摘要:
The voltage variation detection circuit includes: a threshold voltage generation circuit arranged to generate a threshold voltage; a comparator arranged to compare a variation detection-target voltage and the threshold voltage to each other; and a controller arranged to control the threshold voltage generation circuit based on output of the comparator. Repeated are operations of: decreasing the threshold voltage stepwise; when the variation detection-target voltage has come to the threshold voltage or more, first increasing the threshold voltage by specified steps and then again decreasing the threshold voltage stepwise; and when the variation detection-target voltage has come to the threshold voltage or more, increasing the threshold voltage by specified steps. The controller detects a variation of the variation detection-target voltage based on control results at time points when the variation detection-target voltage comes to the threshold voltage or more.
摘要:
An event-driven tracking analog to digital converter (ADC) architecture is proposed. The proposed architecture has less sensitivity to amplifier and DAC non-linearity, reduces the swing and dynamic common-mode range requirement of the operational transconductance amplifier (OTA) and comparators, respectively.
摘要:
A ramp section generates a reference signal. A comparison section compares an analog signal to the reference signal, and terminates a comparison process at a timing at which the reference signal has satisfied a predetermined condition for the analog signal. A main count section performs a count operation and outputs a count value. A latch section latches a second count value at a second timing related to the end of the comparison process corresponding to a second analog signal after latching a first count value at a first timing related to the end of the comparison process corresponding to a first analog signal. A column count section sequentially counts values of bits constituting the second count value retained in the latch section after an initial value has been set on the basis of values of bits constituting the first count value retained in the latch section.
摘要:
A ramp section generates a reference signal. A comparison section compares an analog signal to the reference signal, and terminates a comparison process at a timing at which the reference signal has satisfied a predetermined condition for the analog signal. A main count section performs a count operation and outputs a count value. A latch section latches a second count value at a second timing related to the end of the comparison process corresponding to a second analog signal after latching a first count value at a first timing related to the end of the comparison process corresponding to a first analog signal. A column count section sequentially counts values of bits constituting the second count value retained in the latch section after an initial value has been set on the basis of values of bits constituting the first count value retained in the latch section.
摘要:
Various implementations relating to analog-to-digital converters are provided. A comparator of such a circuit is used for converting different analog input signals, while analog-to-digital conversion circuitry for these conversions is implemented at least partially separately. In other implementations, a comparator is used both for analog-to-digital conversion and for comparing an input signal to a constant or non-constant value.
摘要:
An analogue to digital converter (ADC) is provided which comprises an signal sampling device, a signal comparison device, and a digital signal generator. An analogue signal to be converted to a digital signal is input into the ADC, the signal sampling device produces samples of the analogue signal, the signal comparison device receives the analogue signal and the analogue signal samples, performs a comparison between them and outputs comparison signals, and the digital signal generator receives the comparison signals and uses them to generate a digital signal.The signal sampling device may produce voltage samples or current samples of the analogue signal.
摘要:
A method for converting analog values into digital form comprises comparing a current analog sample value with an analog input value to produce an outcome, generating a count value based on the outcome, the count value increasing upon successive like outcomes and being reset to an initial count value upon successive unlike outcomes, adding or subtracting the count value to/from a current digital sample value to generate a next digital sample value, the adding or subtracting being based on the outcome, and converting the next digital sample value to the current analog sample value.
摘要:
An on die thermal sensor (ODTS) in a memory device includes: a band gap unit for detecting a temperature of the memory device to output a first voltage corresponding to the temperature; and an analog-to-digital converting unit for outputting a digital code having temperature information based on the first voltage, the digital code having varied resolution according to temperature ranges.
摘要:
An analog level meter and a method of measuring an analog signal level may be provided. The analog level meter may include a comparator, a duty counter, an analog level detector and/or a digital to analog converter (DAC). The comparator may compare a voltage level of the analog signal with a reference voltage and generate an up-down signal. The duty counter may count a duty value of the up-down signal. The analog level detector may output a duty error value obtained by subtracting a target duty value from the duty value of the up-down signal. The analog level meter may output the reference voltage as a measured value of the analog signal when the duty error value is a desired or predetermined value.
摘要:
A self-tracking analog-to-digital converter includes a digital-to-analog converter (DAC) adapted to provide a variable reference voltage, a windowed flash analog-to-digital converter (ADC) adapted to provide an error signal ek corresponding to a difference between an input voltage Vi and the variable reference voltage, and digital circuitry adapted to generate suitable control signals for the DAC based on the error signal ek. More particularly, the digital circuitry includes a first digital circuit adapted to provide a first function value f(ek) in response to the error signal ek, the first function value f(ek) representing an amount of correction to be applied to the variable reference voltage. A second digital circuit is adapted to provide a counter that combines the first function value f(ek) with a previous counter state Nk to provide a next counter state Nk+1, the next counter state Nk+1 being applied as an input to the digital-to-analog converter. A third digital circuit is adapted to scale the previous counter state Nk by a factor M and combine the scaled counter state M·Nk with the error signal ek to provide a digital output value Dk representing the input voltage Vi.
摘要翻译:自跟踪模数转换器包括适于提供可变参考电压的数模转换器(DAC),适用于提供误差信号e 。 更具体地说,数字电路包括第一数字电路,其适于响应于误差信号提供第一函数值f(e k k k),第一函数值 f(e,k)表示要应用于可变参考电压的校正量。 第二数字电路适于提供将第一函数值f(e)与前一个计数器状态N N k N组合的计数器,以提供下一个计数器状态N < SUB> k + 1 SUB>,下一个计数器状态N k + 1被作为数字模拟转换器的输入。 第三数字电路适于将先前的计数器状态N&gt; k乘以因子M,并将经缩放的计数器状态MN&lt;&gt;和误差信号e& / SUB>以提供表示输入电压V i i i的数字输出值D 。