摘要:
Input image data is stored in a register matrix of 7.times.7 in a successive manner. A pattern detecting section detects a black- or white-pixel connective pattern of the reference pixels of a marked pixel. When the reference pixel pattern is a black-pixel connective pattern of 1:n (n=1, 2, 3, . . . ), an enlarging/smoothing processor section interpolates a part of the enlarged marked pixel with black pixels. When it is a white-pixel connective pattern of 1:n (n=1, 2, 3, . . . ), the enlarging/smoothing processor erases a part of the enlarged marked pixel. As a result, the oblique line can be smoothed. The line that is made thick by the smoothing process can be shaped into a thin line. Thus, a high-quality image can be produced.
摘要:
Disclosed herein is an antistatic photo-resist containing an antistatic agent. Since antistatic photo-resist according to the present invention is hardly charged, it can be suitably used as a mask in implanting ions into semiconductor substrate.
摘要:
The objective of the present invention is to provide a stretched polyamide film which is excellent in laminatability, lamination strength, mechanical properties and shock resistance property and which has effects to prevent goods being broken and protect a content from vibration and shock at the time of transportation when used a various packaging materials. The present invention relates to a stretched polyamide film, wherein a main constituent is nylon 6; at least one surface layer meets the following conditions (1) and (2); and the stretched polyamide film meets the following condition (3): (1) a relaxation degree of a surface layer orientation measured by IR spectroscopy is within a range of not less than 0.3 and not more than 0.5; (2) a crystallization degree of a surface layer measured by IR spectroscopy is within a range of not less than 1.0 and not more than 1.4; (3) a heat shrinkage rate (%) in TD direction at 160° C. for 10 minutes is within a range of not less than 0.6 and not more than 4.
摘要:
An exhaust gas treatment system treats a mixed gas containing at least hydrogen and monosilane discharged from a semiconductor fabrication equipment. The exhaust gas treatment system includes a pump unit which emits the mixed gas discharged from the semiconductor fabrication equipment, a compressor which compresses the mixed gas emitted by the pump unit and sends the mixed gas to a rear stage, a gas accommodation unit which collects and accommodates the compressed mixed gas, a flow rate control unit which controls a flow rate of the mixed gas supplied from the gas accommodation unit, and a membrane separation unit which causes the hydrogen to selectively permeate therethrough and separates the monosilane and the hydrogen from the mixed gas. Accordingly, the exhaust gas treatment system may be stably operated in a state where a change in pressure of the mixed gas discharged from the semiconductor fabrication equipment is alleviated.
摘要:
A compound of the general formula ##STR1## wherein R.sub.1 is lower alkyl,R.sub.2 is selected from the group consisting of lower alkyl, lower alkenyl and lower alkynyl,A is a formula which is selected from the formula consisting of: ##STR2## where R.sub.3 is selected from the group consisting of hydrogen and lower alkyl,R.sub.4 is selected from the group consisting of lower alkyl and phenyl, andR.sub.3 forms cyclo-alkylene of 4 to 5 carbon atoms by combining with R.sub.4 ; ##STR3## where R.sub.5 and R.sub.7 are selected from the group consisting of hydrogen and lower alkyl andR.sub.6 is lower alkyl; and ##STR4## where R.sub.8 is selected from the group consisting of hydrogen and lower alkyl andR.sub.9 is lower alkyl;Or a metal salt of the compound defined herein above is useful as herbicide.
摘要:
An exhaust gas treatment system treats a mixed gas containing at least hydrogen and monosilane discharged from a semiconductor fabrication equipment. The exhaust gas treatment system includes a pump unit which emits the mixed gas discharged from the semiconductor fabrication equipment, a compressor which compresses the mixed gas emitted by the pump unit and sends the mixed gas to a rear stage, a gas accommodation unit which collects and accommodates the compressed mixed gas, a flow rate control unit which controls a flow rate of the mixed gas supplied from the gas accommodation unit, and a membrane separation unit which causes the hydrogen to selectively permeate therethrough and separates the monosilane and the hydrogen from the mixed gas. Accordingly, the exhaust gas treatment system may be stably operated in a state where a change in pressure of the mixed gas discharged from the semiconductor fabrication equipment is alleviated.
摘要:
An exhaust gas processing apparatus for processing a mixed gas discharged from a semiconductor manufacturing apparatus is provided with: an adsorption separation unit for separating a monosilane gas that requires abatement and a hydrogen gas that does not require abatement by allowing the mixed gas to pass through and then by mainly adsorbing the monosilane gas among a plurality of types of gases contained in the mixed gas; a heating unit for desorbing the monosilane adsorbed onto the adsorption separation unit; a silane gas abatement unit for abating a monosilane gas desorbed from the adsorption separation unit; and a hydrogen gas discharge unit for discharging a hydrogen gas separated from the mixed gas by the adsorption separation unit.
