公开(公告)号：US08779788B2

公开(公告)日：2014-07-15

申请号：US13340758

申请日：2011-12-30

Applicant: Chi-Ren Chen ,  Chiang-Cheng Fan ,  Li-Hsun Chen

Inventor： Chi-Ren Chen ,  Chiang-Cheng Fan ,  Li-Hsun Chen

IPC: G01R31/10 ,  G01R31/20

CPC classification number: G01R31/2849 ,  G01R31/2817 ,  G09G3/006

Abstract: A testing apparatus includes a thermal control chamber including a test room, which temperature is controlled within a testing temperature range; a carrier frame including a direction guiding unit installed securely within the test room and formed with one guiding groove and a carrier rod extending through the guiding groove in the direction guiding unit; and a clamping unit mounted on the carrier rod for clamping a display-panel module securely, wherein, movement of the carrier rod transversely within the guiding groove relative to the direction guiding unit results in disposing the display-panel module to extend along one of several testing directions for undergoing a burn-in test.

Abstract translation: 测试装置包括一个包括测试室的热控制室，该温度控制在测试温度范围内; 载体框架，其包括方向引导单元，所述方向引导单元牢固地安装在所述测试室内并且形成有一个引导槽和沿所述方向引导单元延伸穿过所述引导槽的承载杆; 以及安装在所述承载杆上以用于可靠地夹持显示面板模块的夹紧单元，其中，所述承载杆相对于所述方向引导单元横向地在所述引导槽内的运动导致将所述显示面板模块布置成沿着多个 测试方向进行老化测试。

公开(公告)号：US20140182397A1

公开(公告)日：2014-07-03

申请号：US14108176

申请日：2013-12-16

Applicant: CHROMA ATE INC.

Inventor： Xin-Yi WU ,  Hsuan-Jen SHEN ,  Chien-Ming CHEN ,  Chin-Yi OU YANG

IPC: G01R31/28 ,  G01N1/42

CPC classification number: G01R31/2877 ,  G01N1/42 ,  G01R31/2865

Abstract: A test apparatus includes a test site, a buffer carrying device, a transport carrying device, a handling mechanism and a dry air flow guide mechanism. The test site performs a test procedure on the objects. The buffer carrying device is disposed close to a side of the test site, holds the objects and performs a temperature conditioning process. The transport carrying device is disposed close to another side of the test site, moves back and forth along a transporting direction, transports the objects into and out of the test site, and heats up the objects. The handling mechanism carries the objects among the buffer carrying device, the test site and the transport carrying device. The dry air flow guide mechanism guides a dry air to surround the test site, the buffer carrying device, the transport carrying device and the handling mechanism and generates a dry environment to prevent dew condensation.

Abstract translation: 试验装置包括试验部位，缓冲载体装置，输送装置，搬运机构以及干燥空气引导机构。 测试站点对对象执行测试程序。 缓冲载体装置靠近试验部位的一侧设置，保持物体并进行温度调节处理。 运送装置靠近试验场的另一侧，沿运送方向前后移动，运送物体进出试验场地，并加热物体。 处理机构携带缓冲运送装置，试验部位和运送装置中的物体。 干燥空气流动引导机构引导干燥空气围绕测试场所，缓冲装置，输送装置和处理机构，并产生干燥环境以防止结露。

公开(公告)号：US20130321794A1

公开(公告)日：2013-12-05

申请号：US13614140

申请日：2012-09-13

Applicant: HSU-TING CHENG ,  YUEH-HUNG CHENG

Inventor： HSU-TING CHENG ,  YUEH-HUNG CHENG

IPC: G01J1/04

CPC classification number: G01J1/4257 ,  G01J1/0422 ,  G01J1/42 ,  G01J2001/4252

Abstract: The present invention relates to a total luminous flux measurement system and a method thereof for measuring a total luminous flux of a light emitting component. The total luminous flux measurement system includes a light receiving module, a first light detector and a processing module. The light receiving module is disposed on a central normal of the light emitting component and divides a projection light field to a forward light field and a side light field. The light receiving module receives a beam in the forward light field to obtain a forward luminous flux. The first light detector is disposed on a side of the light receiving module to receive a beam in the side light field to obtain a first side luminous flux. The processing module electrically connects the light receiving module and the first light detector to calculate the total luminous flux at the light emitting component.

Abstract translation: 本发明涉及一种用于测量发光部件的总光通量的总光通量测量系统及其方法。 总光通量测量系统包括光接收模块，第一光检测器和处理模块。 光接收模块设置在发光元件的中心法线上，并将投影光场分为正光场和侧光场。 光接收模块在正射光场中接收光束以获得正向光通量。 第一光检测器设置在光接收模块的一侧以在侧光场中接收光束以获得第一侧光通量。 处理模块将光接收模块和第一光检测器电连接，以计算发光部件处的总光通量。

公开(公告)号：US20130271640A1

公开(公告)日：2013-10-17

申请号：US13803553

申请日：2013-03-14

Applicant: CHROMA ATE, INC.

