Thin film transistor, display apparatus, and method of fabricating thin film transistor

    公开(公告)号:US12142696B2

    公开(公告)日:2024-11-12

    申请号:US17599688

    申请日:2020-12-21

    Abstract: A thin film transistor is provided. The thin film transistor includes abase substrate; a gate electrode on the base substrate; an active layer on the base substrate, the active layer including a polycrystalline silicon part including a polycrystalline silicon material and an amorphous silicon part including an amorphous silicon material; a gate insulating layer insulating the gate electrode from the active layer; a source electrode and a drain electrode on the base substrate; and an etch stop layer on a side of the polycrystalline silicon part away from the base substrate. An orthographic projection of the etch stop layer on the base substrate covers an orthographic projection of the polycrystalline silicon part on the base substrate, and an orthographic projection of at least a portion of the amorphous silicon part on the base substrate.

    THIN FILM TRANSISTOR, DISPLAY APPARATUS, AND METHOD OF FABRICATING THIN FILM TRANSISTOR

    公开(公告)号:US20220399465A1

    公开(公告)日:2022-12-15

    申请号:US17599688

    申请日:2020-12-21

    Abstract: A thin film transistor is provided. The thin film transistor includes abase substrate; a gate electrode on the base substrate; an active layer on the base substrate, the active layer including a polycrystalline silicon part including a polycrystalline silicon material and an amorphous silicon part including an amorphous silicon material; a gate insulating layer insulating the gate electrode from the active layer; a source electrode and a drain electrode on the base substrate; and an etch stop layer on a side of the polycrystalline silicon part away from the base substrate. An orthographic projection of the etch stop layer on the base substrate covers an orthographic projection of the polycrystalline silicon part on the base substrate, and an orthographic projection of at least a portion of the amorphous silicon part on the base substrate.

    Thin film transistor and method for manufacturing a thin film transistor

    公开(公告)号:US11309427B2

    公开(公告)日:2022-04-19

    申请号:US16642638

    申请日:2019-03-04

    Abstract: The present disclosure relates to a thin film transistor and a manufacturing method thereof. The thin film transistor includes a substrate, a first semiconductor layer, a gate dielectric layer, and a gate electrode sequentially stacked on the substrate, the first semiconductor layer has a first portion located in a channel region of the thin film transistor and a second portion in source/drain regions of the thin film transistor and located on both sides of the first portion, the second portion and first sub-portions of the first portion adjacent to the second portion include an amorphous semiconductor material, a second sub-portion of the first portion between the first sub-portions includes a polycrystalline semiconductor material, and a second semiconductor layer located in the source/drain regions and in contact with the second portion, wherein a conductivity of the second semiconductor layer is higher than a conductivity of the amorphous semiconductor material.

    CMOS structure and method for manufacturing CMOS structure

    公开(公告)号:US11264384B2

    公开(公告)日:2022-03-01

    申请号:US16642723

    申请日:2019-03-04

    Abstract: The disclosure relates to a CMOS structure and a manufacturing method thereof. The CMOS structure includes a substrate and an N-type TFT and a P-type TFT on the substrate. The N-type TFT includes a first gate electrode, a first active layer, and a first gate dielectric layer therebetween. The first active layer includes a first semiconductor layer, a second semiconductor layer of the N-type, and a third semiconductor layer of the N-type which are located at opposite ends of the first semiconductor layer and sequentially stacked in a direction away from the first gate dielectric layer. An N-type doping concentration of the second semiconductor layer is smaller than that of the third semiconductor layer. The P-type TFT includes a fifth semiconductor layer and a sixth semiconductor layer. A P-type doping concentration of the fifth semiconductor layer is smaller than that of the sixth semiconductor layer.

    Data transmitting method, data receiving method and device and system thereof

    公开(公告)号:US10217353B2

    公开(公告)日:2019-02-26

    申请号:US15327412

    申请日:2016-06-20

    Abstract: A data transmitting method, a data receiving method and the related device and system are provided. The data transmitting device includes a display screen, a first determination module, configured to determine one or more transmitting regions of the display screen, and a transmitting module, configured to transmit, by controlling a display of the one or more transmitting regions, target data in a format of a machine language via optical signals. The data receiving device includes a panel on which a plurality of optical sensors is arranged, a second determination module, configured to determine one or more receiving regions of the panel each corresponding to one or more of the optical sensor, and a receiving module, configured to receive, through each optical sensor in the one or more receiving regions, target data in a format of a machine language transmitted via optical signals.

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