摘要:
The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(λ), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(λ) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm−1. According to the method of the invention, partial correction functions Fi(λ) are generated by forming the quotient of the measured fluorescence spectra Ji(λ) and the corresponding corrected fluorescence spectra Ii(λ), which are then combined to form a total correction function F(λ) for a broad spectral range. The combination factors αi are hereby computed by statistical averaging of consecutive partial correction functions Fi(λ) over only a predefined, limited overlap region λi/i+1±ΔλOL about the mutual crossover wavelength λi/i+1.
摘要翻译:本发明涉及用于校准光致发光测量系统,特别是荧光测量系统的方法和试剂盒。 该试剂盒包括许多荧光标准品I及其校准和认证的荧光光谱Ii(λ),从而选择荧光标准品,以使其光谱校正的荧光光谱Ii(λ)覆盖高强度的宽光谱范围。 标准的特征在于它们的至少1400cm-1的带的宽半宽度FWHMi。 根据本发明的方法,通过形成测量的荧光光谱Ji(λ)和对应的校正荧光光谱Ii(λ)的商产生部分校正函数Fi(λ),然后将其组合以形成总校正 函数F(λ)用于宽光谱范围。 因此,通过仅关于相互交叉波长λi/ i + 1的预定义的有限重叠区域λi/ i + 1±&Dgr;λOL的连续部分校正函数Fi(λ)的统计平均来计算组合因子αi。
摘要:
The invention discloses a standard for referencing luminescence signals, having an optically transparent base material comprising a lanthanum phosphate glass, a fluorophosphate glass, a fluor-crown glass, a lanthanum glass, a glass-ceramic formed therefrom or a lithium aluminosilicate glass-ceramic, the base material including a bulk doping with at least one constituent which is luminescent and comprises at least one rare earth and/or a nonferrous metal, in particular cobalt, chromium or manganese.
摘要:
The invention relates to a calibration system (10) for characterizing luminescence measurement systems, in particular spectrally resolving, wide-field and/or confocal imaging systems, with (a) a baseplate (12) with at least one flow-through channel (18), wherein the at least one channel (18) is formed as a sample chamber for the luminescence measurement system, (b) at least one reservoir (20) in communication with the at least one channel (18) and adapted to receive a liquid, and (c) at least one focusing device (24) integrated into a baseplate (12) for setting a defined measurement beam focus of the luminescence measurement system to be calibrated by using a focusing surface (26).
摘要:
A calibration system characterizes luminescence measurement systems, in particular spectrally resolving, wide-field and/or confocal imaging systems. The calibration system has a baseplate with at least one flow-through channel, wherein the at least one channel is formed as a sample chamber for the luminescence measurement system, at least one reservoir in communication with the at least one channel and adapted to receive a liquid, and at least one focusing device integrated into a baseplate for setting a defined measurement beam focus of the luminescence measurement system to be calibrated by using a focusing surface.
摘要:
The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(λ), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(λ) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm−1. According to the method of the invention, partial correction functions Fi(λ) are generated by forming the quotient of the measured fluorescence spectra Ji(λ) and the corresponding corrected fluorescence spectra Ii(λ), which are then combined to form a total correction function F(λ) for a broad spectral range. The combination factors αi are hereby computed by statistical averaging of consecutive partial correction functions Fi(λ) over only a predefined, limited overlap region λi/i+1±ΔλOL about the mutual crossover wavelength λi/i+1.
