Surface inspection by scattered light detection using dithered illumination spot
    1.
    发明申请
    Surface inspection by scattered light detection using dithered illumination spot 审中-公开
    通过散射光检测表面检查使用抖动照明点

    公开(公告)号:US20070247617A1

    公开(公告)日:2007-10-25

    申请号:US11788027

    申请日:2007-04-18

    IPC分类号: G01N21/88

    CPC分类号: G01N21/9506

    摘要: An apparatus for detecting defects on a disk surface includes a light source that generates a light beam and an acoustic-optic deflector that continuously dithers the light beam transmitted by the light source back and forth, producing a dithered output beam. The apparatus also includes at least one lens that forms a scan line on a disk surface from the dithered output beam with the scan line generating multiple scans and a detector that detects scattered light from defects on the disk surface passing through the dithered output beam of the scan line.

    摘要翻译: 用于检测盘表面上的缺陷的装置包括产生光束的光源和使来自光源的光束前后连续地抖动的声光偏转器,产生抖动输出光束。 该装置还包括至少一个透镜,其在来自抖动输出光束的盘表面上形成扫描线,扫描线产生多次扫描;以及检测器,其检测来自盘表面上的缺陷的散射光,穿过该光盘的抖动输出光束 扫描线。