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公开(公告)号:US20160133504A1
公开(公告)日:2016-05-12
申请号:US14885016
申请日:2015-10-16
Applicant: Applied Materials, Inc.
Inventor: Schubert S. CHU , Kartik SHAH , Anhthu NGO , Karthik RAMANATHAN , Nitin PATHAK , Nyi O. MYO , Paul BRILLHART , Richard O. COLLINS , Kevin Joseph BAUTISTA , Edric TONG , Zhepeng CONG , Anzhong CHANG , Kin Pong LO , Manish HEMKAR
IPC: H01L21/687 , H01L21/67
CPC classification number: H01L21/68735 , C23C16/4583 , H01L21/67115
Abstract: Implementations of the present disclosure generally relate to a susceptor for thermal processing of semiconductor substrates. In one implementation, the susceptor includes a first rim surrounding and coupled to an inner region, and a second rim disposed between the inner rim and the first rim. The second rim includes an angled support surface having a plurality of cut-outs formed therein, and the angled support surface is inclined with respect to a top surface of the inner region.
Abstract translation: 本公开的实施方式一般涉及用于半导体衬底的热处理的基座。 在一个实施方式中,基座包括围绕并联接到内部区域的第一边缘和设置在内边缘和第一边缘之间的第二边缘。 第二边缘包括具有形成在其中的多个切口的成角度的支撑表面,并且成角度的支撑表面相对于内部区域的顶部表面倾斜。
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公开(公告)号:US20240318351A1
公开(公告)日:2024-09-26
申请号:US18733504
申请日:2024-06-04
Applicant: Applied Materials, Inc.
Inventor: Zhiyuan YE , Shu-Kwan LAU , Brian BURROWS , Lori D. WASHINGTON , Herman DINIZ , Martin A. HILKENE , Richard O. COLLINS , Nyi Oo MYO , Manish HEMKAR , Schubert S. CHU
CPC classification number: C30B25/14 , C23C16/4412 , C23C16/455 , C30B25/105 , H01L21/6719 , C30B25/08
Abstract: A method and apparatus for a process chamber for thermal processing is described herein. The process chamber is a dual process chamber and shares a chamber body. The chamber body includes a first and a second set of gas inject passages. The chamber body may also include a first and a second set of exhaust ports. The process chamber may have a shared gas panel and/or a shared exhaust conduit.
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公开(公告)号:US20210324514A1
公开(公告)日:2021-10-21
申请号:US17218892
申请日:2021-03-31
Applicant: Applied Materials, Inc.
Inventor: Zhiyuan YE , Shu-Kwan Danny LAU , Brian H. BURROWS , Lori WASHINGTON , Herman DINIZ , Martin A. HILKENE , Richard O. COLLINS , Nyi O. MYO , Manish HEMKAR , Schubert S. CHU
IPC: C23C16/455 , C23C16/44 , C23C16/458 , C23C16/48 , H01L21/67
Abstract: A method and apparatus for a process chamber for thermal processing is described herein. The process chamber is a dual process chamber and shares a chamber body. The chamber body includes a first and a second set of gas inject passages. The chamber body may also include a first and a second set of exhaust ports. The process chamber may have a shared gas panel and/or a shared exhaust conduit. The process chamber described herein enables for the processing of multiple substrates simultaneously with improved process gas flow and heat distribution.
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