Inventor： CHENG YUEH-HUNG ,  CHENG Hsu-Ting

IPC: H04N5/225

CPC classification number: H04N5/225 ,  H04N9/097

Abstract: An image capturing device includes a cube prism and three image capturing units. The cube prism includes an incident surface, a first exiting surface, a second exiting surface, and a third exiting surface orthogonal to each other, and further includes a first splitting surface, a second splitting surface, a third splitting surface, and a forth splitting surface orthogonal to each other. The light incident into the incident surface is split by the four splitting surfaces into monochromatic lights, and the monochromatic lights respectively exit from the three exiting surfaces to be received by the image capturing units to form images. The images can be combined as a multicolored image. Accordingly, the light-use efficiency and the image resolution can be improved, and the color fault of the image can be avoided.

Abstract translation: 图像捕获装置包括立体棱镜和三个图像捕获单元。 立方棱镜包括彼此正交的入射表面，第一出射表面，第二出射表面和第三出射表面，并且还包括第一分离表面，第二分裂表面，第三分裂表面和第四分离表面 表面彼此正交。 入射到入射表面的光被四个分离表面分成单色光，并且单色光分别从三个离开的表面退出以被图像捕获单元接收以形成图像。 图像可以组合成多色图像。 因此，可以提高光利用效率和图像分辨率，并且可以避免图像的颜色错误。

公开(公告)号：US08525996B2

公开(公告)日：2013-09-03

申请号：US13245088

申请日：2011-09-26

Applicant: Hsu-Ting Cheng ,  I-Shih Tseng ,  Tsun-I Wang

Inventor： Hsu-Ting Cheng ,  I-Shih Tseng ,  Tsun-I Wang

IPC: G01N21/25

CPC classification number: G01J3/51 ,  G01J2001/4252 ,  G01J2005/608 ,  G01R31/2635

Abstract: The invention discloses a light emitting component measuring system and the method thereof which is capable of measuring the optical proprieties of a plurality of the devices under test (DUT). Each DUT is capable of receiving electricity so as to output an initial ray, wherein each initial ray has a first wavelength range. The light emitting component measuring system comprises a filtering device and a sensing device. The filtering device comprises a first filtering portion which can filter a corresponding third wavelength of the said initial rays and output a plurality of first filtered rays simultaneously. Each first filtered ray has a second wavelength range respectively. The said sensing device receives the ray outputted from the filtering device and generates an optical data accordingly.

Abstract translation: 本发明公开了一种发光元件测量系统及其方法，其能够测量被测器件（DUT）的多个测试光学特性。 每个DUT能够接收电力以输出初始射线，其中每个初始射线具有第一波长范围。 发光元件测量系统包括过滤装置和感测装置。 滤波装置包括第一滤波部分，其可以过滤所述初始光线的相应的第三波长并同时输出多个第一滤波光线。 每个第一滤波光线分别具有第二波长范围。 所述感测装置接收从过滤装置输出的射线，并相应地产生光学数据。

公开(公告)号：US07933732B2

公开(公告)日：2011-04-26

申请号：US12355303

申请日：2009-01-16

Applicant: Hung-Hsiang Kao ,  Wen-Chung Chen ,  Kuo-Cheng Liu ,  Ming-Ying Tsou

Inventor： Hung-Hsiang Kao ,  Wen-Chung Chen ,  Kuo-Cheng Liu ,  Ming-Ying Tsou

IPC: G06F19/00

CPC classification number: G01R31/3004 ,  G01R31/31721

Abstract: An electronic load device provided for testing an OT (power supply to be tested) and the working bandwidth is regulated and set according to the output impedance of the OT. The electronic load device comprises a CPU, an impedance-bandwidth table, a voltage-current measurement unit, a power stage and a control module. Firstly, a current pulled out from the OT to the power stage is called by the CPU. Thereafter, an output impedance of the OT is measured by the voltage-current measurement unit and analysis by the CPU. Next, a working bandwidth of the electronic load device is regulated and set by the control module according to the output impedance and the impedance-bandwidth table.

Abstract translation: 根据OT的输出阻抗调节设置用于测试OT（待测电源）和工作带宽的电子负载装置。 电子负载装置包括CPU，阻抗带宽表，电压 - 电流测量单元，功率级和控制模块。 首先，由CPU调用从OT到功率级的电流。 此后，通过电压 - 电流测量单元测量OT的输出阻抗并通过CPU进行分析。 接下来，通过控制模块根据输出阻抗和阻抗带宽表来调节和设置电子负载装置的工作带宽。

公开(公告)号：US07580590B2

公开(公告)日：2009-08-25

申请号：US11369850

申请日：2006-03-08

Applicant: Yao-Min Lin ,  Wei-Che Chang ,  Huang-Chang Chang

Inventor： Yao-Min Lin ,  Wei-Che Chang ,  Huang-Chang Chang

IPC: G06K9/36 ,  G06K9/32 ,  G02B21/00 ,  A61B3/00

CPC classification number: G06T7/80

Abstract: An optical image system surface resolution calibration method is provided herein, which utilizes a calibration standard and an image sensor device. The surface of the calibration standard is provided with a plurality of interleaving bright lines and dark lines, the calibration standard is disposed in a plane to be measured, and the image sensor device is provided with an imaging means, a memory means, and a logic-arithmetic means, that is used to fetch the image information of the calibration standard and store the image information thus obtained. Meanwhile, the image sensor device is used to select and calculate the linear equations of the bright lines, and finally calculate the magnification factor of the image fetched by the image sensor device through the geometric mathematical means by making use of the slope and intersection distance of the linear equation and the average distance between the adjacent bright lines calculated from the intersection distance.

