Method of avoiding space charge saturation effects in an ion trap
    41.
    发明授权
    Method of avoiding space charge saturation effects in an ion trap 有权
    避免离子阱中空间电荷饱和效应的方法

    公开(公告)号:US08344316B2

    公开(公告)日:2013-01-01

    申请号:US12997347

    申请日:2009-06-08

    Abstract: A mass spectrometer includes a first ion trap arranged upstream of an analytical second ion trap. The charge capacity of the first ion trap is set at a value such that if all the ions stored within the first ion trap up to the charge capacity limit of the first ion trap are then transferred to the second ion trap, then the analytical performance of the second ion trap is not substantially degraded due to space charge effects.

    Abstract translation: 质谱仪包括布置在分析第二离子阱的上游的第一离子阱。 第一离子阱的充电容量被设定为使得如果存储在第一离子阱内的所有离子直到第一离子阱的充电容量极限,则转移到第二离子阱,则分析性能 由于空间电荷效应,第二离子阱基本上不会劣化。

    GAS ANALYZER
    42.
    发明申请
    GAS ANALYZER 审中-公开
    气体分析仪

    公开(公告)号:US20120267525A1

    公开(公告)日:2012-10-25

    申请号:US13092824

    申请日:2011-04-22

    CPC classification number: H01J49/147 H01J49/4265

    Abstract: The present invention is directed to a gas analyzer that hardly generates noise peaks and facilitates reading of a molecular peak, even when a low-molecular-weight alkane is an analysis target. The analyzer analyzes an alkane of the carbon number 1 through 12 contained in a sample gas as an analysis target. The analyzed includes an ionization module for ionizing the sample gas by thermoelectrons having energy of 10 through 30 eV, an ion extraction electrode for extracting ions from the ionization module, a quadrupole module for selectively passing the ions extracted from the ionization module by the ion extraction electrode, through the quadrupole module, and an ion detection module for detecting the ions passed through the quadrupole module.

    Abstract translation: 本发明涉及即使当低分子量烷烃是分析对象时,几乎不产生噪声峰值并促进分子峰读数的气体分析仪。 分析仪分析作为分析对象的样品气体中包含的碳数1〜12的烷烃。 所分析的电离模块包括用于通过具有10至30eV的能量的热电子对样品气体进行电离的离子化模块,用于从电离模块中提取离子的离子提取电极,用于选择性地通过离子提取从电离模块提取的离子的四极组件 电极,通过四极杆模块,以及用于检测通过四极杆模块的离子的离子检测模块。

    Method Of Avoiding Space Charge Saturation Effects In An Ion Trap
    43.
    发明申请
    Method Of Avoiding Space Charge Saturation Effects In An Ion Trap 有权
    在离子阱中避免空间电荷饱和效应的方法

    公开(公告)号:US20110303838A1

    公开(公告)日:2011-12-15

    申请号:US12997347

    申请日:2009-06-08

    Abstract: A mass spectrometer is provided comprising a first ion trap (2) arranged upstream of an analytical second ion trap (5). The charge capacity of the first ion trap (2) is set at a value such that if all the ions stored within the first ion trap (2) up to the charge capacity limit of the first ion trap (2) are then transferred to the second ion trap (5), then the analytical performance of the second ion trap (5) is not substantially degraded due to space charge effects.

    Abstract translation: 提供质谱仪,其包括布置在分析性第二离子阱(5)上游的第一离子阱(2)。 将第一离子阱(2)的充电容量设定为使得如果存储在第一离子阱(2)内的所有离子直到第一离子阱(2)的充电容量极限,则转移到 第二离子阱(5),则由于空间电荷效应,第二离子阱(5)的分析性能基本上不劣化。

    Multiple Ion Injection in Mass Spectrometry
    44.
    发明申请
    Multiple Ion Injection in Mass Spectrometry 有权
    质谱中的多离子注入

    公开(公告)号:US20110147582A1

    公开(公告)日:2011-06-23

    申请号:US13008790

    申请日:2011-01-18

    Abstract: This invention relates to mass spectrometry that includes ion trapping in at least one of the stages of mass analysis. In particular, although not exclusively, this invention relates to tandem mass spectrometry where precursor ions and fragment ions are analysed. A method of mass spectrometry is provided comprising the sequential steps of: accumulating in an ion store a sample of one type of ions to be analysed; accumulating in the ion store a sample of another type of ions to be analysed; and mass analysing the combined samples of the ions; wherein the method comprises accumulating the sample of the one type of ions and/or the sample of another type of ions to achieve a target number of ions based on the results of a previous measurement of the respective type of ions.

