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公开(公告)号：US20160224055A1
公开(公告)日：2016-08-04
申请号：US14961829
申请日：2015-12-07
Applicant: FLIR Systems, Inc.
Inventor： Brian Simolon , Eric A. Kurth , Jim Goodland , Mark Nussmeier , Nicholas Hogasten , Theodore R. Hoelter , Katrin Strandemar , Pierre Boulanger , Barbara Sharp , Naseem Y. Aziz
IPC: G06F1/14
CPC classification number: H04N5/3765 , G01R23/00 , G06F1/04 , G06F11/0703 , G06F11/076 , H04N5/2257 , H04N5/33 , H04N5/365
Abstract: Various techniques are provided to detect abnormal clock rates in devices such as imaging sensor devices (e.g., infrared and/or visible light imaging devices). In one example, a device may include a clock rate detection circuit that may be readily integrated as part of the device to provide effective detection of an abnormal clock rate. The device may include a ramp generator, a counter, and/or other components which may already be implemented as part of the device. The ramp generator may generate a ramp signal independent of a clock signal provided to the device, while the counter may increment or decrement a count value in response to the clock signal. The device may include a comparator adapted to select a current count value of the counter when the ramp signal reaches a reference signal. A processor of the device may be adapted to determine whether the clock signal is operating in an acceptable frequency range, based on the selected count value.
Abstract translation: 提供各种技术来检测诸如成像传感器设备（例如，红外和/或可见光成像设备）的设备中的异常时钟速率。 在一个示例中，设备可以包括时钟速率检测电路，其可以容易地集成为设备的一部分，以提供异常时钟速率的有效检测。 该装置可以包括斜坡发生器，计数器和/或可以被实现为装置的一部分的其它部件。 斜坡发生器可以产生与提供给设备的时钟信号无关的斜坡信号，而计数器可以响应于时钟信号递增或递减计数值。 该装置可以包括比较器，适于在斜坡信号达到参考信号时选择计数器的当前计数值。 设备的处理器可以适于基于所选择的计数值来确定时钟信号是否在可接受的频率范围内操作。
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公开(公告)号：US11108967B2
公开(公告)日：2021-08-31
申请号：US16511401
申请日：2019-07-15
Applicant: FLIR Systems, Inc.
Inventor： Joseph Kostrzewa , Naseem Y. Aziz , John D. Schlesselmann , Brian B. Simolon , Theodore B. Hoelter
Abstract: Techniques are disclosed for systems and methods for facilitating infrared imaging in multiple imaging modes. A device may include an infrared image capture circuit and at least one processing circuit. The infrared image capture circuit may be configured to detect first infrared data and generate a first pixel value based on the first infrared data and a first imaging mode among multiple imaging modes. The at least one processing circuit may be configured to compare the first pixel value to a set of saturation threshold values associated with the first imaging mode. The at least one processing circuit may be further configured to select an imaging mode among the multiple imaging modes based on the comparison of the first pixel value. The at least one processing circuit may be further configured to set the infrared image capture circuit to generate a second pixel value based on the selected imaging mode.
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公开(公告)号：US11012647B2
公开(公告)日：2021-05-18
申请号：US16542625
申请日：2019-08-16
Applicant: FLIR Systems, Inc.
Inventor： Robert F. Cannata , Brian B. Simolon , Naseem Y. Aziz
Abstract: A bolometer circuit includes a substrate on which a focal plane array (FPA) of active bolometers is provided. Each active bolometer is configured to receive external infrared (IR) radiation and substantially thermally isolated from the substrate. The bolometer circuit also includes one or more blind arrays of blind bolometers shielded from the external IR radiation and substantially thermally isolated from the substrate. Noises in outputs from each column and/or each row of the FPA are corrected, reduced, or suppressed based on a statistical property of outputs from a corresponding column or row of the one or more blind arrays. Noise in each frame of IR image captured by the FPA may also be corrected, reduced, or suppressed using the one or more blind arrays.
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公开(公告)号：US11015979B2
公开(公告)日：2021-05-25
申请号：US16542673
申请日：2019-08-16
Applicant: FLIR Systems, Inc.
Inventor： Naseem Y. Aziz , Brian B. Simolon
Abstract: A bolometer circuit may include an active bolometer configured to receive external infrared (IR) radiation. The bolometer circuit may be configured to reduce power consumption at high temperatures. In particular, the bolometer circuit may include additional resistors provided in the resistive loads for bolometer conduction paths to limit power at high temperatures. In some embodiments, the bias (e.g., a voltage level) to the gates of transistors in the resistive loads for the bolometer conduction paths may be adjusted based on temperature to limit power and/or current at high temperatures. In bolometer circuits with a feedback resistor provided across an amplifier to configure a feedback amplifier, a circuit with adjustable amplifier power may be provided to save power. In some embodiments, a bolometer circuits may be provided with reduced gains to allow for very hot scenes to be imaged without railing the output.
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公开(公告)号：US10197448B2
公开(公告)日：2019-02-05
申请号：US15484989
申请日：2017-04-11
Applicant: FLIR Systems, Inc.
Inventor： Brian B. Simolon , Naseem Y. Aziz , Mark T. Nussmeier , Robert F. Cannata
Abstract: A bolometer circuit may include an active bolometer configured to receive external infrared (IR) radiation and a resistive load, which are configured to be connected in series in a bolometer conduction path from a supply voltage node to a common voltage node. A node in the bolometer conduction path between the resistive load and the active bolometer is coupled to a first input of an op-amp. A variable voltage source is coupled to a second input of the op-amp to provide a reference voltage level. The op-amp maintains the reference voltage level at the first input to generate a current flow in response to a resistance change of the active bolometer due to the external IR radiation. The amplifier circuit may be configured as a feedback amplifier or an integrating amplifier. The bolometer circuit may be configured to enable a low-power mode of operation.
