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11 条记录 (耗时 0.015 秒)

    Self cleaning slotted electrical contact device for semiconductor contacts
    2.
    发明授权
    Self cleaning slotted electrical contact device for semiconductor contacts 有权

    公开(公告)号：US10027047B1

    公开(公告)日：2018-07-17

    申请号：US15651001

    申请日：2017-07-17

    申请人： Jose E. Lopez

    发明人： Jose E. Lopez

    IPC分类号： H01R12/91 ,  H01R12/71 ,  H01R13/24 ,  H01L23/482

    摘要： An electrical contact device having a housing with a square or rectangular hole formed within first and second crossing channels that extends laterally from the hole. A conductive first contact element fits into the hole, while a second contact element fits onto the top opening of the first contact element. The primary and secondary contact elements have flange protrusions that overlap. In addition, the second contact element has a tail with an oblique surface facing the top of a compliant uniform rod and the proximate primary or secondary protrusion of the first contact element. A compliant rod is positioned between the first contact element's primary and secondary protrusions, such that when the first contact element is positioned over a fixed surface and the second contact element is pushed downward when an inward force is applied, the second contact element's external contact surface slides laterally.

    NUCLEAR FUSION USING ELECTROSTATIC CAGE AND ELECTRO-MAGNETIC FIELD
    3.
    发明申请
    NUCLEAR FUSION USING ELECTROSTATIC CAGE AND ELECTRO-MAGNETIC FIELD 审中-公开
    使用静电笼和电磁场的核熔断

    公开(公告)号：US20110274228A1

    公开(公告)日：2011-11-10

    申请号：US12773732

    申请日：2010-05-04

    申请人： Jose E. LOPEZ

    发明人： Jose E. LOPEZ

    IPC分类号： G21B1/00

    CPC分类号： G21B3/00 ,  Y02E30/18

    摘要： An apparatus for generating power includes a cage having a plurality of elongated elements defining a space within the cage, wherein the space has a region for allowing ion collision to occur, and a pair of electromagnets located at or near respective opposite ends of the cage. An apparatus for generating power includes a vacuum chamber, a first solenoid, a second solenoid, wherein the first and the second solenoids are located on opposite sides of the vacuum chamber, and a coupler that mechanically couples the first solenoid to the second solenoid, wherein the coupler has an end defining an opening that resembles a dumbbell shape.

    摘要翻译： 一种用于产生动力的装置包括具有限定笼内的空间的多个细长元件的保持架，其中该空间具有用于允许发生离子碰撞的区域，以及一对电磁铁，位于该保持架的相对的相对端处或附近。 一种用于产生动力的装置包括一个真空室，一个第一螺线管和一个第二螺线管，其中第一和第二螺线管位于真空室的相对两侧，以及耦合器，其将第一螺线管与第二螺线管机械连接，其中 耦合器具有限定类似哑铃形状的开口的端部。

    Test socket
    4.
    发明授权
    Test socket 有权
    测试插座

    公开(公告)号：US07722361B2

    公开(公告)日：2010-05-25

    申请号：US12264008

    申请日：2008-11-03

    申请人： Jose E. Lopez ,  Dennis B. Shell ,  Mathew L. Gilk

    发明人： Jose E. Lopez ,  Dennis B. Shell ,  Mathew L. Gilk

    IPC分类号： H01R12/00

    CPC分类号： G01R1/0466

    摘要： An improved test socket for use in testing integrated circuits. The test socket includes a housing having one or more slots formed therein. Contacts can be received within respective slots and maintained therein with rear ends of the contacts in engagement with traces on a load board. Mounting is accomplished by means of a pair of elastomers, and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.

    摘要翻译： 用于测试集成电路的改进的测试插座。 测试插座包括其中形成有一个或多个槽的壳体。 触头可以在相应的插槽内容纳并保持在其中，触头的后端与负载板上的迹线接合。 通过一对弹性体实现安装，并且弹性体保持每个触点，使得当接触件的前端被被测试装置的引线或焊盘接合并被推入其相应的槽时，弓形表面 每个接触件的后端在其对应的轨迹上滚动，实际上没有平移或旋转滑动。

    TEST SOCKET
    5.
    发明申请
    TEST SOCKET 有权
    测试插座

    公开(公告)号：US20090053912A1

    公开(公告)日：2009-02-26

    申请号：US12264008

    申请日：2008-11-03

    申请人： Jose E. Lopez ,  Dennis B. Shell ,  Mathew L. Gilk

    发明人： Jose E. Lopez ,  Dennis B. Shell ,  Mathew L. Gilk

    IPC分类号： H01R12/00

    CPC分类号： G01R1/0466

    摘要： An improved test socket for use in testing integrated circuits. The test socket includes a housing having one or more slots formed therein. Contacts can be received within respective slots and maintained therein with rear ends of the contacts in engagement with traces on a load board. Mounting is accomplished by means of a pair of elastomers, and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.

