yoichi KAWADA ,  Atsushi NAKANISHI ,  Kazuue FUJITA ,  Hironori TAKAHASHI ,  Hiroshi SATOZONO

IPC: G01N21/3586 ,  G01N21/552 ,  G01J3/42

Abstract: An optical measurement device includes a light source configured to output a terahertz wave and coaxial light having a wavelength different from the wavelength of the terahertz wave, coaxially with the terahertz wave; an intensity modulation unit configured to perform intensity modulation of at least the terahertz wave of the terahertz wave and the coaxial light in a predetermined modulation frequency; and a light detection unit configured to synchronously detects each of the terahertz wave and the coaxial light which have acted on a measurement subject via the intensity modulation unit based on the modulation frequency.

公开(公告)号：US20190234871A1

公开(公告)日：2019-08-01

申请号：US16245355

申请日：2019-01-11

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Atsushi NAKANISHI ,  Kazuue FUJITA ,  Kazuki HORITA

IPC: G01N21/3586 ,  G02B17/04 ,  G01J3/02

Abstract: A terahertz wave spectroscopic measurement device includes a light source that emits a terahertz wave and probe light having a wavelength different from that of the terahertz wave, an internal total reflection prism including an incidence surface of the terahertz wave, a placement surface on which a measurement target is placed, and an emission surface of the terahertz wave, the internal total reflection prism internally totally reflecting the terahertz wave incident from the incidence surface by means of the placement surface and emitting the terahertz wave from the emission surface, and a terahertz wave detection unit that indirectly detects the terahertz wave emitted from the emission surface using the probe light. The internal total reflection prism includes an avoidance portion on which incidence of the probe light on the measurement target on the placement surface is avoided.