Display device
    32.
    发明授权

    公开(公告)号:US10418431B2

    公开(公告)日:2019-09-17

    申请号:US15416653

    申请日:2017-01-26

    Abstract: A display device may include a light emitting element, a buffer layer, a gate insulation layer, and a switching element. A refractive index of the gate insulation layer may be equal to a refractive index of the buffer layer. The switching element may be electrically connected to the light emitting element and may include an active layer and a gate electrode. The active layer may be positioned between the buffer layer and the gate insulation layer and may directly contact at least one of the buffer layer and the gate insulation layer. The gate insulation layer may be positioned between the active layer and the gate electrode and may directly contact at least one of the active layer and the gate electrode.

    Precursor composition of oxide semiconductor and thin film transistor substrate including oxide semiconductor
    35.
    发明授权
    Precursor composition of oxide semiconductor and thin film transistor substrate including oxide semiconductor 有权
    包含氧化物半导体的氧化物半导体和薄膜晶体管衬底的前体组成

    公开(公告)号:US09082795B2

    公开(公告)日:2015-07-14

    申请号:US14477587

    申请日:2014-09-04

    Abstract: A thin film transistor substrate according to an exemplary embodiment of the present invention includes a semiconductor layer including metal disposed on an insulating substrate, a gate electrode overlapping the semiconductor layer, and a source electrode and a drain electrode overlapping the semiconductor layer, wherein the metal in the semiconductor layer comprises indium (In), zinc (Zn), and tin (Sn), and a molar ratio ( R , R ⁡ [ mol ⁢ ⁢ % ] = [ In ] [ In + Zn + Sn ] × 100 ) of indium (In) to the metals in the semiconductor layer is less than about 20%, and more specifically, the molar ratio ( R , R ⁡ [ mol ⁢ ⁢ % ] = [ In ] [ In + Zn + Sn ] × 100 ) of indium (In) of the metals in the semiconductor layer is about 5% to about 13%.

    Abstract translation: 根据本发明的示例性实施例的薄膜晶体管基板包括:半导体层,包括设置在绝缘基板上的金属,与半导体层重叠的栅极电极以及与半导体层重叠的源电极和漏电极,其中金属 在半导体层中包含铟(In),锌(Zn)和锡(Sn),摩尔比(R,R⁡[mol⁢%] = [In] [In + Zn + Sn]×100) 对于半导体层中的金属,铟(In)的含量小于约20%,更具体地说,摩尔比(R,R⁡[mol·⁢%] = [In] [In + Zn + Sn]×100 )的半导体层中的金属的In(In)为约5%至约13%。

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