Droplet separator installation
    2.
    发明授权
    Droplet separator installation 有权
    滴液分离器安装

    公开(公告)号:US08002882B2

    公开(公告)日:2011-08-23

    申请号:US11579393

    申请日:2004-11-04

    申请人: Detlef Weber

    发明人: Detlef Weber

    IPC分类号: B01D45/08

    CPC分类号: F28F25/00 B01D45/08

    摘要: A droplet separator installation for gas washers, cooling towers etc. is described according to which a row of parallel droplet separator profiles is supported at a support construction by means of an intermediate construction. The intermediate construction serves for the support and the stabilization of the droplet separator profile row and for the support of a rinsing means for rinsing the droplet separator profile row.

    摘要翻译: 描述了用于气体洗涤器,冷却塔等的液滴分离器装置,根据该液滴分离器装置,通过中间结构在支撑结构处支撑一排平行的液滴分离器型材。 中间结构用于液滴分离器轮廓排的支撑和稳定,并且用于支撑用于冲洗液滴分离器轮廓排的冲洗装置。

    Manufacturing method for an integrated semiconductor contact structure having an improved aluminum fill
    4.
    发明申请
    Manufacturing method for an integrated semiconductor contact structure having an improved aluminum fill 审中-公开
    具有改进的铝填充的集成半导体接触结构的制造方法

    公开(公告)号:US20070243708A1

    公开(公告)日:2007-10-18

    申请号:US11402675

    申请日:2006-04-12

    IPC分类号: H01L21/4763 H01L21/44

    摘要: The present invention provides a manufacturing method for an integrated semiconductor contact structure having an improved Aluminum fill comprising the steps of: forming contact holes in an insulation layer provided on a wafer, said contact holes having a respective bottom and respective sidewalls, said bottoms including a respective conductive area; introducing said wafer into a first PVD deposition chamber, said first PVD deposition chamber including a wafer bias means; and cold depositing a first Aluminum layer on the wafer in said first PVD deposition chamber, said first Aluminum layer covering said bottoms and said sidewalls of said contact holes and forming a seed layer; wherein during said step of cold depositing said first Aluminum layer on the wafer in said first PVD deposition chamber said wafer bias means is set to a bias in the range between 20 W and 700 W or −50 V to −800 V.

    摘要翻译: 本发明提供一种具有改进的铝填充物的集成半导体接触结构的制造方法,包括以下步骤:在设置在晶片上的绝缘层中形成接触孔,所述接触孔具有相应的底部和相应的侧壁,所述底部包括 各导电面积; 将所述晶片引入第一PVD沉积室,所述第一PVD沉积室包括晶片偏置装置; 并且在所述第一PVD沉积室中在所述晶片上冷沉积第一铝层,所述第一铝层覆盖所述底部和所述接触孔的所述侧壁并形成种子层; 其中在所述第一PVD沉积室中将所述第一铝层冷沉积在所述晶片上的步骤期间,所述晶片偏置装置被设置为在20W和700W之间或-50V至-800V的范围内的偏压。

    Method of fabricating an integrated memory device
    5.
    发明申请
    Method of fabricating an integrated memory device 审中-公开
    制造集成存储器件的方法

    公开(公告)号:US20070218629A1

    公开(公告)日:2007-09-20

    申请号:US11375590

    申请日:2006-03-15

    IPC分类号: H01L21/336

    CPC分类号: H01L27/10858 H01L27/10897

    摘要: Method of fabricating an integrated memory device including the steps of providing a semiconductor substrate, including an array region and a support region; providing GC-lines in said array region and in said support region, wherein the GC-lines in said support region have a first height; providing in the array region bit line contacts projecting above said GC-lines, wherein said bit line contacts have a second height being higher than said first height; providing a first isolation layer, the maximum height of said GC-lines in said support region including the coverage of said first isolation layer being lower than said second height; providing a second isolation layer on said first isolation layer; and polishing said first isolation layer and said second isolation layer, such that a planar surface of the integrated memory device is provided and such that said bit line contacts are exposed.

