Abstract:
A method and apparatus are disclosed for reducing variation in a spot size of an electron beam at a target due to multipole aberrations in an electron beam tomography (EBT) scanner. A magnitude of a DC voltage applied to a positive ion electrode (PIE) within the EBT scanner is adjusted and an orientation of a non-circular aperture of the PIE is aligned with respect to the electron beam. A profile of the spot size is monitored while adjusting the magnitude of the DC voltage and while aligning the orientation of the non-circular aperture of the PIE until the variation in the spot size is sufficiently reduced.
Abstract:
A scanning electron beam CT system generates an electron beam along a beam source axis offset from the scanner axis, or axis of symmetry, thereby permitting the X-ray subject to pass completely through the stationary gantry. The electron beam is produced with the first drift tube region of an evacuated housing chamber, and is directed downstream toward a second region that includes a gantry. A scan target and a tuning target, each concentric with and defining a plane normal to the system axis of symmetry, are located in the gantry. A beam optics system, through which the electron beam passes, is located within the housing intermediate the electron gun and gantry. A control system focusses and scans the electron beam upon the scan target, maintaining a beam spot of desired quality. Upon impingement by the scanning beam spot, the scan target emits a fan beam of X-rays. A detector array, concentric with and defining a plane normal to the system axis of symmetry, is located opposite the scan target within the gantry and provides output signals that are computer processed to reconstruct a CT image of a subject placed within the gantry. The scanner axis is preferably above the beam source axis, and preferably the drift tube is straight, defining a drift tube axis that is inclined relative to the scanner axis, or is parallel to the scanner axis but not co-axial therewith. Alternatively, the drift tube may be kinked.
Abstract:
In a scanning electron beam CT system, the electron beam is focused by controlling the distribution of beam-generated ions electrostatically. The upstream (self-expanding, de-focusing) beam region and downstream (converging, self-focusing) beam region are distinguished by the absence or presence of beam-generated positive ions. The relative lengths of these two beam regions are electrostatically controlled such that beam de-focusing in the upstream region compensates for beam self-focusing in the downstream region. In this fashion, essentially zero external focusing strength is required, and the magnetic focus coil used in the prior art is eliminated. Located downstream from the electron gun, a positive ion electrode ("PIE") determines the position of the boundary between the two regions, and thus the relative length of each region. The PIE is a disk-like electrode, mounted coaxially to the beam optic axis within the drift tube, and coupled to a large positive potential. Varying the PIE potential varies the inter-region boundary position, and thus the relative magnitudes of the beam de-focusing and self-focusing effects. A PIE focus potential is determined by varying the potential while examining the output of electron beam monitors with an oscilloscope. Further, by dynamically varying the PIE potential, the present invention adjusts electron beam focusing, even during a scan. Positive ions are removed from the upstream region by a periodic ion clearing electrode ("PICE") whose high rate of change of axial potential creates alternating axial fields that rapidly sweep away ions.
Abstract:
A scanning electron beam computed tomography scanner is disclosed herein and includes means defining a vacuum chamber, means for producing an electron beam at one location in the chamber and for directing it to a second location therein, a target located at a third position therein of the type which produces X-rays as a result of the impingement thereon by the electron beam, means for focusing the beam onto the target in the form of a beam spot and for scanning the beam spot across the target along a particular scan path in order to produce X-rays, and means for monitoring the profile, position, and orientation of the beam spot at a plurality of locations along the scan path. The specific scanner disclosed also includes an arrangement for determining from the signals produced by the monitoring devices if the beam spot conforms to as desired profile, position, and orientation and automatically adjusting the electron beam such that its profile, position, and orientation conform to desired values.
Abstract:
X-ray tube includes a rotatable envelope in which is mounted an electron gun at one end and a target anode at the other end. A fixed means for deflecting the electron beam from the electron gun is provided to deflect the electron beam on a fixed path as the envelope of the x-ray tube rotates about an axis. The electron beam being confined to a fixed path results in the electron beam striking various positions of the target anode to provide for improved heat dissipation. The electron beam is deflected along the fixed path using magnetic deflection means including magnetic deflection coils positioned external of the envelope to provide a deflection field transverse to the electron beam. The target anode is cooled by directing a cooling fluid on an external side of the target anode.
