摘要:
An apparatus for analyzing ions is described. The apparatus includes an ion source, an ion trap positioned to receive ions from the ion source; a time of flight mass analyzer, and a detector operatively coupled to the time of flight. The time of flight mass analyzer includes a pulser region, and the pulser region is positioned to receive ions from the ion trap. The apparatus further includes a scanning delay timing circuit in operable relation to the pulser region. The scanning delay timing circuit is adapted to triggering an extraction pulse at the pulser region. Methods of analyzing ions by mass spectrometry are also described.
摘要:
An apparatus for analyzing ions is described. The apparatus includes an ion source, an ion trap positioned to receive ions from the ion source; a time of flight mass analyzer, and a detector operatively coupled to the time of flight. The time of flight mass analyzer includes a pulser region, and the pulser region is positioned to receive ions from the ion trap. The apparatus further includes a scanning delay timing circuit in operable relation to the pulser region. The scanning delay timing circuit is adapted to triggering an extraction pulse at the pulser region. Methods of analyzing ions by mass spectrometry are also described.
摘要:
A method and apparatus for processing ions in mass spectrometry is provided. The apparatus includes an ion processing cell having segmented multipole rods and a means for admitting reactive reagent ions to the cell. Provision for timed sequence control of RF and DC voltages to the segmented multipole rods is included. Processing includes trapping analyte ions and subjecting them to selected reactions with reactive reagent ions and/or physical manipulation of the ions by changing the characteristics of the electric field and/or creating discrete regions in the field.
摘要:
The invention provides a device for introducing ions into the primary ion path of a mass spectrometry system. In general, the device contains an electrical lens having a primary ion passageway and a secondary ion passageway that merges with the primary ion passageway. In certain embodiments, the electrical lens contains a first part and a second part that, together, form the primary ion passageway. The first part of the lens may contain the secondary ion passageway.
摘要:
In accordance with the invention, auxiliary structures are used in conjunction with a microfluidic chip to form a microfluidic electrospray structure that allows gas assisted nebulization for use in a mass spectrometry system.
摘要:
The invention provides an apparatus for combining ions and charged particles. In general, the apparatus contains: a) a multipole device having an ion exit end; b) a mass analyzer; and c) a source of charged particles. The apparatus is configured so that charged particles produced by the source of charged particles pass through the mass analyzer and into the multipole device via the ion exit end of the multipole device.
摘要:
Mass spectrometry systems and methods are disclosed. Briefly described, one embodiment of the mass spectrometry system, among others, includes a mass spectrometer, a laser generator, and a sample substrate. The mass spectrometer includes a first end and a second end and the laser generator produces a laser radiation beam that travels along a first path. The sample substrate holds a sample at the first end of the mass spectrometer, where the sample produces a plurality of ions that travel along a second path that is substantially parallel the first path but towards the second end of the mass spectrometer.
摘要:
Apparatus and methods are disclosed for manipulating charged particles. The charged particles are directed from a source thereof into a zone. A first electrical potential is generated in the zone. Simultaneously, a second electrical potential is generated outside the zone. The second electrical potential penetrates into the zone and combines with the first electrical potential to form an oscillating electric potential field having predetermined characteristics sufficient to manipulate the charged particles. The manipulating of the charged particles includes, e.g., transporting, collisional cooling, collisional induced dissociating and collisional focusing. In one embodiment an apparatus comprises a hollow first element and a hollow second element. The second element is disposed within the first element. The second element has at least two openings in a wall thereof. The openings are elongated and radially disposed with respect to the axis of the second element. The length of the openings is at least about 20% of the length of the second element The first element and the second element each are adapted independently to receive a voltage to generate within the second element an electric potential having predetermined characteristics. The apparatus and methods of the invention have particular application to the field of mass spectrometry.
摘要:
Devices and systems for reflecting ions are provided. In general, the devices and systems include a plurality of curved lens plates adapted for connection to at least one voltage source and having a passage therein to allow the ions to pass therethrough. The plurality of curved lens plates generates electric fields having elliptic equipotential surfaces that reflect and focus the ions as they pass through the passage. Reflectron time-of-flight (RE-TOF) spectrometers are also provided that include an ion source, ion detector, and such a reflectron as described above. Mass spectrometer systems are provided that comprise an ion source that generates ions and a reflectron TOF spectrometer such as described above.
摘要:
The invention provides an ion extraction pulser. The ion extraction pulser may be used independently or in conjunction with a mass spectrometry system. The mass spectrometry system includes an ion source for producing ions, an ion optics system downstream from the ion source for selecting and directing ions, and a detector down stream from the ion optics system for detecting the ions selected and directed by the ion optics system. The ion optics system includes one or more ion extraction pulsers. The ion extraction pulser includes a mesh plate for applying a pulse for extracting ions from an ion beam; a first filter plate adjacent to the mesh plate for filtering ions extracted by the mesh plate; a guard plate adjacent to the first filter plate for further directing ions filtered by the first filter plate; and a second filter plate adjacent to the first guard plate for further filtering ions directed from the guard plateThe invention also provides methods for extracting, selecting and processing ions using ion extraction pulsers.