Abstract translation: 本文提供了一种利用校准标准和图像传感器装置的光学图像系统表面分辨率校准方法。 校准标准的表面设置有多个交错亮线和暗线，校准标准被设置在要测量的平面中，并且图像传感器装置设置有成像装置，存储装置和逻辑 算术装置，用于获取校准标准的图像信息并存储由此获得的图像信息。 同时，图像传感器装置用于选择和计算亮线的线性方程，并且最终通过几何数学方法通过利用图像传感器装置的斜率和交点距离来计算由图像传感器装置获取的图像的放大系数 线性方程和从交点距离计算的相邻亮线之间的平均距离。

公开(公告)号：US07545158B2

公开(公告)日：2009-06-09

申请号：US11786766

申请日：2007-04-12

Applicant: James E. Hopkins ,  Michael Peter Costello ,  Herbert Tsai ,  Ching-Too Chen

Inventor： James E. Hopkins ,  Michael Peter Costello ,  Herbert Tsai ,  Ching-Too Chen

IPC: G01R31/02

CPC classification number: G01R31/2893 ,  G11C29/56 ,  G11C29/56016

Abstract: A method for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The method and apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of all devices in such trays at the same time.

Abstract translation: 描述了一种用于测试每个具有多个电触点的系统级封装（SIP）器件的方法。 该方法和设备利用工业标准JEDEC托盘并且同时测试这些托盘中的所有设备的至少预定部分。

公开(公告)号：US20080129304A1

公开(公告)日：2008-06-05

申请号：US11987439

申请日：2007-11-30

Applicant: Joy Ou ,  Albert Fan

Inventor： Joy Ou ,  Albert Fan

IPC: G01R31/00

CPC classification number: G01J1/08 ,  G01J1/02 ,  G01J1/0271

Abstract: The present invention provides a photosensor testing device with a built-in light source and a tester provided with said device, which has a base and an upper cover disposed above the base, characterized in that the upper cover is equipped with at least one light emitting diode (LED) assembly used as a light source for a photosensor under test to undergo testing operation. Therefore, the components such as high intensity discharge lamps and optical processing devices are unnecessary any more, reducing the bulk volume of the testing device and its related cost. Besides, the testing process would be speeded up and the testing accuracy could be improved, as well as the time consumed in replacing the light source would be saved.

Abstract translation: 本发明提供了一种具有内置光源的光电传感器测试装置和设置有所述装置的测试仪，其具有设置在基座上方的基座和上盖，其特征在于，所述上盖配备有至少一种发光 二极管（LED）组件用作被测光电传感器的光源进行测试操作。 因此，不需要诸如高强度放电灯和光学处理装置的部件，减少了测试装置的体积和相关成本。 此外，测试过程将加快，可以提高测试精度，节省更换光源的时间。

公开(公告)号：US20070077048A1

公开(公告)日：2007-04-05

申请号：US11378485

申请日：2006-03-20

Applicant: Chieh-Cheng Liao ,  Yao-Min Lin

Inventor： Chieh-Cheng Liao ,  Yao-Min Lin

IPC: G02B7/04 ,  G03B17/00 ,  G02B27/40

CPC classification number: G03B13/36 ,  G01J1/04 ,  G01J1/0448

Abstract: An automatic focusing method is provided, which is realized through an imaging device as based on the multi-stage search principle and a focusing function. Thus the focusing position search is implemented in three stages of: the optimal focusing position gross search, the wave packet interval search, and the optimal focusing position minute search, with the respective stages having different search-step-magnitudes. Wherein, the integer times of one half the wavelength of the incident light of the imaging device is utilized as the search-step-magnitude to search for the maximum value of the focusing function in the wave packet interval, and define the focusing position corresponding to the maximum value of the focusing function as the optimal focusing position, hereby obtaining the optimal focusing position in a speedy and efficient manner.

Abstract translation: 提供了一种基于多级搜索原理和聚焦功能的成像装置实现的自动聚焦方法。 因此，聚焦位置搜索在三个阶段中实现：最佳对焦位置粗搜索，波包间隔搜索和最佳对焦位置分搜索，其中各个阶段具有不同的搜索步幅。 其中，成像装置的入射光的一半波长的整数倍被用作搜索步长值，以搜索波分组间隔中的聚焦函数的最大值，并且定义对应于 聚焦功能的最大值作为最佳对焦位置，因此以快速有效的方式获得最佳聚焦位置。