摘要翻译:本发明涉及用于校准光致发光测量系统,特别是荧光测量系统的方法和试剂盒。 该试剂盒包括许多荧光标准品I及其校准和认证的荧光光谱Ii(λ),从而选择荧光标准品,以使其光谱校正的荧光光谱Ii(λ)覆盖高强度的宽光谱范围。 标准的特征在于它们的至少1400cm-1的带的宽半宽度FWHMi。 根据本发明的方法,通过形成测量的荧光光谱Ji(λ)和对应的校正荧光光谱Ii(λ)的商产生部分校正函数Fi(λ),然后将其组合以形成总校正 函数F(λ)用于宽光谱范围。 因此,通过仅关于相互交叉波长λi/ i + 1的预定义的有限重叠区域λi/ i + 1±&Dgr;λOL的连续部分校正函数Fi(λ)的统计平均来计算组合因子αi。
摘要:
The invention relates to an optical standard (10) for the calibration or characterization of optical measuring devices and as a reference system for intensities and intensity measurements. The standard (10) according to the invention, constructed sandwich-like, comprises a combination of at least two layer-like optical standard modules (12) having defined optical properties, joinable or joined together plane-parallel, wherein the standard modules (12) in each instance differ from each other by at least one optical property, namely, by their absorption, emission, scatter and/or reflection properties, and the standard modules (12) are made so that they enter into physical interaction with electromagnetic radiation striking one of their two principal surfaces (12.1).
摘要:
The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(λ), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(λ) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm−1. According to the method of the invention, partial correction functions Fi(λ) are generated by forming the quotient of the measured fluorescence spectra Ji(λ) and the corresponding corrected fluorescence spectra Ii(λ), which are then combined to form a total correction function F(λ) for a broad spectral range. The combination factors αi are hereby computed by statistical averaging of consecutive partial correction functions Fi(λ) over only a predefined, limited overlap region λi/i+1±ΔλOL about the mutual crossover wavelength λi/i+1.
摘要翻译:本发明涉及用于校准光致发光测量系统,特别是荧光测量系统的方法和试剂盒。 该试剂盒包括许多荧光标准品I及其校准和认证的荧光光谱Ii(λ),从而选择荧光标准品,以使其光谱校正的荧光光谱Ii(λ)覆盖高强度的宽光谱范围。 标准的特征在于它们的至少1400cm-1的带的宽半宽度FWHMi。 根据本发明的方法,通过形成测量的荧光光谱Ji(λ)和对应的校正荧光光谱Ii(λ)的商产生部分校正函数Fi(λ),然后将其组合以形成总校正 函数F(λ)用于宽光谱范围。 因此,通过仅关于相互交叉波长λi/ i + 1的预定义的有限重叠区域λi/ i + 1±&Dgr;λOL的连续部分校正函数Fi(λ)的统计平均来计算组合因子αi。
摘要:
The present invention provides compositions comprising peptidyl inhibitors of CD40L-dependent signaling that are not derived from a natural binding partner of CD40L such as CD40, or from a native CD40-CD40L interface. More particularly, the peptidyl inhibitors of the present invention are derived from natural sources that do not express CD40-Cd40L costimulatory pathways. The invention also provides synthetic derivatives and analogs of the peptidyl inhibitors having enhanced binding affinity for CD40L or enhanced inhibitory activity relative to their parent molecules.
摘要:
The invention relates to an optical standard (10) for the calibration or characterization of optical measuring devices and as a reference system for intensities and intensity measurements. The standard (10) according to the invention, constructed sandwich-like, comprises a combination of at least two layer-like optical standard modules (12) having defined optical properties, joinable or joined together plane-parallel, wherein the standard modules (12) in each instance differ from each other by at least one optical property, namely, by their absorption, emission, scatter and/or reflection properties, and the standard modules (12) are made so that they enter into physical interaction with electromagnetic radiation striking one of their two principal surfaces (12.1).
摘要:
The invention relates to a multi-functional calibration system (10) for characterizing luminescence measurement systems, in particular spectrally resolving, wide-field and/or confocal imaging systems, with (a) a baseplate (12), (b) at least one calibration module (24) arranged on the baseplate (12) and including at least one calibration and/or characterization function, and (c) at least one focusing device (20) integrated in the baseplate (12) with a focusing surface (22) for setting a defined measurement beam focus of the luminescence measurement systems to be calibrated, the focusing surface (22) arranged in a common plane with the at least one calibration module (24).