    摘要翻译： 用于测试集成电路的改进的测试插座。 测试插座包括其中形成有一个或多个槽的壳体。 触头可以在相应的插槽内容纳并保持在其中，触头的后端与负载板上的迹线接合。 通过一对弹性体实现安装，并且弹性体保持每个触点，使得当接触件的前端被被测试装置的引线或焊盘接合并被推入其相应的槽时，弓形表面 每个接触件的后端在其对应的轨迹上滚动，实际上没有平移或旋转滑动。

    Self cleaning Vertical sliding Electrical Contact Device for Semiconductor contacts
    6.
    发明申请
    Self cleaning Vertical sliding Electrical Contact Device for Semiconductor contacts 审中-公开

    公开(公告)号：US20190018060A1

    公开(公告)日：2019-01-17

    申请号：US16035571

    申请日：2018-07-13

    申请人： Jose E. Lopez

    发明人： Jose E. Lopez

    IPC分类号： G01R31/28 ,  G01R31/27

    摘要： The electrical contact device has an insulative, compliant element with a first surface that is next to the load board and has a cavity from the first to the second surface. At the top of the compliant element is an insulative compliant sheet with a hole that aligns with the cavity. At the bottom of the compliant element is an insulative compliant plate with a hole that aligns with the cavity. A first contact element inserts into the compliant plate hole and forming the bottom of the cavity of the compliant element and having a primary protrusion with an oblique surface that faces both the wider cavity opening. A second contact element fits into the hole of the compliant sheet and having a primary protrusion with an oblique surface that mates onto and substantially parallel to the first contact element's oblique surface.

    Electronic device test set and contact used therein
    7.
    发明授权
    Electronic device test set and contact used therein 有权
    其中使用的电子设备测试装置和触点

    公开(公告)号：US07639026B2

    公开(公告)日：2009-12-29

    申请号：US11677870

    申请日：2007-02-22

    申请人： Dennis B. Shell ,  Mathew L. Gilk ,  Jose E. Lopez

    发明人： Dennis B. Shell ,  Mathew L. Gilk ,  Jose E. Lopez

    IPC分类号： G01R31/02 ,  H01R11/18

    CPC分类号： G01R1/0466

    摘要： A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the contact is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested.

    摘要翻译： 用于可安装到测试仪装置的负载板的测试装置中的触点。 用于将被测试设备的至少一个引线与负载板上的对应金属迹线电连接的接触件具有限定多个接触点的第一端。 当接触件围绕大致垂直于由接触件限定的平面的轴线旋转时，连续的接触点依次被被测试设备的引线接合。

    Self cleaning Rocking Electrical Contact Device for Semiconductor contacts
    8.
    发明申请
    Self cleaning Rocking Electrical Contact Device for Semiconductor contacts 审中-公开

    公开(公告)号：US20190019640A1

    公开(公告)日：2019-01-17

    申请号：US16035303

    申请日：2018-07-13

    申请人： Jose E. Lopez

    发明人： Jose E. Lopez

    IPC分类号： H01H23/12 ,  H01H1/18

    摘要： An electrical contact device has a housing with a vertical cavity and a horizontal cavity. A first contact element with a base that fits into the bottom of the vertical cavity of the housing, having a vertical primary protrusion from the end of the base, and having another vertical secondary protrusion from the other end of the base. The end of the secondary protrusion has a tertiary horizontal protrusion. The second contact element fits into the vertical cavity of the housing. The end of second contact element has a nub that inserts into a matching indentation under the tertiary protrusion of the first contact element, and acts as a retention feature. The other end of the second element is a vertical primary protrusion making contact with a device. A compliant element is positioned within the horizontal cavity of the housing and bracketed by the first contact element.

    Test socket
    10.
    发明授权
    Test socket 有权
    测试插座

    公开(公告)号：US07445465B2

    公开(公告)日：2008-11-04

    申请号：US11482644

    申请日：2006-07-07

    申请人： Jose E. Lopez ,  Dennis B. Shell ,  Mathew L. Gilk

    发明人： Jose E. Lopez ,  Dennis B. Shell ,  Mathew L. Gilk

    IPC分类号： H01R12/00

    CPC分类号： G01R1/0466

    摘要： An improved test socket for use in testing integrated circuits. The test socket includes a housing having one or more slots formed therein. Contacts can be received within respective slots and maintained therein with rear ends of the contacts in engagement with traces on a load board. Mounting is accomplished by means of a pair of elastomers, and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.

    摘要翻译： 用于测试集成电路的改进的测试插座。 测试插座包括其中形成有一个或多个槽的壳体。 触头可以在相应的插槽内容纳并保持在其中，触头的后端与负载板上的迹线接合。 通过一对弹性体实现安装，并且弹性体保持每个触点，使得当接触件的前端被被测试装置的引线或焊盘接合并被推入其相应的槽时，弓形表面 每个接触件的后端在其对应的轨迹上滚动，实际上没有平移或旋转滑动。