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公开(公告)号：US20230258916A1
公开(公告)日：2023-08-17
申请号：US18018331
申请日：2021-07-29
发明人： Daniel Schwedt , Tiemo Anhut , Peter Schacht
CPC分类号： G02B21/0076 , G02B21/0032 , G01N21/6458 , G02B21/008
摘要： The invention relates to a method for detecting emission light, in particular fluorescent light from at least one fluorescent dye, in a laser scanning microscope, wherein the emission light emanating from a sample is guided, by an imaging optical unit, onto a two-dimensional matrix sensor having a plurality of pixels and being located on an image plane, and a detection point distribution function is detected by the matrix sensor in a spatially oversampled manner. The method is characterized in that the emission light emanating from the sample is spectrally separated in a dispersion device, in particular in a dispersion direction; the spectrally separated emission light is detected by the matrix sensor in a spectrally resolved manner; and during the analysis of the intensities measured by the pixels of a pixel region, the spectral separation is cancelled at least for some of said pixels. Additional aspects of the invention relate to a detection device for the spectrally resolved detection of emission light in a laser scanning microscope and to a laser scanning microscope.
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公开(公告)号：US10726529B2
公开(公告)日：2020-07-28
申请号：US15737152
申请日：2016-06-03
发明人： Tiemo Anhut , Tobias Kaufhold , Daniel Schwedt , Burkhard Roscher , Frank Klemm , Daniel Haase
摘要： A method for the determination and compensation of geometric imaging errors which occur during the imaging of an object by sequential single or multispot scanning by means of a microscopic imaging system, which includes: establishing a reference object with a defined plane structure; and generating an electronic image data set of this structure free of geometric imaging errors. Then, generating at least one electronic actual image data set with the imaging system; comparing the actual image data set with the reference image data set with respect to the locations of those pixels which have the same object point as origin in each case; and determining location deviations in the actual image data set compared to the reference image data set.
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3.发明授权公开(公告)号：US10663749B2
公开(公告)日：2020-05-26
申请号：US14436641
申请日：2013-10-09
发明人： Daniel Schwedt , Tiemo Anhut , Ralf Netz
摘要： An optical assembly that is designed for positioning in a beam path of a light microscope having means for providing structured illuminating light in a sample plane of the light microscope, so that structured illuminating light can be generated in different orientations. The optical assembly has an adjustable deflector in order to deflect an incident light bundle onto one of several beam paths in a selectable manner. Beam splitting devices are located in the beam paths in order to split the light bundle of the respective beam paths into partial light bundles, which are spatially separated from each other. Beam guides are provided for each of the partial light bundles, and guide the partial light bundles to a pupil plane. The beam guides are arranged in such a way that the partial light bundles that belong to the same beam path form a light spot pattern in the pupil plane; and that the light spot patterns of different beam paths in the pupil plane are different from each other.
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4.发明申请公开(公告)号：US20190258041A1
公开(公告)日：2019-08-22
申请号：US16342604
申请日：2017-10-16
发明人： Tiemo Anhut , Matthias Wald , Daniel Schwedt
摘要： The invention relates to an optical group for detection light of a microscope, in particular a confocal scanning microscope, having an input plane (10) for the passage of detection light to be measured and having a detection beam path arranged downstream of the input plane for guiding the detection light (11) into a detection plane (67), wherein the detection beam path has at least one first beam course (1) having first optical beam-guiding means, in particular first lenses and/or mirrors (20, 30, 34, 36, 58, 60, 66), for guiding the detection light into the detection plane. In the first beam course, the optical group has at least one dispersive device (26) for the spatial spectral splitting of the detection light to be measured and a manipulation device (49) for manipulating the spectrally spatially split detection light. The first optical beam-guiding means together with the dispersive device and with the manipulation device are arranged and designed to produce a spectrally separated and diffraction-limited image of the Input plane into the detection plane. The optical group preferably has a second beam course (2) having optical beam-guiding means and has a selection device (22) for selecting the first beam course (1) or the second beam course (2). In further aspects, the invention relates to a method for microscopy and to a microscope.
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公开(公告)号：US10371574B2
公开(公告)日：2019-08-06
申请号：US16170931
申请日：2018-10-25
发明人： David Shafer , Tiemo Anhut , Matthias Wald
IPC分类号： G01J3/28 , G01J3/44 , G01J3/02 , G01J3/14 , G01J3/36 , G02B21/00 , G01N21/64 , G02B27/10 , G02B27/12 , G01J3/18 , G02B21/16 , G02B21/36 , G02B27/00
摘要： A detection device for a microscope comprises a dispersive element in the beam path of light and a selection element. The selection element separates a beam path of a spectral portion of the light from the beam path of the light. The detector device furthermore comprises a focusing optical unit configured to focus the beam path of the spectral portion of the light onto a sensor. By way of example, the microscope may be a confocal microscope.
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公开(公告)号：US10261300B2
公开(公告)日：2019-04-16
申请号：US14390165
申请日：2013-05-16
发明人： Helmut Lippert , Ralf Netz , Tiemo Anhut , Nils Langholz , Matthias Langhorst
IPC分类号： G01B9/02 , G01B9/04 , G01N21/64 , G02B21/00 , G02B21/08 , G02B21/14 , G02B21/18 , G02B21/24 , G02B21/36
摘要： The invention relates to a light microscope comprising a polychromatic light source for emitting illumination light in the direction of a sample, focussing means for focussing illumination light onto the sample, wherein the focussing means, for generating a depth resolution, have a longitudinal chromatic aberration, and a detection device, which comprises a two-dimensional array of detector elements, for detecting sample light coming from the sample. According to the invention, the light microscope is characterized in that, for detecting both confocal portions and non-confocal portions of the sample light, a beam path from the sample to the detection device is free of elements for completely masking out non-confocal portions. In addition, the invention relates to a method for image recording using a light microscope.
