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公开(公告)号:US10394719B2
公开(公告)日:2019-08-27
申请号:US15457813
申请日:2017-03-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Mu-Tien Chang , Dimin Niu , Hongzhong Zheng
IPC: G06F12/126 , G06F12/128 , G11C11/406
Abstract: A method for replacing data on a volatile memory cache is provided. The volatile memory cache includes one or more memory banks and each of the memory banks includes a plurality of memory lines. The method includes: identifying a replacement ID for at least one of the memory lines to be replaced; identifying a refresh bank ID for one of the memory banks to be refreshed; determining whether or not a conflict exists between the replacement ID and the refresh bank ID; and selecting a new replacement ID if the conflict exists.
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公开(公告)号:US20190179704A1
公开(公告)日:2019-06-13
申请号:US16276304
申请日:2019-02-14
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dimin Niu , Mu-Tien Chang , Hongzhong Zheng , Hyun-Joong Kim , Won-hyung Song , Jangseok Choi
Abstract: A method of correcting a memory error of a dynamic random-access memory module (DRAM) using a double data rate (DDR) interface, the method includes conducting a memory transaction including multiple bursts with a memory controller to send data from data chips of the DRAM to the memory controller, detecting one or more errors using an ECC chip of the DRAM, determining a number of the bursts having the errors using the ECC chip of the DRAM, determining whether the number of the bursts having the errors is greater than a threshold number, determining a type of the errors, and directing the memory controller based on the determined type of the errors, wherein the DRAM includes a single ECC chip per memory channel.
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33.
公开(公告)号:US20180232310A1
公开(公告)日:2018-08-16
申请号:US15587286
申请日:2017-05-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Mu-Tien Chang , Dimin Niu , Hongzhong Zheng
IPC: G06F12/0817 , G06F12/0864
CPC classification number: G06F12/0822 , G06F12/0246 , G06F12/0638 , G06F12/0864 , G06F12/0895 , G06F17/3033 , G06F2212/28 , G06F2212/62
Abstract: According to one embodiment, the method includes: providing a hybrid memory module including a DRAM cache, a flash memory, and an SRAM for storing a metadata cache; obtaining a host address by decoding a data access request received from a host computer, wherein the host address includes a DRAM cache tag and a DRAM cache index; obtaining a metadata address from the DRAM cache index, wherein the metadata address includes a metadata cache tag and a metadata cache index; determining a metadata cache hit based on a presence of a matching metadata cache entry in the metadata cache of the SRAM; in a case of the metadata cache hit, obtaining the data from the DRAM cache and skipping an access to the metadata of the DRAM cache; and returning the data obtained from the DRAM cache to the host computer.
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公开(公告)号:US10049717B2
公开(公告)日:2018-08-14
申请号:US15169590
申请日:2016-05-31
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Dimin Niu , Mu-Tien Chang , Hongzhong Zheng , Kyung-Chang Ryoo
IPC: G06F12/00 , G11C11/406 , G06F12/02 , G11C14/00
Abstract: A method of wear leveling for a storage device or a memory device includes: receiving an inputted memory address; randomizing the inputted memory address to be a randomized memory address; and periodically reassigning the randomized memory address to be a different memory address.
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公开(公告)号:US20180210843A1
公开(公告)日:2018-07-26
申请号:US15457813
申请日:2017-03-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Mu-Tien Chang , Dimin Niu , Hongzhong Zheng
IPC: G06F12/128 , G11C11/406
CPC classification number: G06F12/128 , G06F12/126 , G06F2212/1021 , G11C11/40618
Abstract: A method for replacing data on a volatile memory cache is provided. The volatile memory cache includes one or more memory banks and each of the memory banks includes a plurality of memory lines. The method includes: identifying a replacement ID for at least one of the memory lines to be replaced; identifying a refresh bank ID for one of the memory banks to be refreshed; determining whether or not a conflict exists between the replacement ID and the refresh bank ID; and selecting a new replacement ID if the conflict exists.