    摘要翻译: 一种集成存储器件的制造方法,包括以下步骤:提供包括阵列区域和支撑区域的半导体衬底; 在所述阵列区域和所述支撑区域中提供GC线,其中所述支撑区域中的GC线具有第一高度; 提供在所述GC线上方突出的阵列区位线触点,其中所述位线触点具有高于所述第一高度的第二高度; 提供第一隔离层,所述支撑区域中所述GC线的最大高度包括所述第一隔离层的覆盖范围低于所述第二高度; 在所述第一隔离层上提供第二隔离层; 并且抛光所述第一隔离层和所述第二隔离层,使得提供所述集成存储器件的平坦表面,并使所述位线触点露出。

    Droplet Separator Installation
    9.
    发明申请
    Droplet Separator Installation 有权
    滴液分离器安装

    公开(公告)号:US20080264260A1

    公开(公告)日:2008-10-30

    申请号:US11579393

    申请日:2004-11-04

    申请人: Detlef Weber

    发明人: Detlef Weber

    IPC分类号: B01D19/00

    CPC分类号: F28F25/00 B01D45/08

    摘要: A droplet separator installation for gas washers, cooling towers etc. is described according to which a row of parallel droplet separator profiles is supported at a support construction by means of an intermediate construction. The intermediate construction serves for the support and the stabilization of the droplet separator profile row and for the support of a rinsing means for rinsing the droplet separator profile row.

    摘要翻译: 描述了用于气体洗涤器,冷却塔等的液滴分离器装置,根据该液滴分离器装置,通过中间结构在支撑结构处支撑一排平行的液滴分离器型材。 中间结构用于液滴分离器轮廓排的支撑和稳定,并且用于支撑用于冲洗液滴分离器轮廓排的冲洗装置。

    Metallization arrangement for semiconductor structure and corresponding fabrication method
    10.
    发明授权
    Metallization arrangement for semiconductor structure and corresponding fabrication method 失效
    半导体结构的金属化布置及相应的制造方法

    公开(公告)号:US06908844B2

    公开(公告)日:2005-06-21

    申请号:US09898909

    申请日:2001-07-03

    申请人: Detlef Weber

    发明人: Detlef Weber

    摘要: The present invention provides a metallization arrangement for a semiconductor structure (1) having a first substructure plane (M1), preferably a first metallization plane; a second metallization plane (M2) having a first and a second adjacent interconnect (LBA; LBB); a first intermediate dielectric (ILD1) for mutual electrical insulation of the first substructure plane (M1) and second metallization plane (M2); and via holes (V) filled with a conductive material (FM) in the intermediate dielectric (ILD1) for connecting the first substructure plane (M1) and second metallization plane (M2). A liner layer (L) made of a dielectric material is provided under the second metallization plane (M2), which liner layer is interrupted in the interspace (O) between the first and second adjacent interconnects (LBA; LBB) of the second metallization plane (M2). The invention likewise provides a corresponding fabrication method.

    摘要翻译: 本发明提供一种用于具有第一子结构平面(M 1),优选第一金属化平面的半导体结构(1)的金属化装置; 具有第一和第二相邻互连(LBA; LBB)的第二金属化平面(M 2); 用于第一子结构平面(M 1)和第二金属化平面(M 2)的相互电绝缘的第一中间电介质(ILD 1); 以及用于连接第一子结构平面(M 1)和第二金属化平面(M 2)的中间电介质(ILD 1)中填充有导电材料(FM)的通孔(V)。 在第二金属化平面(M 2)的下面设置由介电材料制成的衬里层(L),该衬垫层在第二金属化层的第一和第二相邻互连(LBA; LBB)之间的间隙(O) 平面(M 2)。 本发明同样提供了相应的制造方法。