摘要:
Disclosed herein is an antistatic photo-resist containing an antistatic agent. Since antistatic photo-resist according to the present invention is hardly charged, it can be suitably used as a mask in implanting ions into semiconductor substrate.
摘要:
2,3-Dihalogeno-6-trifluoromethylbenzaldehydes of general formula (I) useful as intermediates for the preparation of fungicides for agricultural and horticultural use;a process for the preparation of the same; and process for preparing 2,3-dihalogeno-6-trifluoromethylbenzamidoximes of general formula (IV) from the above compounds, wherein X.sup.1 and X.sup.2 are each independently fluoro, chloro or bromo. ##STR1##
摘要:
The present invention relates to a compound having the formula ##STR1## (wherein R.sub.1 denotes a phenyl radical (which may be substituted by halogen atoms, C.sub.1-6 alkyl radicals, C.sub.1-6 alkoxy radicals (which may be substituted by C.sub.1-6 alkoxy radicals,) C.sub.2-6 alkynyloxy radicals, amino radicals, nitro radicals, phenyl radicals, phenoxy radicals or C.sub.1-6 alkylthio radicals), a five or six membered heterocyclic radical (which may be substituted by halogen atoms or C.sub.1-6 alkyl radicals), a C.sub.1-6 alkyl radical (which may be substituted by aryl radicals) or ##STR2## wherein each or r.sup.1 and r.sup.2 denotes a C.sub.1-6 alkyl radical or a phenyl radical)X denotes oxygen atom or sulfur atom;A denotes ##STR3## B denotes ##STR4## D denotes ##STR5## n, m and l denote 0 or 1, (wherein r.sup.3, r.sup.4, r.sup.6, r.sup.7, r.sup.9 and r.sup.10, respectively, denotes hydrogen atom, halogen atom, C.sub.1-6 alkyl radical, the radical expressed by the formula --Y-- r.sup.12 (wherein r.sup.12 denotes hydrogen atom, cyano radical, C.sub.1-6 alkyl radical (which may be substituted by C.sub.1-6 alkoxycarbonyl radicals,) cycloalkyl radical, C.sub.1-6 alkoxycarbonyl radical, C.sub.1-6 alkylcarbamoyl radical, C.sub.1-6 alkylthiocarbamoyl radical, phenylcarbamoyl radical (which may be substituted by halogen atom), phenylthiocarbamoyl radical (which may be substituted by halogen atoms), or C.sub.1-6 alkylcarbonyl radical (which may be substituted by halogen atoms); Y denotes oxygen atom, sulfur atom, --SO--, --SO.sub.2 --, or the radical expressed by the formula ##STR6## (r.sup.13 : hydrogen atom, C.sub.1-6 alkyl radical)), or oxo-radicals or the radical expressed by the formula NOr.sup.14 where r.sup.3 or r.sup.4 ; r.sup.6 and r.sup.7 or r.sup.9 and r.sup.10 are combined (wherein r.sup.14 denotes hydrogen atom, C.sub.1-6 alkyl radical, C.sub.1-6 alkylcarbonyl radical, or C.sub.1-6 alkylcarbamoyl radical), provided, however, that r.sup.6 may form a double bond in combination with r.sup.3 or r.sup.9 ; k, k' and k" denote 0, 1 or 2, respectively;r.sup.5, r.sup.8 and r.sup.11 each denote hydrogen atom or C.sub.1-6 alkyl radical;When A is ##STR7## however, m denotes 1. Further, A and B, or B and D do not simultaneously denote oxygen atoms or sulfur atoms.)R.sub.2 denotes a phenyl radical (which may be substituted by --Z--r.sup.15 (wherein r.sup.15 denotes hydrogen atom, C.sub.1-6 alkyl radical (which may be substituted by C.sub.1-6 alkoxycarbonyl radicals or halogen atoms), phenyl radicals, cycloalkyl radicals, the pyridyl radicals (which may be substituted by halogen atoms or C.sub.1-6 haloalkyl radicals), C.sub.1-6 alkylcarbamoyl radicals, or C.sub.1-6 alkylcarbonyl radicals; Z denotes oxygen atom, sulfur atom or the radicals expressed by the formula ##STR8## (wherein r.sup.14 denotes hydrogen atom or C.sub.1-6 alkyl radical), C.sub.1-6 alkyl radicals, halogen atoms or nitro radicals), a cycloalkyl radical, a naphthyl radical, a benzthiazolyl radical (which may be substituted by C.sub.1-6 alkoxy radicals or C.sub.1-6 alkylamino radicals or halophenylamino radicals), or a C.sub.1-6 alkyl radical which may be substituted by halogen atoms);its producing processes and an acaricidal composition comprising its compound as active ingredient(s).