Abstract:
A scanning beam computed tomography scanner is disclosed herein and includes means defining a vacuum chamber, means for producing an electron beam at one location in the chamber and for directing it to a second location therein, a target of the type which produces X-rays as a result of the impingement thereon by the electron beam, and means for focusing the beam onto the target in the form of a beam spot and for scanning the beam spot across the target along a particular scan path in order to produce X-rays. The specific scanner disclosed also includes an arrangement for monitoring the profile, position and orientation of the beam spot at a plurality of different points along the scan path.
Abstract:
An electron beam production and control assembly especially suitable for use in producing X-rays in a computed tomography (CT) X-ray scanning system is disclosed herein along with its method of operation. This assembly produces its electron beam within a vacuum-sealed housing chamber which is evacuated of internal gases, except inevitably for small amounts of residual gas. The electron beam is produced by suitable means within the chamber and directed along a path therethrough from the chamber's rearwardmost end to its forwardmost end whereby to impinge on a suitable target for producing the necessary X-rays. Since there is residual gas within the chamber, the electrons of the beam will interact with it and thereby produce positive ions which have the effect of neutralizing the space charge of the electron beam. However, there are a number of different arrangements disclosed herein which form part of the overall assembly for acting on these ions and reducing the neutralizing effect they would otherwise have on the beam.
Abstract:
An electron beam scanning system employing a relatively short housing chamber wherein an electron beam is produced includes an ion controlling electrode assembly. Located in the housing between the electron gun and system beam optics, the assembly includes a generally cone-shaped rotating field ion controlling electrode (or "RICE") unit comprising cylindrically symmetrical element pairs disposed on opposite sides of the housing Z-axis. Preferably equal and opposite potential sources coupled to elements comprising an element pair create a transverse electric field therebetween. The vector sum of the fields produced by all element pairs is the transverse field created by the RICE unit. The potentials are varied, rotating the overall RICE field to controllably remove most but not all positive ions. The remaining ions improve the electron beam space-charge density, resulting in a sharply focused scanning electron beam. Preferably a disk-like positive ion electrode (or "PIE") unit coupled to a large positive potential is disposed downstream from the RICE unit to block upstream migration of positive ions. Where discontinuities are present in the housing, a periodic axial field ion controlling electrode (or "PICE") unit is disposed at the upstream end of the overall assembly. The PICE comprises spaced-apart disks alternately coupled to large and small potentials to create alternating axial fields within a short axial distance, to rapidly sweep away ions. Regions within the overall assembly not otherwise acted upon by fields are covered with one or more conventional ICE units to sweep away positive ions.
Abstract:
An improved ion clearing electrode assembly for use in an electron beam production and control assembly which is especially suitable for use in a scanning electron beam computed tomography X-ray scanning system. The assembly uses a vacuum sealed housing chamber which is evacuated of internal gases and in which the electron beam is generated and propagated. Normally residual gas within the chamber interacts with the electrons of the beam to produce positive ions which have the affect of neutralizing the space charge of the electron beam and thereby causing focusing difficulties and destabilization of the beam. The ion collecting electrodes herein are an improvement of those disclosed in the co-pending Rand U.S. patent application Ser. No. 434,252, now U.S. Pat. No. 4,521,900. The electrodes are designed to extract the ions and reduce their neutralizing effect while maintaining a precisely uniform electric field and therefore beam optical aberrations are minimized. In addition, the electrode provides flexibility in the variation of parameters which effect ion extraction and the neutralization fraction.
Abstract:
An electron beam production and control assembly includes a vacuum chamber, a beam source, and a target. The target has an active section and an inactive section. The active section is adapted to generate x-rays when the beam impinges on the x-ray producing section. The electron beam production and control assembly also includes a focusing unit positioned along the chamber at a location intermediate the rearward end and the forward end. The focusing unit directs the beam towards the target in a converging manner to impinge on the target. The focusing unit sweeps the beam along a scanning path over the active section of the target. The focusing unit moves the beam to a retrace path on the inactive section of the target between sweeps of the scanning path to maintain ion accumulation in the beam between sweeps over the active section.