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公开(公告)号：US09490688B2
公开(公告)日：2016-11-08
申请号：US14399249
申请日：2013-10-15
发明人： Christoph Hornstein , Ulrich Bley , Kai Kuehnen
CPC分类号： H02M1/08 , H02M2001/0054 , H02P27/04 , H03K4/02 , H03K17/163 , H03K17/168 , H03K19/003 , H03K2217/0036 , Y10T307/977
摘要： A method is disclosed for switching a semiconductor switch from a first static switch state to a second static switch state by controlling a control connection of the semiconductor switch. The method includes switching the semiconductor switch in a current-controlled manner starting from the first static switch state in a first switching phase by applying at least one first specified actuating current at the control connection of the semiconductor switch in a controlled manner, and switching the semiconductor switch in a voltage-controlled manner in a second switching phase following the first switching phase by applying at least one first specified actuating voltage to the control connection of the semiconductor switch in a controlled manner until the second static switch state is reached. In this manner, switching losses are reduced.
摘要翻译： 公开了一种通过控制半导体开关的控制连接将半导体开关从第一静态开关状态切换到第二静态开关状态的方法。 该方法包括以第一开关阶段从第一静态开关状态开始以电流控制方式切换半导体开关，通过在半导体开关的控制连接处以受控的方式施加至少一个第一规定的致动电流，并切换 半导体开关以电压控制方式在第一开关阶段之后的第二开关阶段中，以受控的方式施加至少一个第一指定的启动电压到半导体开关的控制连接，直到达到第二静态开关状态。 以这种方式，减少了开关损耗。
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公开(公告)号：US09606184B2
公开(公告)日：2017-03-28
申请号：US14432613
申请日：2013-10-15
发明人： Christoph Hornstein , Ulrich Bley , Kai Kuehnen
CPC分类号： G01R31/327 , G01R31/26 , G01R31/28 , H02M1/38 , H03K17/18
摘要： A method is disclosed for determining fault states in a half-bridge circuit having at least a first semiconductor switch and a second semiconductor switch are connected in series with one another and each controllable by a control signal to switch between an open and a closed switching state. For each of the first and second semiconductor switches, an actual switching state and a setpoint switching state are determined. A bridge short circuit in the half-bridge circuit is identified if both (a) the actual switching state of the first semiconductor switch is different than the setpoint switching state of the first semiconductor switch and (b) the actual switching state of the second semiconductor switch is different than the setpoint switching state of the second semiconductor switch.
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公开(公告)号：US09559666B2
公开(公告)日：2017-01-31
申请号：US14432662
申请日：2013-10-15
发明人： Christoph Hornstein , Ulrich Bley , Kai Kuehnen , Eric Taistra
IPC分类号： H03K3/00 , H03K3/012 , H03K4/02 , H03K17/082
CPC分类号： H03K3/012 , H03K4/02 , H03K17/082
摘要： A method for actuating a controllable semiconductor switch by switching the switch on an off in phases in a controlled manner using a control signal is disclosed. The method includes starting a time measurement at the beginning of at least one phase of the phase-wise on-and-off switching procedure to ascertain a time duration, wherein the time measurement is continued until a phase following the at least one phase of the phase-wise on-and-off switching procedure begins. The ascertained time duration is compared with a specified maximal time duration. If the ascertained time duration exceeds the specified maximal time duration, the semiconductor switch is actuated such that the semiconductor switch is switched into a specified operating state.
