公开(公告)号：US20190057863A1

公开(公告)日：2019-02-21

申请号：US16104352

申请日：2018-08-17

Applicant: APPLIED MATERIALS, INC.

Inventor： YIXIONG YANG ,  PAUL F. MA ,  WEI V. TANG ,  WENYU ZHANG ,  SHIH CHUNG CHEN ,  CHEN HAN LIN ,  CHI-CHOU LIN ,  YI XU ,  YU LEI ,  NAOMI YOSHIDA ,  LIN DONG ,  SIDDARTH KRISHNAN

IPC: H01L21/02 ,  H01L29/40 ,  H01L21/28

Abstract: Methods and apparatus for forming a semiconductor structure, including depositing a doping stack having a first surface atop a high-k dielectric layer, wherein the doping stack includes at least one first metal layer having a first surface, at least one second metal layer comprising a first aluminum dopant and a first surface, wherein the second metal layer is atop the first surface of the first metal layer, and at least one third metal layer atop the first surface of the second metal layer; depositing an anneal layer atop the first surface of the doping stack; annealing the structure to diffuse at least the first aluminum dopant into the high-k dielectric layer; removing the anneal layer; and depositing at least one work function layer atop the first surface of the doping stack.