-
公开(公告)号：US20240142360A1
公开(公告)日：2024-05-02
申请号：US18280497
申请日：2022-03-24
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Kazuhiro TAKAHASHI , Kouichiro AKIYAMA , Hiroshi SATOZONO
CPC classification number: G01N15/042 , G01N2015/0053 , G01N2015/045
Abstract: A dispersion stability evaluation method is a method for evaluating a dispersion stability of dispersoid dispersed in a dispersion medium. The dispersion stability evaluation method includes a first step of holding a sample including the dispersion medium and the dispersoid on a reflective surface, and a second step of causing terahertz waves to be incident on the reflective surface from a side opposite to the sample and detecting the terahertz waves reflected by the reflective surface. In the second step, while a state where the dispersoid are allowed to move toward the reflective surface is maintained, a plurality of detection results respectively corresponding to a plurality of times apart from each other are acquired.
-
公开(公告)号：US20230304923A1
公开(公告)日：2023-09-28
申请号：US18120551
申请日：2023-03-13
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Hisanari TAKAHASHI , Koyo WATANABE , Hiroshi SATOZONO , Kyohei SHIGEMATSU , Takashi INOUE
CPC classification number: G01N21/31 , G02F1/31 , G02F2203/055
Abstract: An optical property measurement apparatus includes a pulse formation unit, a waveform measurement unit, and an optical system. The pulse formation unit is capable of changing a temporal waveform of pulsed light in accordance with a type of optical property to be measured. The waveform measurement unit measures a temporal waveform of the pulsed light output from a measurement object after being incident on the measurement object. The optical system has an attenuation unit with an attenuation rate with respect to one wavelength component constituting the pulsed light larger than an attenuation rate with respect to another wavelength component constituting the pulsed light. The optical system is capable of switching between a first state in which the attenuation unit is arranged on an optical path of the pulsed light output from the measurement object and a second state in which the attenuation unit is not arranged on the optical path.
-
公开(公告)号：US20210041600A1
公开(公告)日：2021-02-11
申请号：US16984497
申请日：2020-08-04
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Yoichi KAWADA , Hiroshi SATOZONO
IPC: G02B1/118
Abstract: An optical element includes a laminate including a first refractive index layer and a second refractive index layer having different refractive index for terahertz waves, wherein the laminate includes a pair layer group in which a plurality of pair layers including the first refractive index layer and the second refractive index layer are laminated, wherein the thickness of the first refractive index layer and the thickness of the second refractive index layer are each smaller than a wavelength of the terahertz waves, and wherein each of the pair layers has a predetermined effective refractive index for the terahertz waves depending on a thickness ratio between the first refractive index layer and the second refractive index layer.
-
公开(公告)号：US20200173916A1
公开(公告)日：2020-06-04
申请号：US16701242
申请日：2019-12-03
Inventor： Kouichiro AKIYAMA , Kazuki HORITA , Hironori TAKAHASHI , Hiroshi SATOZONO , Tomoaki SAKAMOTO
IPC: G01N21/3581 , G01N21/55
Abstract: A fermentation state monitoring apparatus includes: a terahertz wave generation element that outputs inspection light using a terahertz wave to a fermented food under fermentation in a sealed product container; a terahertz wave detection element that detects return light of the inspection light reflected by the fermented food in the product container; and a determination unit that determines a fermentation progress of the fermented food based on an index value including a reflectance of the return light with respect to the inspection light or an absorption coefficient of the return light with respect to the inspection light.
-
5.发明公开公开(公告)号：US20240175811A1
公开(公告)日：2024-05-30
申请号：US18283296
申请日：2022-01-31
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Kazuki HORITA , Kouichiro AKIYAMA , Yoichi KAWADA , Hiroshi SATOZONO
IPC: G01N21/3577 , G01N1/44
CPC classification number: G01N21/3577 , G01N1/44
Abstract: An ATR apparatus includes a prism having a reflection surface, a holding unit holding a sample including a suspension on the reflection surface, and an adjustment unit adjusting a fluidal state of the sample held on the reflection surface. The adjustment unit adjusts the fluidal state of the sample to a first fluidal state in order to acquire a first detection result relating to the sample in the first fluidal state and adjusts the fluidal state of the sample to a second fluidal state in order to acquire a second detection result relating to the sample in the second fluidal state.
