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14 条记录 (耗时 0.012 秒)

    METHOD AND SYSTEM TO COMPENSATE FOR TEMPERATURE AND PRESSURE IN PIEZO RESISTIVE DEVICES
    5.
    发明申请
    METHOD AND SYSTEM TO COMPENSATE FOR TEMPERATURE AND PRESSURE IN PIEZO RESISTIVE DEVICES 有权
    在PIEZO电阻器件中补偿温度和压力的方法和系统

    公开(公告)号：US20120247175A1

    公开(公告)日：2012-10-04

    申请号：US13077963

    申请日：2011-03-31

    申请人： Siddhartha Gopal Krishna ,  Chad S. Dawson ,  Vikram Varma

    发明人： Siddhartha Gopal Krishna ,  Chad S. Dawson ,  Vikram Varma

    IPC分类号： G01L27/00

    CPC分类号： G01L27/005 ,  G01L9/065 ,  G01L27/002

    摘要： A method and system to calibrate temperature and pressure in piezo resistive devices for non-linear sensors having two variables, where a piezo resistive device such as a piezo resistive transducer (PRT) used for example in a pressure sensor system is calibrated to calculate actual/ambient temperature and pressure even though the PRT impedance is unbalanced relative to pressure.

    摘要翻译： 一种用于校准具有两个变量的非线性传感器的压电器件中的温度和压力的方法和系统，其中压电电阻器件例如压力传感器系统中使用的压阻式换能器（PRT）被校准以计算实际/ 环境温度和压力即使PRT阻抗相对于压力不平衡。

    Method of trimming current source using on-chip ADC
    6.
    发明授权
    Method of trimming current source using on-chip ADC 有权
    使用片上ADC调整电流源的方法

    公开(公告)号：US09353017B2

    公开(公告)日：2016-05-31

    申请号：US14307472

    申请日：2014-06-17

    申请人： Siddhartha Gopal Krishna ,  Vikram Varma

    发明人： Siddhartha Gopal Krishna ,  Vikram Varma

    IPC分类号： H03L5/00 ,  C05F3/02 ,  H03M1/12

    CPC分类号： C05F3/02 ,  G05F3/02 ,  H03M1/12 ,  H03M1/48 ,  Y02A40/206 ,  Y02P20/145

    摘要： A method of trimming a current source in an IC includes deriving a reference voltage from an external supply, and developing a measurement voltage across an external reference resistance receiving the current to be trimmed. An on-chip ADC is used to provide corresponding digital reference and digital measurement signals. A digital comparator compares the digital signals and provides a digital trim signal, which is used to adjust the current to be trimmed until the digital measurement signal is equal to the digital reference signal within an acceptable tolerance. Gain and offset errors in the ADC cancel and do not affect the calibration of the trim operation.

    摘要翻译： 在IC中修整电流源的方法包括从外部电源导出参考电压，以及跨接在待修整电流上的外部参考电阻产生测量电压。 片上ADC用于提供相应的数字参考和数字测量信号。 数字比较器比较数字信号并提供数字微调信号，用于调整待修整的电流，直到数字测量信号等于可接受公差内的数字参考信号。 ADC中的增益和偏移误差取消，不影响校正操作的校准。

    Successive approximation analog-to-digital converter with linearity error correction
    7.
    发明授权
    Successive approximation analog-to-digital converter with linearity error correction 有权
    具有线性误差校正的逐次逼近模数转换器

    公开(公告)号：US09071265B1

    公开(公告)日：2015-06-30

    申请号：US14457124

    申请日：2014-08-12

    申请人： Sanjoy K. Dey ,  Vikram Varma

    发明人： Sanjoy K. Dey ,  Vikram Varma

    IPC分类号： H03M1/10 ,  H03M1/14 ,  H03M1/12 ,  H03M1/80 ,  H03M1/06 ,  H03M1/00 ,  H03M7/16

    CPC分类号： H03M1/0695 ,  H03M1/00 ,  H03M1/0607 ,  H03M1/12 ,  H03M1/468 ,  H03M1/804 ,  H03M7/165

    摘要： A SAR ADC includes capacitors, a comparator, and a SAR logic circuit. The capacitors include a first set of capacitors and an error-detection capacitor. The first set of capacitors generates a first set of voltage signals that are compared with a common-mode voltage signal (VCM) by the comparator during a first set of comparison cycles. The comparator generates a first set of control signals that is used by the SAR logic circuit to successively approximate the first set of voltage signals and generate a first set of bits. An error-detection capacitor generates an error-detection signal that is compared with the common-mode voltage signal VCM by the comparator to generate an error-detection control signal. The SAR logic circuit compensate for an error in the first set of bits based the logic state of the error-detection control signal.

