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公开(公告)号：US20240344994A1
公开(公告)日：2024-10-17
申请号：US18298925
申请日：2023-04-11
摘要： Analytical instrument systems, components, and methods for stabilizing discharge formation are described. A spark gap device includes a first planar coil, defining an axis normal to a coil plane and defining a first aperture substantially centered about the axis. The spark gap device includes a second planar coil, offset from the first planar coil along the axis and substantially parallel with the coil plane, the second planar coil defining a second aperture substantially centered about the axis. The spark gap device also includes a conductive element disposed in the first aperture and substantially aligned with the axis.
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公开(公告)号：US20240338792A1
公开(公告)日：2024-10-10
申请号：US18296859
申请日：2023-04-06
发明人： John Eichorst
CPC分类号： G06T3/4053 , G01N21/6458 , G01N21/65 , G06T5/50 , G01N2201/126 , G06T2207/10056 , G06T2207/10064 , G06T2207/20224
摘要： Computer-implemented image processing methods with a computer processor and computer memory, comprise accessing, from the computer memory, a non-toroidal beam image component comprising a set of pixel intensities across an imaging area and a toroidal beam image component comprising a set of pixel intensities across the imaging area, scaling, with the computer processor, an image intensity of at least one pixel of one of the non-toroidal or toroidal beam image components by a ratio between a peak non-toroidal beam imaging pixel intensity across the imaging area and a peak toroidal beam imaging intensity across the imaging area to produce a scaled image intensity, and determining a difference between the scaled image intensity of the at least one pixel of the non-toroidal or toroidal image components and an image intensity of at least one pixel of the other of the non-toroidal or toroidal image components to form at least a portion of an image.
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公开(公告)号：US20230350178A1
公开(公告)日：2023-11-02
申请号：US18314472
申请日：2023-05-09
发明人： Michael GEORGIADIS
IPC分类号： G02B21/00
CPC分类号： G02B21/0032 , G02B21/0056
摘要： An embodiment of a phase mask is described that comprises a light blocking layer disposed on a substrate, where the light blocking layer has a number of optically transmissive regions each configured as a first pattern. The first pattern includes two segments that have different phase configurations from each other, and the light blocking layer includes at least three angular orientations of the first pattern.
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公开(公告)号：US20230194346A1
公开(公告)日：2023-06-22
申请号：US18084249
申请日：2022-12-19
发明人： Alexander GRENOV , Min Yan , Mike Bradley
IPC分类号： G01J3/28 , G01J3/02 , G01N21/359
CPC分类号： G01J3/2823 , G01J3/0237 , G01N21/359 , G01N2201/127 , G01N2021/3595
摘要： Methods and systems for automatically adjusting a sample position in a spectrometer, such as a Fourier-transform infrared (FTIR) spectrometer, are described. The sample may be automatically positioned using an auto-focusing procedure. For example, images including an aperture marker are acquired by directing light towards the sample via an aperture. The sample position may be adjusted based on features extracted from the aperture marker images.
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公开(公告)号：US20220283026A1
公开(公告)日：2022-09-08
申请号：US17684603
申请日：2022-03-02
发明人： Matthew Meyer , Francis Deck
IPC分类号： G01J3/02
摘要： An embodiment of a support structure for adjusting the position of a plurality of optical elements is described that comprises a base plate comprising a centering pin, a first translation slot, and a second translation slot; and a translatable plate configured to operatively couple with a plurality of the optical elements and move relative to the base plate, wherein the translatable plate comprises a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control movement of the translatable plate along a first axis, and a second cam configured to engage with the second translation slot and control movement of the translatable plate along a second axis.
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公开(公告)号：US20220245128A1
公开(公告)日：2022-08-04
申请号：US17726649
申请日：2022-04-22
发明人： Mark C. Grandau
IPC分类号： G06F16/23 , G06F16/215
摘要： Aspects of the disclosure relate to utilizing independently stored validation keys to enable auditing of instrument measurement data maintained in a blockchain. A computing platform may receive, from a first block generator, a first data block comprising first measurement data captured by a first instrument and associated with a sample. Subsequently, the computing platform may receive a first validation key for the first data block calculated from contents of the first data block. Then, the computing platform may store the first data block and the first validation key for the first data block in a blockchain associated with the data management computing platform. Next, the computing platform may send the first validation key for the first data block to a data escrow database system, which may cause the data escrow database system to store the first validation key in a validation keys database.