    Abstract translation: 本发明涉及在质谱分析的至少一个阶段中包括离子捕获的质谱。 具体地说,尽管并非排他地,本发明涉及分析前体离子和碎片离子的串联质谱法。 提供了一种质谱法,其包括以下顺序步骤:在离子存储中积聚待分析的一种类型离子的样品; 在离子存储中积聚待分析的另一种类型的离子的样品; 并对离子的组合样品进行质量分析; 其中所述方法包括基于先前测量各种类型离子的结果累积一种类型离子的样品和/或另一类型离子的样品以实现目标数目的离子。

    Method and apparatus for reducing space charge in an ion trap
    45.
    发明授权
    Method and apparatus for reducing space charge in an ion trap 有权
    用于减少离子阱中的空间电荷的方法和装置

    公开(公告)号:US07847248B2

    公开(公告)日:2010-12-07

    申请号:US12272998

    申请日:2008-11-18

    CPC classification number: H01J49/4225 H01J49/4265

    Abstract: Ion trap apparatus and methods for efficiently addressing the effects of charge space caused by ion trap overfilling, useful in linear ion traps of mass spectrometers.

    Abstract translation: 用于有效解决由离子阱过度填充引起的电荷空间影响的离子阱设备和方法,可用于质谱仪的线性离子阱。

    DYNAMIC MULTIPLEXED ANALYSIS METHOD USING ION MOBILITY SPECTROMETER
    46.
    发明申请
    DYNAMIC MULTIPLEXED ANALYSIS METHOD USING ION MOBILITY SPECTROMETER 有权
    动态多项式分析方法使用离子移动光谱仪

    公开(公告)号:US20090294644A1

    公开(公告)日:2009-12-03

    申请号:US12132303

    申请日:2008-06-03

    Inventor: Mikhail E. Belov

    Abstract: A method for multiplexed analysis using ion mobility spectrometer in which the effectiveness and efficiency of the multiplexed method is optimized by automatically adjusting rates of passage of analyte materials through an IMS drift tube during operation of the system. This automatic adjustment is performed by the IMS instrument itself after determining the appropriate levels of adjustment according to the method of the present invention. In one example, the adjustment of the rates of passage for these materials is determined by quantifying the total number of analyte molecules delivered to the ion trap in a preselected period of time, comparing this number to the charge capacity of the ion trap, selecting a gate opening sequence; and implementing the selected gate opening sequence to obtain a preselected rate of analytes within said IMS drift tube.

    Abstract translation: 一种使用离子迁移谱仪进行复用分析的方法,其中通过在系统操作期间自动调节分析物质通过IMS漂移管的通过速率来优化复用方法的有效性和效率。 在根据本发明的方法确定适当的调整水平之后,由IMS仪器本身进行该自动调整。 在一个实例中,对这些材料的通过速率的调整通过在预选的时间段内量化输送到离子阱的分析物分子的总数来确定,将该数目与离子阱的电荷容量进行比较,选择 门打开序列; 并实施所选择的开门序列以获得所述IMS漂移管内的分析物的预选速率。

    METHOD AND APPARATUS FOR REDUCING SPACE CHARGE IN AN ION TRAP
    47.
    发明申请
    METHOD AND APPARATUS FOR REDUCING SPACE CHARGE IN AN ION TRAP 有权
    用于减少离子阱中空隙电荷的方法和装置

    公开(公告)号:US20090166534A1

    公开(公告)日:2009-07-02

    申请号:US12272998

    申请日:2008-11-18

    CPC classification number: H01J49/4225 H01J49/4265

    Abstract: Ion trap apparatus and methods for efficiently addressing the effects of charge space caused by ion trap overfilling, useful in linear ion traps of mass spectrometers.