-
Patent Agency Ranking
公开(公告)号：US20230258620A1
公开(公告)日：2023-08-17
申请号：US18095575
申请日：2023-01-11
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Tetsuya UCHIDA , Kouichiro AKIYAMA , Hiroshi SATOZONO , Tomoyuki HAKAMATA
IPC: G01N33/24 , G01N21/552 , G01N21/3581
CPC classification number: G01N33/246 , G01N21/552 , G01N21/3581
Abstract: A hygroscopicity evaluation method includes: a first step of preparing a first sample and a second sample; a second step of acquiring a first detection result for the first sample and a second detection result for the second sample by making a terahertz wave incident on each of the first and second samples; and a third step of evaluating the hygroscopicity of a measurement target object based on a first frequency characteristic calculated from the first detection result and a second frequency characteristic calculated from the second detection result. In the third step, the magnitude of the hygroscopicity of the measurement target object is evaluated based on the difference between the magnitude of a first peak of the first frequency characteristic in a reference frequency range and the magnitude of a second peak of the second frequency characteristic in the reference frequency range.
-
公开(公告)号：US20220091027A1
公开(公告)日：2022-03-24
申请号：US17474338
申请日：2021-09-14
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Kazuhiro TAKAHASHI , Kouichiro AKIYAMA , Hiroshi SATOZONO
IPC: G01N21/3563 , G01N21/552
Abstract: A terahertz wave attenuated total reflection spectroscopic method, includes: a first step of disposing a measurement target of which a volume is changed during a measurement period on a reflection surface; and a second step of acquiring data including a plurality of detection results respectively corresponding to a plurality of times separated from each other during the measurement period by allowing a terahertz wave to be incident on the reflection surface from a side opposite to the measurement target and by detecting the terahertz wave reflected on the reflection surface, during the measurement period. In the second step, a state in which a substantially constant pressure is applied to the measurement target disposed on the reflection surface is maintained during the measurement period.
-
公开(公告)号：US20250102429A1
公开(公告)日：2025-03-27
申请号：US18725845
申请日：2022-12-02
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Kouichiro AKIYAMA , Hiroshi SATOZONO
IPC: G01N21/3581
Abstract: There is provided an optical member for terahertz. The optical member is constituted by a molded body containing a mixture of an organic nonlinear optical material and an excipient. There is also provided an optical element including: the optical member; and a support member configured to support the optical member. There is also provided a method for manufacturing an optical member for terahertz. The method includes: a first process of mixing an organic nonlinear optical material and an excipient to form a mixture; and a second process of forming a molded body of the mixture by applying a pressure to the mixture after the first process.
-
公开(公告)号：US20230130965A1
公开(公告)日：2023-04-27
申请号：US17968964
申请日：2022-10-19
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Yoichi KAWADA , Takashi YASUDA , Hiroshi SATOZONO
Abstract: The optical element for a low frequency band includes a substrate including a first main face and a second main face, the substrate having birefringence, and an antireflection film located on the first main face, wherein the low frequency band is lower than a reststrahlen band of the antireflection film, wherein an absolute value of a difference between a first refractive index and a second refractive index of the substrate in the low frequency band is 0.2 or more, and wherein a thickness of the substrate is 15 μm or more and 4000 μm or less.
-
公开(公告)号：US20190271639A1
公开(公告)日：2019-09-05
申请号：US16414253
申请日：2019-05-16
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Hiroshi SATOZONO
Abstract: Circular dichroism can be accurately measured even when a phase modulation element with a distortion component is used.A circular dichroism measuring method using a circular dichroism measuring device 2 includes a step of measuring Ip(t) (S101: phase amount change acquisition step), a step of measuring Is(t) (S102: sample data acquisition step), a step of converting Ip(t) to δ(t) (S103: phase amount change acquisition step), a step of converting Is(t) to Is(δ) (S104: analysis step/Is(δ) calculation step), and a step of performing curve fitting to calculate matrix elements S00, S02, and S03 (S105: analysis step/matrix element calculation step).
-
-
-
-
-
-
-
-
-
Search Results
21
records
(took 0.015 seconds)
