Semiconductor device package and method for manufacturing the same

    公开(公告)号:US11177552B2

    公开(公告)日:2021-11-16

    申请号:US16578092

    申请日:2019-09-20

    发明人: Wen-Long Lu

    摘要: A semiconductor device package includes a dielectric layer and a stacking conductive structure. The dielectric layer includes a first surface. The stacking conductive structure is disposed on the first surface of the dielectric layer. The stacking conductive structure includes a first conductive layer disposed on the first surface of the dielectric layer, and a second conductive layer stacked on the first conductive layer. A first surface roughness of the first surface of the dielectric layer is larger than a second surface roughness of a top surface of the first conductive layer, and the second surface roughness of the top surface of the first conductive layer is larger than a third surface roughness of a top surface of the second conductive layer.

    Semiconductor package structure and a method of manufacturing the same

    公开(公告)号:US10998251B2

    公开(公告)日:2021-05-04

    申请号:US16244991

    申请日:2019-01-10

    发明人: Wen-Long Lu

    摘要: A semiconductor trace structure is provided for carrying a heat source. The semiconductor device package includes a dielectric structure having a first surface configured to receive the heat source and a second surface opposite to the first surface; a cavity defined by the dielectric structure to accommodate a fluid. The cavity includes a first passage portion between the first surface and the second surface. A first area of the first passage portion is closer to the heat source than a second area of the first passage portion, and that the first area is greater than the second area from a top view perspective. A method for manufacturing the semiconductor trace structure is also provided.

    Semiconductor package device
    8.
    发明授权

    公开(公告)号:US10420211B2

    公开(公告)日:2019-09-17

    申请号:US15673235

    申请日:2017-08-09

    发明人: Wen-Long Lu

    摘要: A semiconductor package device includes a passivation layer, a conductive element, a redistribution layer (RDL) and an electronic component. The passivation layer has a first surface and second surface opposite to the first surface. The conductive element is within the passivation layer. The conductive element defines a recess facing the second surface of the passivation layer. The RDL is on the passivation layer and electrically connected with the conductive element. The electronic component is disposed on the RDL and electrically connected with the RDL.