- 专利标题: Charged particle filter
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申请号: US15614941申请日: 2017-06-06
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公开(公告)号: US09837242B2公开(公告)日: 2017-12-05
- 发明人: Alan Ronemus
- 申请人: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC
- 申请人地址: US WI Madison
- 专利权人: Thermo Electron Scientific Instruments LLC
- 当前专利权人: Thermo Electron Scientific Instruments LLC
- 当前专利权人地址: US WI Madison
- 代理商 William R. McCarthy, III
- 主分类号: H01J37/00
- IPC分类号: H01J37/00 ; H01J37/09 ; H01J37/28 ; H01J37/244
摘要:
A charged particle filter includes a magnetic deflector having a bore along an axis thereof passing through the magnetic deflector from a sample end to a detector end of the magnetic deflector, and through which bore charged particles pass when in use, the magnetic deflector being formed from two magnets positioned around the bore, with a gap between the two magnets, the two magnets each having a linear central section and two ends, each end forming a curved surface, the curved surface having an aspect ratio defined by a height in a range of between one tenth and ten times the gap between the two magnets, and a width in a range of between one tenth and ten times the gap.
公开/授权文献
- US20170271120A1 CHARGED PARTICLE FILTER 公开/授权日:2017-09-21
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