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Patent Agency Ranking
公开(公告)号：US09958332B2
公开(公告)日：2018-05-01
申请号：US15483655
申请日：2017-04-10
Applicant: FLIR Systems, Inc.
Inventor： Brian B. Simolon , Naseem Y. Aziz , Nicholas Högasten
CPC classification number: G01J5/24 , G01J1/44 , G01J2005/0077 , G01J2005/202
Abstract: Various techniques are disclosed for bolometer circuits and related methods for thermal imaging in a difference domain, where each pixel value represents a difference in incident IR radiation intensity between adjacent bolometers. For example, a bolometer circuit may include an array of bolometers each configured to generate a pixel signal in response to a bias and incident infrared radiation. Each column of the bolometer array may comprise an amplifier, a first plurality of switches each configured to selectively provide a supply voltage to a respective one of bolometers of the each column, a second plurality of switches each configured to selectively route a difference of the pixel signals of a respective adjacent pair of the bolometers of the each column to an input of the amplifier, and a third plurality of switches configured to selectively provide a common voltage to a respective one of the bolometers of the each column.
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公开(公告)号：US11212466B2
公开(公告)日：2021-12-28
申请号：US16909768
申请日：2020-06-23
Applicant: FLIR Systems, Inc.
Inventor： Brian B. Simolon , Naseem Y. Aziz
Abstract: Techniques are disclosed for facilitating multiple microbolometer selection for simultaneous readout. In one example, a device includes a plurality of microbolometers. The plurality of microbolometers includes a first set and a second set of serially-connected microbolometers. The device further includes a first plurality of switches configured to selectively short the plurality of microbolometers. The device further includes a second plurality of switches configured to selectively couple the plurality of microbolometers to ground. The device further includes a third plurality of switches configured to selectively provide a bias signal to the plurality of microbolometers. The device further includes a processing circuit configured to configure the first plurality, second plurality, and third plurality of switches to cause simultaneous read out of one microbolometer of the first set and one microbolometer of the second set. Related methods and systems are also provided.
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公开(公告)号：US20200322548A1
公开(公告)日：2020-10-08
申请号：US16909768
申请日：2020-06-23
Applicant: FLIR Systems, Inc.
Inventor： Brian B. Simolon , Naseem Y. Aziz
Abstract: Techniques are disclosed for facilitating multiple microbolometer selection for simultaneous readout. In one example, a device includes a plurality of microbolometers. The plurality of microbolometers includes a first set and a second set of serially-connected microbolometers. The device further includes a first plurality of switches configured to selectively short the plurality of microbolometers. The device further includes a second plurality of switches configured to selectively couple the plurality of microbolometers to ground. The device further includes a third plurality of switches configured to selectively provide a bias signal to the plurality of microbolometers. The device further includes a processing circuit configured to configure the first plurality, second plurality, and third plurality of switches to cause simultaneous read out of one microbolometer of the first set and one microbolometer of the second set. Related methods and systems are also provided.
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公开(公告)号：US20190342480A1
公开(公告)日：2019-11-07
申请号：US16511401
申请日：2019-07-15
Applicant: FLIR Systems, Inc.
Inventor： Joseph Kostrzewa , Naseem Y. Aziz , John D. Schlesselmann , Brian B. Simolon , Theodore B. Hoelter
Abstract: Techniques are disclosed for systems and methods for facilitating infrared imaging in multiple imaging modes. A device may include an infrared image capture circuit and at least one processing circuit. The infrared image capture circuit may be configured to detect first infrared data and generate a first pixel value based on the first infrared data and a first imaging mode among multiple imaging modes. The at least one processing circuit may be configured to compare the first pixel value to a set of saturation threshold values associated with the first imaging mode. The at least one processing circuit may be further configured to select an imaging mode among the multiple imaging modes based on the comparison of the first pixel value. The at least one processing circuit may be further configured to set the infrared image capture circuit to generate a second pixel value based on the selected imaging mode.
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公开(公告)号：US09948878B2
公开(公告)日：2018-04-17
申请号：US14961829
申请日：2015-12-07
Applicant: FLIR Systems, Inc.
Inventor： Brian Simolon , Eric A. Kurth , Jim Goodland , Mark Nussmeier , Nicholas Hogasten , Theodore R. Hoelter , Katrin Strandemar , Pierre Boulanger , Barbara Sharp , Naseem Y. Aziz
CPC classification number: H04N5/3765 , G01R23/00 , G06F1/04 , G06F11/0703 , G06F11/076 , H04N5/2257 , H04N5/33 , H04N5/365
Abstract: Various techniques are provided to detect abnormal clock rates in devices such as imaging sensor devices (e.g., infrared and/or visible light imaging devices). In one example, a device may include a clock rate detection circuit that may be readily integrated as part of the device to provide effective detection of an abnormal clock rate. The device may include a ramp generator, a counter, and/or other components which may already be implemented as part of the device. The ramp generator may generate a ramp signal independent of a clock signal provided to the device, while the counter may increment or decrement a count value in response to the clock signal. The device may include a comparator adapted to select a current count value of the counter when the ramp signal reaches a reference signal. A processor of the device may be adapted to determine whether the clock signal is operating in an acceptable frequency range, based on the selected count value.
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