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公开(公告)号：US10132685B2
公开(公告)日：2018-11-20
申请号：US15524119
申请日：2015-11-05
发明人： David Shafer , Tiemo Anhut , Matthias Wald
IPC分类号： G01J3/28 , G01J3/44 , G01N21/64 , G01J3/02 , G01J3/14 , G01J3/18 , G02B21/36 , G02B21/16 , G02B27/00
摘要： A detection device for a microscope comprises a dispersive element in the beam path of light and a selection element. The selection element separates a beam path of a spectral portion of the light from the beam path of the light. The detector device furthermore comprises a focusing optical unit configured to focus the beam path of the spectral portion of the light onto a sensor. By way of example, the microscope may be a confocal microscope.
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公开(公告)号：US09594237B2
公开(公告)日：2017-03-14
申请号：US14348564
申请日：2012-09-26
发明人： Daniel Schwedt , Tiemo Anhut , Tobias Kaufhold
CPC分类号： G02B21/002 , G02B21/0024 , G02B21/0036 , G02B21/008
摘要： Disclosed is a method for varying the size of the scanning field of a multifocal laser scanning microscope, said scanning field being scanned in X columns and Y lines, and n laser spots being arranged at a distance d from one another in the scanning field along the slow scanning axis in the sample plane, the distance between the scanned lines in the sample plane being a=d/K, where KεN, the size of the scanning field being varied by varying K. After scanning K lines, a vertical skip is made, e.g. a skip of (n−1)×K+1 lines in the scanning direction or (n+1)×K−1 lines against the scanning direction until at least Y lines have been scanned.
摘要翻译： 公开了一种用于改变多焦点激光扫描显微镜的扫描场的尺寸的方法，所述扫描场被扫描为X列和Y线，并且n个激光点沿扫描场沿彼此间隔距离d布置 样品平面中的慢扫描轴，样品平面中扫描线之间的距离为a = d / K，其中KεN，扫描场的大小通过变化K而变化。扫描K线后，进行垂直跳跃 ，例如 在扫描方向上的（n-1）×K + 1行或扫描方向的（n + 1）×K-1行的跳过直到扫描至少Y行。
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公开(公告)号：US20150116807A1
公开(公告)日：2015-04-30
申请号：US14400167
申请日：2013-05-07
发明人： Tiemo Anhut , Thomas Kalkbrenner , Ralf Netz
CPC分类号： G02B21/0032 , G02B21/0068 , G02B21/0092 , G02B26/06 , G02F1/01
摘要： A microscope, preferably a laser scanning microscope, with at least one illuminating beam, which in a partial area along the cross-section thereof, is phase-modulated with a modulation frequency. A microscope objective is provided for focusing the illumination beam onto a sample. The microscope further has a detection beam path and at least one demodulation means, wherein a pulsed illumination beam is present. In the illumination beam path upstream of the microscope objective, a first polarization beam splitter is provided, which generates at least first and second partial beam paths that have differing, preferably adjustable, optical paths. A combination element, such as a second pole splitter, for rejoining the partial beams is provided. In one partial beam path, a phase element is provided, which has at least two areas having differing phase interferences.
摘要翻译： 具有至少一个照明光束的显微镜，优选地是激光扫描显微镜，其在沿其横截面的部分区域中以调制频率进行相位调制。 提供用于将照明光束聚焦到样品上的显微镜物镜。 显微镜还具有检测光束路径和至少一个解调装置，其中存在脉冲照明光束。 在显微镜物镜上游的照明光束路径中，提供了第一偏振分束器，其产生具有不同的，优选可调节的光路的至少第一和第二部分光束路径。 提供了用于重新连接部分光束的组合元件，例如第二极分离器。 在一个部分光束路径中，提供相位元件，其具有至少两个具有不同相位干涉的区域。
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公开(公告)号：US12001006B2
公开(公告)日：2024-06-04
申请号：US17453079
申请日：2021-11-01
发明人： Tiemo Anhut , Daniel Schwedt
IPC分类号： G02B21/36 , G02B3/00 , G02B21/02 , G02B21/06 , G02B26/10 , G02B27/10 , H04N5/345 , H04N5/378 , H04N13/239 , H04N13/254 , H04N25/443 , H04N25/75 , G06N3/02
CPC分类号： G02B21/365 , G02B3/0037 , G02B21/02 , G02B21/06 , G02B26/10 , G02B27/106 , H04N13/239 , H04N13/254 , H04N25/443 , H04N25/75 , G06N3/02
摘要： A device includes a detection path, along which detection radiation is guided, and a means for splitting the detection radiation between first and second detection paths. A detector has detector elements in each detection path. A microlens array is disposed upstream of each detector in a pupil. The first and second detectors have a substantially identical spatial resolution. The detector elements of the first detector are arranged line by line in a first line direction, while the detector elements of the second detector are arranged line by line in a second line direction. The first and second detectors are arranged relative to the image to be captured such that the first and second line directions are inclined relative to one another. A readout unit for reading out the image data of the detectors is configured for selectively reading those detector elements arranged line by line which form an image line.
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