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公开(公告)号：US20240085500A1
公开(公告)日：2024-03-14
申请号：US18461995
申请日：2023-09-06
Inventor： Alan J. O'Donnell , Javier Calpe Maravilla , Shaun Bradley , Jan Kubík , Jochen Schmitt , Stanislav Jolondcovschi , Padraig L. Fitzgerald , Michael P. Lynch , Alfonso Berduque , Gavin Patrick Cosgrave , Eoin Edward English
IPC: G01R33/12
CPC classification number: G01R33/1276
Abstract: Aspects of this disclosure relate to particles that can move in response to a magnetic field. A system can include a container, particles within the container, and a magnetic structure integrated with the container. The magnetic structure can magnetically interact with both an external magnetic field and the particles. Related methods are disclosed including magnetic field detection methods based on detection of particles within a container.
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公开(公告)号：US20240044725A1
公开(公告)日：2024-02-08
申请号：US18364255
申请日：2023-08-02
Inventor： Alan J. O'Donnell , Javier Calpe Maravilla , Jan Kubík , Jochen Schmitt , Shaun Bradley , Stanislav Jolondcovschi , Padraig L. Fitzgerald , Alfonso Berduque , Gavin Patrick Cosgrave , Michael P. Lynch , Eoin Edward English
Abstract: Aspects of this disclosure relate to force based on a profile of magnetically sensitive material in a container. One or more sensors can detect the profile of the magnetically sensitive material, where the profile is associated with a force applied to the container. The profile includes magnetically sensitive material concentrated in one or more particular areas within the container. Related systems and methods for force detection are disclosed.
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Patent Agency Ranking
公开(公告)号：US20230349987A1
公开(公告)日：2023-11-02
申请号：US18299627
申请日：2023-04-12
Inventor： Alan J. O’Donnell , Shaun Bradley , Alfonso Berduque , Jan Kubík , Jochen Schmitt , Stanislav Jolondcovschi , Javier Calpe Maravilla , Padraig L. Fitzgerald , Gavin Patrick Cosgrave , Michael P. Lynch , Eoin Edward English
CPC classification number: G01R33/0213 , G01K11/06
Abstract: Aspects of this disclosure relate to generating measurements based on positions of particles within one or more compartments. At least some of the particles can move in response to an external stimulus. A comparative measurement can be provided based on comparing the measurements. The measurements can be associated with two or more types of particles and/or two or more compartments.
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公开(公告)号：US11668734B2
公开(公告)日：2023-06-06
申请号：US17446945
申请日：2021-09-03
Inventor： David J. Clarke , Stephen Denis Heffernan , Nijun Wei , Alan J. O'Donnell , Patrick Martin McGuinness , Shaun Bradley , Edward John Coyne , David Aherne , David M. Boland
IPC: G01R19/165 , G01R31/00 , G01R31/28 , H02H9/04 , H01L27/02 , H01L23/60 , H01L23/62 , H01L23/525 , H02H9/00
CPC classification number: G01R19/16504 , G01R31/002 , G01R31/2832 , G01R31/2856 , H01L23/5256 , H01L23/60 , H01L23/62 , H01L27/0288 , H02H9/00 , H02H9/042
Abstract: The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event. The two conductive structures have facing surfaces that have different shapes.
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公开(公告)号：US20230152166A1
公开(公告)日：2023-05-18
申请号：US18053523
申请日：2022-11-08
Inventor： Alan J. O'Donnell , Alfonso Berduque , Javier Calpe Maravilla , Shaun Bradley , Padraig L. Fitzgerald , Jan Kubík , Stanislav Jolondcovschi , Jochen Schmitt , Gavin Patrick Cosgrave , Eoin Edward English , Michael P. Lynch
Abstract: Aspects of this disclosure relate to detecting temperature based on movement of one or more particles within a container. The container includes a medium material. Mobility of the one or more particles in the medium material changes in response to a change in temperature.
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公开(公告)号：US20230098962A1
公开(公告)日：2023-03-30
申请号：US17933600
申请日：2022-09-20
Inventor： Alan J. O'Donnell , Javier Calpe Maravilla , Alfonso Berduque , Shaun Bradley , Jochen Schmitt , Jan Kubík , Stanislav Jolondcovschi , Padraig L. Fitzgerald , Eoin Edward English , Gavin Patrick Cosgrave , Michael P. Lynch
Abstract: Aspects of this disclosure relate to one or more particles that move within a container in response to a magnetic field. A measurement circuit is configured to output an indication of the magnetic field based on position of the one or more particles.
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公开(公告)号：US11112436B2
公开(公告)日：2021-09-07
申请号：US16360356
申请日：2019-03-21
Inventor： David J. Clarke , Stephen Denis Heffernan , Nijun Wei , Alan J. O'Donnell , Patrick Martin McGuinness , Shaun Bradley , Edward John Coyne , David Aherne , David M. Boland
IPC: G01R19/165 , G01R31/00 , G01R31/28 , H02H9/04 , H01L27/02 , H01L23/60 , H01L23/62 , H01L23/525 , H02H9/00
Abstract: The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event. The two conductive structures have facing surfaces that have different shapes.
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