    Abstract translation: 用于有效解决由离子阱过度填充引起的电荷空间影响的离子阱设备和方法,可用于质谱仪的线性离子阱。

    Mass spectrometer
    48.
    发明申请
    Mass spectrometer 有权
    质谱仪

    公开(公告)号:US20080156979A1

    公开(公告)日:2008-07-03

    申请号:US12010977

    申请日:2008-01-31

    CPC classification number: H01J49/4225 H01J49/004 H01J49/4265

    Abstract: Amass spectrometer includes: an ion source for ionizing a specimen to generate ions, an ion transport portion for transporting the ions, a linear ion trap portion for accumulating the transported ions by a potential formed axially, and a control portion of ejecting the ions within a second m/z range different from a first m/z range, from the linear ion trap portion, and substantially at the same timing as the timing of accumulating the ions within the first m/z range from the transport portion into the linear ion trap portion. The ion transportation portion having a mass selection means for selecting the ions in the first m/z range.

    Abstract translation: 阿马斯光谱仪包括:用于电离样品以产生离子的离子源,用于输送离子的离子传输部分,用于通过轴向形成的电势积聚所运送的离子的线性离子捕获部分,以及将离子喷射到 第二m / z范围与第一m / z范围不同于线性离子阱部分,并且基本上与从运输部分到线性离子阱的第一m / z范围内积聚离子的定时基本相同 一部分。 该离子传送部分具有用于选择第一m / z范围内的离子的质量选择装置。

    Ion trap mass spectrometry method
    49.
    发明申请
    Ion trap mass spectrometry method 有权
    离子阱质谱法

    公开(公告)号:US20080054173A1

    公开(公告)日:2008-03-06

    申请号:US11889232

    申请日:2007-08-10

    CPC classification number: H01J49/4265 H01J49/0081

    Abstract: According to an aspect of the present invention, there are provided an ion trap mass spectrometry method and an ion trap mass spectrometry device using a mass spectrometer, the mass spectrometer including: an ion source part for ionizing a sample; an ion trap part for trapping ions generated in the ion source; a main high frequency power source for applying a main high frequency voltage to the ion trap part, and an auxiliary high frequency power source for applying an auxiliary high frequency voltage thereto; and a detector for detecting the ions ejected from the ion trap. The ion trap mass spectrometry method and the ion trap mass spectrometry device includes the steps of: accumulating desired ions into the ion trap part by ejecting undesired ions while accumulating ions into the ion trap part; and ejecting undesired ions that remain in the ion trap part and leaving the desired ions in the ion trap part are repeated alternately.

    Abstract translation: 根据本发明的一个方面,提供了一种离子阱质谱法和使用质谱仪的离子阱质谱仪,该质谱仪包括:用于电离样品的离子源部分; 用于捕获在离子源中产生的离子的离子阱部分; 用于向离子阱部分施加主高频电压的主高频电源和用于向其提供辅助高频电压的辅助高频电源; 以及用于检测从离子阱排出的离子的检测器。 离子阱质谱方法和离子阱质谱装置包括以下步骤:通过在将离子聚集到离子阱部分的同时喷出不期望的离子将期望的离子累积到离子阱部分中; 并且交替地重复留在离子阱部分中并留下离子阱部分中的期望离子的不需要的离子。

    Mass spectrometer
    50.
    发明申请

    公开(公告)号:US20060289743A1

    公开(公告)日:2006-12-28

    申请号:US11446141

    申请日:2006-06-05

    CPC classification number: H01J49/4225 H01J49/4265

    Abstract: A mass spectrometer capable of realizing a high-sensitivity ion analysis and a high ion selectivity performance. The mass spectrometer includes the ion source where ions are produced, the ion trap where ions are accumulated, isolated, dissociated, and ejected, the detector to detect ions to be detected, and the controller to control operations of the ion trap. It has the features that the total ion accumulation in or just before each period is calculated based on the result obtained from the mass spectrometry in the preceding period, and that in at least one out of all periods, the condition of voltage applied to the ion trap is corrected depending on the total ion accumulation. Compared to the related art, the mass spectrometer of the present invention provides much improved performance in analysis sensitivity and ion selectivity.

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