Abstract:
An organic memory at least includes a number of select lines, a number of data lines, a bit cell array, and a number of digital sensing circuits. The bit cell array includes a number of bit cells, wherein each bit cell includes an organic memory cell and a switch element. Each digital sensing circuit includes a current-to-voltage converter and a sensing block circuit. Therefore, a complete digital sensing mechanism of an organic memory IC is formed and is practicable and suitable for mass-production.
Abstract:
A writing circuit for a phase change memory is provided. The writing circuit comprises a driving current generating circuit, a first switch device, a first memory cell and a second switch device. The driving current generating circuit provides a writing current to the first memory cell. The first switch device is coupled to the driving current generating circuit. The first memory cell is coupled between the first switch device and the second switch device. The second switch device is coupled between the first memory cell and a ground, wherein when the driving current generating circuit outputs the writing current to the first memory cell, the second switch device is turned on after the first switch device has been turned on for a first predetermined time period.
Abstract:
One embodiment of the invention provides a compensation circuit. The compensation circuit comprises a writing driver, a distance detection circuit, an operating element and an auxiliary writing driver. The writing driver provides a writing current to a writing path. The distance detection circuit is coupled to the writing path to detect a distance that the writing current has travelled and outputs a control signal based on the distance. The operating element is coupled to the writing path. The auxiliary writing driver provides an auxiliary current to the writing path based on the control signal.
Abstract:
A digital sensing circuit capable of sensing bit information stored in a bit cell of an organic memory is provided. The digital sensing circuit includes a current-to-voltage converter, a reset block circuit, and a sensing block circuit. The current-to-voltage converter converts a conduction current into a voltage signal. The sensing block circuit buffers and outputs the bit information according to the voltage signal. Therefore, the challenge of design and layout of the present invention is very low so that the yield rate will be improved. Hence, a practical memory device suitable for mass-production is achieved.
Abstract:
A digital sensing circuit capable of sensing bit information stored in a bit cell of an organic memory is provided. The digital sensing circuit comprises a current-to-voltage converter, a reset block circuit, and a sensing block circuit. The current-to-voltage converter converts a conduction current into a voltage signal. The sensing block circuit buffers and outputs the bit information according to the voltage signal. Therefore, the challenge of design and layout of the present invention is very low so that the yield rate will be improved. Hence, a practical memory device suitable for mass-production is achieved.
Abstract:
A memory array including a plurality of programmable memory cells, a plurality of column lines and a plurality of row lines is introduced. Each of the programmable memory cells is coupled to corresponding one of the column lines and corresponding one of the row lines. Each of the programmable memory cells includes an organic memory cell and an active switching element. The active switching element is controlled by the column line and interposed between the row line and the organic memory cell. Under controlling of the column line, the active switching element is turned on to coupling the row line and the organic memory cell to connect to each other.
Abstract:
An embodiment of a writing system for a phase change memory based on a present application is disclosed. The writing system comprises a first phase change memory (PCM) cell, a second PCM cell, a first writing circuit and a verifying circuit. The first writing circuit executes a writing procedure, receives and writes a first data to the first PCM cell. The verifying circuit executes a verifying procedure and the circuit further comprises a processing unit and a second writing circuit. The processing unit reads and compares the data stored in the second PCM cell with a second data. The second writing circuit writes the second data to the second PCM cell when the data stored in the second PCM cell and the second data are not matched.
Abstract:
A measuring apparatus including a first chip, a first circuit layer, a first heater, a first stress sensor and a second circuit layer is provided. The first chip has a first through silicon via, a first surface and a second surface opposite to the first surface. The first circuit layer is disposed on the first surface. The first heater and the first stress sensor are disposed on the first surface and connected to the first circuit layer. The second circuit layer is disposed on the second surface. The first heater comprises a plurality of first switches connected in series to generate heat.
Abstract:
A data programming circuit for storing a writing data into a memory cell is provided. The data programming circuit includes a control circuit and a current generating circuit. The control circuit generates a control signal according to the writing data. The current generating circuit provides a writing current to the memory cell to change a crystalline state of the memory cell. The writing current has a pulse width corresponding to the writing data, and the crystalline state corresponds to the writing data.
Abstract:
A data programming circuit for storing a writing data into a memory cell is provided. The data programming circuit includes a control circuit and a current generating circuit. The control circuit generates a control signal according to the writing data. The current generating circuit provides a writing current to the memory cell to change a crystalline state of the memory cell. The writing current has a pulse width corresponding to the writing data, and the crystalline state corresponds to the writing data.