Abstract:
A display element and electronic element module according to the present invention is described, in which a lens is formed as part of a translucent support substrate having a display disposed thereon, the lens being formed on a part other than where the display is disposed, where an electronic element is disposed for the lens.
Abstract:
A switching transistor is provided which applies predetermined voltage to a plurality of word lines based on a predetermined signal from a power on reset circuit, until predetermined potential becomes stable, when the predetermined potential is applied to the bit line or to the plate line, such as at the time of power on, to connect the bit line connected to each memory cell and the memory cell capacitor, as well as applies a control signal to the gate to thereby electrically connect the bit line and the plate line.
Abstract:
A semiconductor memory device includes: a plurality of word lines; a plurality of drive lines; a word line driving section for activating one of the plurality of word lines in accordance with a row address; a column selection section for, in accordance with a column address, selecting one of a plurality of ferroelectric memory cells coupled to the activated word line; a plate driving signal application section for applying a plate driving signal to at least a selected one of the plurality of drive lines, the at least one selected drive line being associated with the activated word line; and a switching section for coupling or detaching the plurality of ferroelectric memory cells to or from the at least one selected drive line. The column selection section controls the switching section so that only the selected ferroelectric memory cell is coupled to the at least one selected drive line.
Abstract:
A semiconductor memory device includes a ferroelectric memory having a non-volatile operation mode and a volatile operation mode; an input terminal to which an input signal indicating a voltage level of a power source voltage is input; a first signal generating circuit outputting a first control signal for regulating activation and inactivation of the non-volatile operation mode to the ferroelectric memory; and a second signal generating circuit outputting a second control signal for regulating the activation and inactivation of the non-volatile operation mode to the first signal generating circuit, based on the input signal. The non-volatile operation mode and the volatile operation mode are automatically switched with each other in accordance with changes in the voltage level of the power source voltage under a first operation condition, and only the volatile operation mode is activated under a second operation condition.
Abstract:
In order to correct a track zero-crossing signal TZC generated from a signal detected by an optical head of an optical disk system, an expected edge pulse and a window signal are generated at the position at which the appearance of the edge of the track zero-crossing signal is expected. Among the edge pulses of the actual track zero-crossing signal, only those that exist inside a window are allowed to pass through. When the edge pulses do not exist within the window, the expected pulse is inserted so as to generate a corrected edge pulse, and a corrected track zero-crossing signal is generated from this corrected edge pulse.
Abstract:
A semiconductor storage device including: a memory having a memory space, a plurality of addresses of the memory space each having data stored therein; and a security circuit for controlling a security function which activates or deactivates at least a part of the memory space according to whether, in the case where an address input to the security-circuit matches at least one key-address included in the security circuit, data stored in the address in the memory space is manipulated under a condition equal to a predetermined condition or under a condition not equal to the predetermined condition.
Abstract:
A semiconductor memory device includes a plurality of memory arrays including a plurality of memory cells; a plurality of fuses having one of a disconnected state and a connected state for classifying the plurality of memory arrays into a plurality of banks; and a selection circuit for selecting one of the plurality of banks based on the state of the plurality of the fuses and an address signal.
Abstract:
The semiconductor memory device of this invention includes a capacitor, a first transistor, and a second transistor, wherein the capacitor includes a first electrode, a second electrode opposing the first electrode, and a ferroelectric film sandwiched by the first and second electrodes, and stores and holds binary information utilizing a polarizing state of the ferroelectric film, the first transistor includes a first electrode, a second electrode, and a gate electrode, the second electrode being connected to the first electrode of the capacitor, and the second transistor includes a first electrode, a second electrode, and a gate electrode, the first electrode being connected to the second electrode of the capacitor.
Abstract:
A semiconductor type memory device includes: a counting unit for receiving a start address and counting an address taking the start address as a starting point; a setting unit for outputting an ending address; and a stopping unit for receiving the counted address and the ending address and causing the counting unit to stop counting when the counted address reaches the ending address.
Abstract:
A non-volatile semiconductor memory device includes a plurality of memory cells each including a capacitor as a memory element, the capacitor sandwiching a ferroelectric member. The non-volatile semiconductor memory device further includes: a first counter for counting the number of write accesses and read accesses for writing or reading first logic data to each one of the plurality of memory cells; a second counter for counting the number of write accesses and read accesses for writing or reading second logic data to the memory cell; and a refresh control circuit for performing, when either a first value counted by the first counter or a second value counted by the second counter exceeds a predetermined value, a refresh operation by applying electric fields for causing a polarization state of the ferroelectric member of the capacitor to make a complete round on a hysteresis curve of the ferroelectric member in a corresponding one of the plurality of memory cells for which the first or second value counted by the first counter or the second counter has exceeded the predetermined value.