    摘要翻译： SAR ADC包括电容，比较器和SAR逻辑电路。 电容器包括第一组电容器和误差检测电容器。 第一组电容器产生第一组电压信号，该电压信号在第一组比较周期期间由比较器与共模电压信号（VCM）进行比较。 比较器产生第一组控制信号，由SAR逻辑电路用来连续近似第一组电压信号并产生第一组位。 误差检测电容器生成与比较器的共模电压信号VCM进行比较以产生检错控制信号的检错信号。 SAR逻辑电路基于错误检测控制信号的逻辑状态来补偿第一组位中的错误。

    INPUT SIGNAL MISMATCH DETECTION CIRCUIT
    8.
    发明申请
    INPUT SIGNAL MISMATCH DETECTION CIRCUIT 有权
    输入信号误差检测电路

    公开(公告)号：US20160236637A1

    公开(公告)日：2016-08-18

    申请号：US14624591

    申请日：2015-02-18

    申请人： SIDDHARTHA GOPAL KRISHNA ,  Russell J. Lynch ,  Vikram Varma

    发明人： SIDDHARTHA GOPAL KRISHNA ,  Russell J. Lynch ,  Vikram Varma

    IPC分类号： B60R21/013 ,  H03K17/94

    CPC分类号： B60R21/01336 ,  B60R21/0173 ,  B60R2021/01129 ,  B60R2021/01177 ,  B60R2021/01286

    摘要： A system for detecting a mismatch between first and second input signals includes first and second analog-to-digital converters, a time-division multiplexing circuit, first and second processors, a time-division de-multiplexing circuit, and a gating circuit. The first processor includes a first sinc filter, a first trimmer, a first infinite impulse response (IIR) filter, and a first high pass filter (HPF). The second processor includes a second sinc filter, a second IIR filter, and a second HPF. A bandwidth of the second IIR filter and the second HPF is greater than a bandwidth of the first IIR filter and the first HPF. A transfer function of the first IIR filter and the first HPF uses floating-point coefficients and a transfer function of the second IIR filter and the second HPF uses coefficients that are an integral power of two.

    摘要翻译： 用于检测第一和第二输入信号之间的失配的系统包括第一和第二模数转换器，时分复用电路，第一和第二处理器，时分解复用电路和选通电路。 第一处理器包括第一正弦滤波器，第一微调器，第一无限脉冲响应（IIR）滤波器和第一高通滤波器（HPF）。 第二处理器包括第二sinc滤波器，第二IIR滤波器和第二HPF。 第二IIR滤波器和第二HPF的带宽大于第一IIR滤波器和第一HPF的带宽。 第一IIR滤波器和第一HPF的传递函数使用浮点系数和第二IIR滤波器的传递函数，并且第二HPF使用作为2的整数倍的系数。

    METHOD OF TRIMMING CURRENT SOURCE USING ON-CHIP ADC
    9.
    发明申请
    METHOD OF TRIMMING CURRENT SOURCE USING ON-CHIP ADC 有权
    使用片上ADC研究电流源的方法

    公开(公告)号：US20150362942A1

    公开(公告)日：2015-12-17

    申请号：US14307472

    申请日：2014-06-17

    申请人： Siddhartha Gopal Krishna ,  Vikram Varma

    发明人： Siddhartha Gopal Krishna ,  Vikram Varma

    IPC分类号： G05F3/02 ,  H03M1/12

    CPC分类号： C05F3/02 ,  G05F3/02 ,  H03M1/12 ,  H03M1/48 ,  Y02A40/206 ,  Y02P20/145

    摘要： A method of trimming a current source in an IC includes deriving a reference voltage from an external supply, and developing a measurement voltage across an external reference resistance receiving the current to be trimmed. An on-chip ADC is used to provide corresponding digital reference and digital measurement signals. A digital comparator compares the digital signals and provides a digital trim signal, which is used to adjust the current to be trimmed until the digital measurement signal is equal to the digital reference signal within an acceptable tolerance. Gain and offset errors in the ADC cancel and do not affect the calibration of the trim operation.

    摘要翻译： 在IC中修整电流源的方法包括从外部电源导出参考电压，以及跨接在待修整电流上的外部参考电阻产生测量电压。 片上ADC用于提供相应的数字参考和数字测量信号。 数字比较器比较数字信号并提供数字微调信号，用于调整要修整的电流，直到数字测量信号等于可接受公差内的数字参考信号。 ADC中的增益和偏移误差取消，不影响校正操作的校准。