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公开(公告)号：US07445465B2
公开(公告)日：2008-11-04
申请号：US11482644
申请日：2006-07-07
申请人： Jose E. Lopez , Dennis B. Shell , Mathew L. Gilk
发明人： Jose E. Lopez , Dennis B. Shell , Mathew L. Gilk
IPC分类号： H01R12/00
CPC分类号： G01R1/0466
摘要： An improved test socket for use in testing integrated circuits. The test socket includes a housing having one or more slots formed therein. Contacts can be received within respective slots and maintained therein with rear ends of the contacts in engagement with traces on a load board. Mounting is accomplished by means of a pair of elastomers, and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.
摘要翻译： 用于测试集成电路的改进的测试插座。 测试插座包括其中形成有一个或多个槽的壳体。 触头可以在相应的插槽内容纳并保持在其中，触头的后端与负载板上的迹线接合。 通过一对弹性体实现安装，并且弹性体保持每个触点，使得当接触件的前端被被测试装置的引线或焊盘接合并被推入其相应的槽时，弓形表面 每个接触件的后端在其对应的轨迹上滚动，实际上没有平移或旋转滑动。
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公开(公告)号：US07639026B2
公开(公告)日：2009-12-29
申请号：US11677870
申请日：2007-02-22
申请人： Dennis B. Shell , Mathew L. Gilk , Jose E. Lopez
发明人： Dennis B. Shell , Mathew L. Gilk , Jose E. Lopez
CPC分类号： G01R1/0466
摘要： A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the contact is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested.
摘要翻译： 用于可安装到测试仪装置的负载板的测试装置中的触点。 用于将被测试设备的至少一个引线与负载板上的对应金属迹线电连接的接触件具有限定多个接触点的第一端。 当接触件围绕大致垂直于由接触件限定的平面的轴线旋转时，连续的接触点依次被被测试设备的引线接合。
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公开(公告)号：US07722361B2
公开(公告)日：2010-05-25
申请号：US12264008
申请日：2008-11-03
申请人： Jose E. Lopez , Dennis B. Shell , Mathew L. Gilk
发明人： Jose E. Lopez , Dennis B. Shell , Mathew L. Gilk
IPC分类号： H01R12/00
CPC分类号： G01R1/0466
摘要： An improved test socket for use in testing integrated circuits. The test socket includes a housing having one or more slots formed therein. Contacts can be received within respective slots and maintained therein with rear ends of the contacts in engagement with traces on a load board. Mounting is accomplished by means of a pair of elastomers, and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.
摘要翻译： 用于测试集成电路的改进的测试插座。 测试插座包括其中形成有一个或多个槽的壳体。 触头可以在相应的插槽内容纳并保持在其中，触头的后端与负载板上的迹线接合。 通过一对弹性体实现安装，并且弹性体保持每个触点，使得当接触件的前端被被测试装置的引线或焊盘接合并被推入其相应的槽时，弓形表面 每个接触件的后端在其对应的轨迹上滚动，实际上没有平移或旋转滑动。
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公开(公告)号：US20090053912A1
公开(公告)日：2009-02-26
申请号：US12264008
申请日：2008-11-03
申请人： Jose E. Lopez , Dennis B. Shell , Mathew L. Gilk
发明人： Jose E. Lopez , Dennis B. Shell , Mathew L. Gilk
IPC分类号： H01R12/00
CPC分类号： G01R1/0466
摘要： An improved test socket for use in testing integrated circuits. The test socket includes a housing having one or more slots formed therein. Contacts can be received within respective slots and maintained therein with rear ends of the contacts in engagement with traces on a load board. Mounting is accomplished by means of a pair of elastomers, and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.
摘要翻译： 用于测试集成电路的改进的测试插座。 测试插座包括其中形成有一个或多个槽的壳体。 触头可以在相应的插槽内容纳并保持在其中，触头的后端与负载板上的迹线接合。 通过一对弹性体实现安装，并且弹性体保持每个触点，使得当接触件的前端被被测试装置的引线或焊盘接合并被推入其相应的槽时，弓形表面 每个接触件的后端在其对应的轨迹上滚动，实际上没有平移或旋转滑动。
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公开(公告)号：US07338293B2
公开(公告)日：2008-03-04
申请号：US11423348
申请日：2006-06-09
申请人： Mathew L. Gilk
发明人： Mathew L. Gilk
CPC分类号： H01R13/2414 , G01R1/0466 , H01R12/714 , H01R13/2435 , H01R31/06 , H01R2201/20
摘要： A contact test set for use in testing integrated circuits. The set includes a housing having oppositely-facing surfaces and one or more slots extending through the housing between the surfaces. A first surface, during use of the test set, is approached by an integrated circuit to be tested, and a second surface is proximate the load board at a test site. A contact is received in a slot, each contact having a first end engagable by a lead of the integrated circuit device. A second end of each contact is in engagement with a corresponding terminal. Each contact is movable between a first orientation, unengaged by a corresponding lead of an IC and a second orientation in which the IC is engaged by the corresponding lead of an IC and urged into its slot. An elastomer biases the contact to its first orientation. The contact, when moved between its first and second orientations, does not slide across a terminal of the load board.
