Magnetic holding structures for plasma processing applications

    公开(公告)号:US12020965B2

    公开(公告)日:2024-06-25

    申请号:US17076024

    申请日:2020-10-21

    CPC classification number: H01L21/67709 C23C16/513 H01J37/3266 H01L21/02274

    Abstract: Embodiments of the present disclosure generally relate to semiconductor processing equipment, and more specifically to apparatus, e.g., magnet holding structures, that can be used with magnets during plasma processing of a substrate. In an embodiment, a magnet holding structure for a plasma-enhanced chemical vapor deposition chamber is provided. The magnet holding structure includes a top piece having a plurality of magnet retention members and a bottom piece having a plurality of magnet retention members. The top piece has a first inside edge and a first outside edge, and the bottom piece has a second inside edge and a second outside edge. The magnet holding structure further includes a plurality of casings. Each casing of the plurality of casings is configured to at least partially encapsulate a magnet, and each casing positioned between a magnet retention member of the top piece and a magnet retention member of the bottom piece.

    Recursive Inject Apparatus For Improved Distribution Of Gas
    9.
    发明申请
    Recursive Inject Apparatus For Improved Distribution Of Gas 审中-公开
    递归注入装置改善气体分布

    公开(公告)号:US20160376706A1

    公开(公告)日:2016-12-29

    申请号:US15192159

    申请日:2016-06-24

    Abstract: Apparatus and methods for processing a substrate including an injector unit insert with a plurality of flow paths leading to a first plenum, each of the flow paths providing one or more of substantially the same residence time, length and/or conductance. Injector units including the injector unit inserts have increased flow uniformity.

    Abstract translation: 用于处理衬底的设备和方法,其包括具有通向第一增压室的多个流动路径的喷射器单元插入件,每个流动路径提供基本上相同的停留时间,长度和/或电导的一个或多个。 包括注射器单元插入件的进样器单元具有增加的流动均匀性。

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