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公开(公告)号:US20170357604A1
公开(公告)日:2017-12-14
申请号:US15285423
申请日:2016-10-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sun Young Lim , Mu-Tien Chang , Dimin Niu , Hongzhong Zheng , Indong Kim
IPC: G06F13/16 , G06F3/06 , G06F13/40 , G11C11/4094 , G06F12/0879 , G11C11/4093 , G11C11/4076 , G11C11/4091 , G06F12/0891
Abstract: A method includes: providing a DDR interface between a host memory controller and a memory module; and providing a message interface between the host memory controller and the memory module. The memory module includes a non-volatile memory and a DRAM configured as a DRAM cache of the non-volatile memory. Data stored in the non-volatile memory of the memory module is asynchronously accessible by a non-volatile memory controller of the memory module, and data stored in the DRAM cache is directly and synchronously accessible by the host memory controller.
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公开(公告)号:US09837135B2
公开(公告)日:2017-12-05
申请号:US15227911
申请日:2016-08-03
Applicant: Samsung Electronics Co., Ltd.
Inventor: Mu-Tien Chang , Dimin Niu , Hongzhong Zheng , Sun Young Lim , Indong Kim , Jangseok Choi
CPC classification number: G11C8/08 , G11C7/1018 , G11C8/04 , G11C8/06 , G11C8/12 , G11C8/18 , G11C13/0026 , G11C13/0028 , G11C13/0069
Abstract: A method for addressing memory device data arranged in rows and columns indexed by a first number of row address bits and a second number of column address bits, and addressed by a row command specifying a third number of row address bits followed by a column command specifying a fourth number of column address bits, the first number being greater than the third number or the second number being greater than the fourth number, includes: splitting the first number of row address bits into first and second subsets, and specifying the first subset in the row command and the second subset in a next address command when the first number is greater than the third number; otherwise splitting the second number of column address bits into third and fourth subsets, and specifying the fourth subset in the column command and the third subset in a previous address command.
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公开(公告)号:US20170255418A1
公开(公告)日:2017-09-07
申请号:US15169609
申请日:2016-05-31
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dimin Niu , Mu-Tien Chang , Hongzhong Zheng , Craig Hanson , Sun Young Lim , Indong Kim
IPC: G06F3/06
Abstract: A memory system includes: one or more memory modules, each comprising a plurality of memory devices having corresponding write commit policies; and one or more memory controllers coupled to the one or more memory modules, the one or more memory controllers having a configurable write operation protocol to operate with the memory devices according to the corresponding write commit policies
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公开(公告)号:US20250147659A1
公开(公告)日:2025-05-08
申请号:US19016833
申请日:2025-01-10
Applicant: Samsung Electronics Co., Ltd.
Inventor: Mu-Tien Chang , Prasun Gera , Dimin Niu , Hongzhong Zheng
Abstract: A 3D-stacked memory device including: a base die including a plurality of switches to direct data flow and a plurality of arithmetic logic units (ALUs) to compute data; a plurality of memory dies stacked on the base die; and an interface to transfer signals to control the base die.
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公开(公告)号:US10824348B2
公开(公告)日:2020-11-03
申请号:US15275337
申请日:2016-09-23
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sompong Paul Olarig , Mu-Tien Chang
Abstract: A secure memory (145) is disclosed. The memory (145) may include data storage (310, 315, 320, 325, 330, 335, 340, 345) for data, along with a data read logic (405) and a data write logic (410) to read and write data from the data storage (310, 315, 320, 325, 330, 335, 340, 345). A password storage (355) may store a stored password (510). A receiver may receive a received password (505) from a memory controller (205). A comparator may compare the received password (505) with the stored password (510). An erase logic (435) may erase data in the data storage (310, 315, 320, 325, 330, 335, 340, 345) if the received password (505) does not match the stored password (510). Finally, a block logic (425) may block access to the memory (145) from the memory controller (205) until after the comparator (430) completes its operation.
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