摘要翻译： 用于测试集成电路的接触测试仪。 该组件包括具有相对面的表面的壳体和在表面之间延伸穿过壳体的一个或多个槽。 在测试组使用期间的第一表面由被测试的集成电路接近，并且第二表面在测试位置处靠近负载板。 接触件被接收在槽中，每个触点具有可由集成电路装置的引线接合的第一端。 每个触点的第二端与相应的端子接合。 每个接触件可在第一取向之间移动，该第一取向未被IC的相应引线封闭，而第二取向由IC的相应引线接合并被推入其槽中。 弹性体将接触偏压到其第一取向。 当接触件在其第一和第二取向之间移动时，不会在负载板的端子上滑动。
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公开(公告)号：US07059866B2
公开(公告)日：2006-06-13
申请号：US10829577
申请日：2004-04-22
申请人： Mathew L. Gilk
发明人： Mathew L. Gilk
CPC分类号： H01R13/2414 , G01R1/0466 , H01R12/714 , H01R13/2435 , H01R31/06 , H01R2201/20
摘要： A contact test set for use in testing integrated circuits. The set includes a housing having oppositely-facing surfaces and one or more slots extending through the housing between the surfaces. A first surface, during use of the test set, is approached by an integrated circuit to be tested, and a second surface is proximate the load board at a test site. A contact is received in a slot, each contact having a first end engagable by a lead of the integrated circuit device. A second end of each contact is in engagement with a corresponding terminal. Each contact is movable between a first orientation, unengaged by a corresponding lead of an IC and a second orientation in which the IC is engaged by the corresponding lead of an IC and urged into its slot. An elastomer biases the contact to its first orientation. The contact, when moved between its first and second orientations, does not slide across a terminal of the load board.
摘要翻译： 用于测试集成电路的接触测试仪。 该组件包括具有相对面的表面的壳体和在表面之间延伸穿过壳体的一个或多个槽。 在测试组使用期间的第一表面由被测试的集成电路接近，并且第二表面在测试位置处靠近负载板。 接触件被接收在槽中，每个触点具有可由集成电路装置的引线接合的第一端。 每个触点的第二端与相应的端子接合。 每个接触件可在第一取向之间移动，该第一取向未被IC的相应引线封闭，而第二取向由IC的相应引线接合并被推入其槽中。 弹性体将接触偏压到其第一取向。 当接触件在其第一和第二取向之间移动时，不会在负载板的端子上滑动。
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公开(公告)号：US06861667B2
公开(公告)日：2005-03-01
申请号：US10619895
申请日：2003-07-15
IPC分类号： H01R4/66 , H01R13/514 , H01L23/58
CPC分类号： H01R13/2435 , H01R13/514 , H01R2201/20
摘要： A grounding assembly for testing which can be readily changed is provided by an insert which is retained within an opening in a test socket. Flexible projections from the socket fit within grooves in the insert to provide the retention means. The insert is positioned within an opening in the socket adjacent to an opening containing a device under test (DUT). The insert is also between the DUT and a test board, and has contacts arranged such they connect ground contacts on the DUT to opposing contacts on the test board. The insert can provide different numbers, arrangements, and types of contacts as well as different materials for both the contact and contact body by merely changing the insert.
摘要翻译： 可以容易地改变的用于测试的接地组件由保持在测试插座中的开口内的插入件提供。 该插座的柔性凸起配合在插入件中的槽内以提供保持装置。 插入件位于插座中的开口内，邻近包含待测器件（DUT）的开口。 插入件也在DUT和测试板之间，并且具有布置成使得它们将DUT上的接地触点连接到测试板上的相对触点的触点。 插入件可以通过仅改变插入件来为触点和接触体提供不同的数量，布置和类型的触点以及不同的材料。
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