METHOD FOR CLEANING TITANIUM ALLOY DEPOSITION
    2.
    发明申请
    METHOD FOR CLEANING TITANIUM ALLOY DEPOSITION 有权
    清洁钛合金沉积的方法

    公开(公告)号:US20150086722A1

    公开(公告)日:2015-03-26

    申请号:US14484423

    申请日:2014-09-12

    Abstract: Embodiments described herein relate to a thermal chlorine gas cleaning process. In one embodiment, a method for cleaning N-Metal film deposition in a processing chamber includes positioning a dummy substrate on a substrate support. The processing chamber is heated to at least about 50 degrees Celsius. The method further includes flowing chlorine gas into the processing chamber and evacuating chlorine gas from the processing chamber. In another embodiment, a method for cleaning titanium aluminide film deposition in a processing chamber includes heating the processing chamber to a temperature between about 70 about degrees Celsius and about 100 degrees Celsius, wherein the processing chamber and the substrate support include one or more fluid channels configured to heat or cool the processing chamber and the substrate support.

    Abstract translation: 本文所述的实施方案涉及热氯气清洗工艺。 在一个实施例中,用于清洁处理室中的N金属膜沉积的方法包括将虚设基板定位在基板支撑件上。 将处理室加热至至少约50摄氏度。 该方法还包括将氯气流入处理室并从处理室排出氯气。 在另一个实施方案中,一种用于清洁处理室中的铝化铝膜沉积的方法包括将处理室加热到约70摄氏度至约100摄氏度之间的温度,其中处理室和衬底支撑体包括一个或多个流体通道 被配置为加热或冷却处理室和基板支撑件。

    NMOS METAL GATE MATERIALS, MANUFACTURING METHODS, AND EQUIPMENT USING CVD AND ALD PROCESSES WITH METAL BASED PRECURSORS
    3.
    发明申请
    NMOS METAL GATE MATERIALS, MANUFACTURING METHODS, AND EQUIPMENT USING CVD AND ALD PROCESSES WITH METAL BASED PRECURSORS 有权
    NMOS金属栅材料,制造方法和使用基于金属的前驱体的CVD和ALD工艺的设备

    公开(公告)号:US20140120712A1

    公开(公告)日:2014-05-01

    申请号:US14147291

    申请日:2014-01-03

    Abstract: Embodiments provide methods for depositing metal-containing materials. The methods include deposition processes that form metal, metal carbide, metal silicide, metal nitride, and metal carbide derivatives by a vapor deposition process, including thermal decomposition, CVD, pulsed-CVD, or ALD. A method for processing a substrate is provided which includes depositing a dielectric material forming a feature definition in the dielectric material, depositing a work function material conformally on the sidewalls and bottom of the feature definition, and depositing a metal gate fill material on the work function material to fill the feature definition, wherein the work function material is deposited by reacting at least one metal-halide precursor having the formula MXY, wherein M is tantalum, hafnium, titanium, and lanthanum, X is a halide selected from the group of fluorine, chlorine, bromine, or iodine, and y is from 3 to 5.

    Abstract translation: 实施例提供了沉积含金属材料的方法。 所述方法包括通过包括热分解,CVD,脉冲CVD或ALD的气相沉积工艺形成金属,金属碳化物,金属硅化物,金属氮化物和金属碳化物衍生物的沉积工艺。 提供了一种用于处理衬底的方法,其包括在电介质材料中形成形成特征定义的电介质材料,将功函数材料保形地沉积在特征定义的侧壁和底部上,以及在工作功能上沉积金属栅极填充材料 用于填充特征定义的材料,其中通过使至少一种具有式MXY的金属卤化物前体与其中M是钽,铪,钛和镧的金属卤化物前体反应沉积功函材料,X是选自氟 ,氯,溴或碘,y为3至5。

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