摘要:
The present invention relates to a delay-locked loop-based multiphase clock generator that generates a plurality of multiphase clocks from an input clock signal using a voltage controlled delay line including a plurality of dummy cells. The delay-locked loop-based multiphase clock generator includes an anti-harmonic lock circuit that receives an input clock and a reference clock of multiple clocks, determines whether a pulse signal derived from the input clock is within a normal locking range of the reference clock, and outputs a compulsory control signal to compulsorily control an output signal of a phase detector if it is determined that the pulse signal is not within the normal locking range.
摘要:
Various exemplary embodiments of a phase correction circuit are disclosed. In one exemplary embodiment, the phase correction circuit may include a delay unit configured to delay a clock signal by a predetermined delay time and generate a delay clock signal, a delay line configured to delay a data strobe signal by a variable delay time in response to a delay control signal and generate a corrected data strobe signal, a phase detector configured to detect a phase difference between the delay clock signal and the corrected data strobe signal and generate a phase detection signal, and a shift register configured to generate the delay control signal in response to the phase detection signal.
摘要:
A circuit for a semiconductor memory device includes: a filtering control signal generation unit configured to synchronize a seed signal activated in a pre-amble period of a data strobe signal with the data strobe signal and sequentially generate a plurality of filtering control signals in response to the seed signal; and a filtering signal output unit configured to generate a filtering signal for filtering the data strobe signal in response to the plurality of filtering control signals and a plurality of burst length (BL) control signals.
摘要:
A circuit for a semiconductor memory device includes: a filtering control signal generation unit configured to synchronize a seed signal activated in a pre-amble period of a data strobe signal with the data strobe signal and sequentially generate a plurality of filtering control signals in response to the seed signal; and a filtering signal output unit configured to generate a filtering signal for filtering the data strobe signal in response to the plurality of filtering control signals and a plurality of burst length (BL) control signals.
摘要:
The present invention relates to a delay-locked loop-based multiphase clock generator that generates a plurality of multiphase clocks from an input clock signal using a voltage controlled delay line including a plurality of dummy cells. The delay-locked loop-based multiphase clock generator includes an anti-harmonic lock circuit that receives an input clock and a reference clock of multiple clocks, determines whether a pulse signal derived from the input clock is within a normal locking range of the reference clock, and outputs a compulsory control signal to compulsorily control an output signal of a phase detector if it is determined that the pulse signal is not within the normal locking range.
摘要:
A semiconductor memory device includes an internal signal generation unit configured to output a column select signal and a write enable signal in response to an external address, a write circuit unit configured to output internal data corresponding to external data in response to the write enable signal, a core unit configured to store the internal data in response to the column select signal, and an output timing control unit configured to control output timings of the internal signal generation unit and the write circuit unit in response to an external command, an internal synchronization signal, and preamble related information.
摘要:
A semiconductor memory device includes: an internal clock signal generation unit configured to generate an internal clock signal in response to an external clock signal; an internal data strobe signal generation unit configured to generate an internal data strobe signal in response to an external data strobe signal; a phase comparison unit configured to compare phases of the internal clock signal and the internal data strobe signal that are used in an enabled write path in response to an internal dummy write command with each other; and an output unit configured to output an output signal of the phase comparison unit.
摘要:
A semiconductor memory device includes an internal signal generation unit configured to output a column select signal and a write enable signal in response to an external address, a write circuit unit configured to output internal data corresponding to external data in response to the write enable signal, a core unit configured to store the internal data in response to the column select signal, and an output timing control unit configured to control output timings of the internal signal generation unit and the write circuit unit in response to an external command, an internal synchronization signal, and preamble related information.
摘要:
Various exemplary embodiments of a phase correction circuit are disclosed. In one exemplary embodiment, the phase correction circuit may include a delay unit configured to delay a clock signal by a predetermined delay time and generate a delay clock signal, a delay line configured to delay a data strobe signal by a variable delay time in response to a delay control signal and generate a corrected data strobe signal, a phase detector configured to detect a phase difference between the delay clock signal and the corrected data strobe signal and generate a phase detection signal, and a shift register configured to generate the delay control signal in response to the phase detection signal.
摘要:
A semiconductor memory device includes: an internal clock signal generation unit configured to generate an internal clock signal in response to an external clock signal; an internal data strobe signal generation unit configured to generate an internal data strobe signal in response to an external data strobe signal; a phase comparison unit configured to compare phases of the internal clock signal and the internal data strobe signal that are used in an enabled write path in response to an internal dummy write command with each other; and an output unit configured to output an output signal of the phase comparison unit.