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公开(公告)号：US11321305B2
公开(公告)日：2022-05-03
申请号：US16710003
申请日：2019-12-11
发明人： Mark C. Grandau
IPC分类号： G06F16/23 , G06F16/215 , G06F16/21
摘要： Aspects of the disclosure relate to utilizing independently stored validation keys to enable auditing of instrument measurement data maintained in a blockchain. A computing platform may receive, from a first block generator, a first data block comprising first measurement data captured by a first instrument and associated with a sample. Subsequently, the computing platform may receive a first validation key for the first data block calculated from contents of the first data block. Then, the computing platform may store the first data block and the first validation key for the first data block in a blockchain associated with the data management computing platform. Next, the computing platform may send the first validation key for the first data block to a data escrow database system, which may cause the data escrow database system to store the first validation key in a validation keys database.
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公开(公告)号：US10816476B2
公开(公告)日：2020-10-27
申请号：US16081622
申请日：2017-02-08
摘要： A process of analyzing a sample by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) includes providing a sample having a sample surface within a vacuum chamber, performing a Raman spectroscopic analysis on a plurality of selected areas of the sample surface within the vacuum chamber to map an area of the sample surface comprising the selected areas, the Raman spectroscopic analysis including identifying one or more face in one or more of the selected areas of the sample surface, and performing an X-ray photoelectron spectroscopy (XPS) analysis of one or more selected areas of the sample surface containing at least one chemical and/or structural feature identified by the Raman spectroscopic analysis, wherein the duration of the XPS analysis of a given selected area of the sample surface is longer than the duration of the Raman spectroscopic analysis of that given selected area.
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公开(公告)号：US09837242B2
公开(公告)日：2017-12-05
申请号：US15614941
申请日：2017-06-06
发明人： Alan Ronemus
IPC分类号： H01J37/00 , H01J37/09 , H01J37/28 , H01J37/244
CPC分类号： H01J37/09 , H01J37/244 , H01J37/28 , H01J2237/0213 , H01J2237/2442
摘要： A charged particle filter includes a magnetic deflector having a bore along an axis thereof passing through the magnetic deflector from a sample end to a detector end of the magnetic deflector, and through which bore charged particles pass when in use, the magnetic deflector being formed from two magnets positioned around the bore, with a gap between the two magnets, the two magnets each having a linear central section and two ends, each end forming a curved surface, the curved surface having an aspect ratio defined by a height in a range of between one tenth and ten times the gap between the two magnets, and a width in a range of between one tenth and ten times the gap.
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公开(公告)号：US09170191B2
公开(公告)日：2015-10-27
申请号：US13931348
申请日：2013-06-28
CPC分类号： G01N21/0303 , G01J3/0202 , G01N21/255 , G01N21/35 , G01N2021/3595 , G01N2201/066
摘要： The present invention is thus directed to an automated system and method of varying the optical path length in a sample that a light from a spectrophotometer must travel through. Such arrangements allow a user to easily vary the optical path length while also providing the user with an easy way to clean and prepare a transmission cell for optical interrogation. Such path length control can be automatically controlled by a programmable control system to quickly collect and stores data from different path lengths as needed for different spectrographic analysis. Such a methodology and system, as presented herein, is able to return best-match spectra with far fewer computational steps and greater speed than if all possible combinations of reference spectra are considered.
摘要翻译： 因此，本发明涉及一种自动化系统和方法，其改变来自分光光度计的光必须穿过的样品中的光程长度。 这样的布置允许用户容易地改变光路长度，同时还为用户提供了清洁和准备用于光询问的传输单元的简单方法。 这种路径长度控制可以由可编程控制系统自动控制，以便根据不同光谱分析的需要快速收集和存储来自不同路径长度的数据。 如本文所述，这种方法和系统能够以比考虑参考光谱的所有可能组合的方式更少的计算步骤和更高的速度返回最佳匹配光谱。
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