摘要翻译： 公开了一种通过使用控制信号以受控的方式将开关切换为截止状态来致动可控半导体开关的方法。 该方法包括在相位导通和关断切换过程的至少一个相位的开始处开始时间测量，以确定持续时间，其中，时间测量持续到在所述至少一个相位之后的相位 逐步的开 - 关切换程序开始。 将确定的持续时间与指定的最大持续时间进行比较。 如果确定的持续时间超过规定的最大持续时间，则半导体开关被致动，使得半导体开关切换到指定的操作状态。
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公开(公告)号：US20180234091A1
公开(公告)日：2018-08-16
申请号：US15950841
申请日：2018-04-11
IPC分类号： H03K17/18 , H03K17/693 , H04L25/49 , H03K17/081 , H02M7/5387
CPC分类号： H03K17/18 , H02M7/53873 , H03K17/08104 , H03K17/26 , H03K17/693 , H04L25/4902
摘要： A method for operating at least one semiconductor switch using at least one pulse-width-modulated driver signal is disclosed. Digital data are transmitted in a modulated manner on the pulse-width-modulated driver signal. The digital data includes information about measurement variables and/or reference/control variables and/or manipulated variables for operating the semiconductor switch.
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5.发明申请Method and Circuit Unit for Determining Fault States in a Half-Bridge Circuit 有权用于确定半桥电路故障状态的方法和电路单元公开(公告)号：US20150276875A1
公开(公告)日：2015-10-01
申请号：US14432613
申请日：2013-10-15
发明人： Christoph Hornstein , Ulrich Bley , Kai Kuehnen
IPC分类号： G01R31/327 , G01R31/28 , G01R31/26
CPC分类号： G01R31/327 , G01R31/26 , G01R31/28 , H02M1/38 , H03K17/18
摘要： A method is disclosed for determining fault states in a half-bridge circuit having at least a first semiconductor switch and a second semiconductor switch are connected in series with one another and each controllable by a control signal to switch between an open and a closed switching state. For each of the first and second semiconductor switches, an actual switching state and a setpoint switching state are determined. A bridge short circuit in the half-bridge circuit is identified if both (a) the actual switching state of the first semiconductor switch is different than the setpoint switching state of the first semiconductor switch and (b) the actual switching state of the second semiconductor switch is different than the setpoint switching state of the second semiconductor switch.
摘要翻译： 公开了一种用于确定具有至少第一半导体开关的半桥电路中的故障状态的方法，并且第二半导体开关彼此串联连接，并且每个可由控制信号控制以在开关和闭合开关状态之间切换 。 对于第一和第二半导体开关中的每一个，确定实际开关状态和设定点切换状态。 如果（a）第一半导体开关的实际开关状态不同于第一半导体开关的设定点开关状态，则确定半桥电路中的桥短路，以及（b）第二半导体的实际开关状态 开关不同于第二半导体开关的设定点开关状态。
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公开(公告)号：US20150222250A1
公开(公告)日：2015-08-06
申请号：US14432662
申请日：2013-10-15
发明人： Christoph Hornstein , Ulrich Bley , Kai Kuehnen , Eric Taistra
IPC分类号： H03K3/012
CPC分类号： H03K3/012 , H03K4/02 , H03K17/082
摘要： A method for actuating a controllable semiconductor switch by switching the switch on an off in phases in a controlled manner using a control signal is disclosed. The method includes starting a time measurement at the beginning of at least one phase of the phase-wise on-and-off switching procedure to ascertain a time duration, wherein the time measurement is continued until a phase following the at least one phase of the phase-wise on-and-off switching procedure begins. The ascertained time duration is compared with a specified maximal time duration. If the ascertained time duration exceeds the specified maximal time duration, the semiconductor switch is actuated such that the semiconductor switch is switched into a specified operating state.
摘要翻译： 公开了一种通过使用控制信号以受控的方式将开关切换为截止状态来致动可控半导体开关的方法。 该方法包括在相位导通和关断切换过程的至少一个相位的开始处开始时间测量，以确定持续时间，其中，时间测量持续到在所述至少一个相位之后的相位 逐步的开 - 关切换程序开始。 将确定的持续时间与指定的最大持续时间进行比较。 如果确定的持续时间超过规定的最大持续时间，则半导体开关被致动，使得半导体开关切换到指定的操作状态。
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