公开(公告)号：US20090174523A1

公开(公告)日：2009-07-09

申请号：US12339036

申请日：2008-12-18

申请人： Ken HARADA ,  Minoru Sakamaki ,  Isao Matsui

发明人： Ken HARADA ,  Minoru Sakamaki ,  Isao Matsui

IPC分类号： H01C3/18

CPC分类号： H01C3/12

摘要： In a flat plate type thick film resistor, an insulation performance is improved by excluding the nonuniformity of potential distribution on a wiring plane, which is generated when electric current flows in a resistance wire. Simultaneously, generation of noise depending on potential distribution and variation of stray capacitance around a resistor is suppressed. When the resistance wire having a constant thickness and uniform resistivity, which is formed on an insulating substrate, is connected to a pair electrode conductors that face to each other, in the way that the resistance wire is repetitively bent to the alternate side in zigzags, a potential gradient on the wiring plane, which is generated when electric current flows in the resistance wire, is constant by properly selecting the line width, the bending angle, and the spacing between bending vertexes of a resistance wire.

摘要翻译： 在平板型厚膜电阻器中，通过排除电流在电阻丝中流动时产生的布线面上的电位分布的不均匀性，可以提高绝缘性能。 同时，抑制电阻周围的电位分布和杂散电容的变化产生噪声。 当形成在绝缘基板上的具有恒定厚度和均匀电阻率的电阻线连接到彼此相对的一对电极导体时，电阻线以锯齿形重复弯曲到另一侧， 通过适当地选择线宽，弯曲角度和电阻丝的弯曲顶点之间的间隔，在电阻线中电流产生的布线平面上的电位梯度是恒定的。

公开(公告)号：US20090021866A1

公开(公告)日：2009-01-22

申请号：US12219238

申请日：2008-07-17

申请人： Yoshihiko Togawa ,  Ken Harada ,  Tsuyoshi Matsuda ,  Yoshichika Otani ,  Takashi Kimura

发明人： Yoshihiko Togawa ,  Ken Harada ,  Tsuyoshi Matsuda ,  Yoshichika Otani ,  Takashi Kimura

IPC分类号： G11B5/48

CPC分类号： H01F10/06 ,  G11C11/14 ,  G11C11/161 ,  G11C11/1675 ,  G11C19/0808 ,  H01L43/08

摘要： The magnetization state of a ferromagnetic material is controlled by applying a current pulse to it while externally applying a weak magnetic field to it. The magnetic state of a ferromagnetic material can be switched between a uniformly magnetized state and a multiple magnetic domain structure by controlling the direction and intensity of the magnetic field applied to it and the intensity and pulse width of the current pulse. When an external magnetic field is applied, the possibility of occurrence of the reversal of the magnetic state upon application of the current pulse shows a hysteresis, and the reversal of the magnetic state can be controlled reliably. The intensity of the magnetic field to be applied may be as weak as a few gauss. Furthermore, by using such magnetic information recording elements, a magnetic information recording device (memory) that can achieve a high degree of integration can be produced.

摘要翻译： 铁磁材料的磁化状态通过向外部施加弱磁场而施加电流脉冲来控制。 通过控制施加到其的磁场的方向和强度以及电流脉冲的强度和脉冲宽度，铁磁材料的磁状态可以在均匀磁化状态和多磁畴结构之间切换。 当施加外部磁场时，在施加电流脉冲时发生磁状态反转的可能性显示滞后，并且可以可靠地控制磁状态的反转。 要施加的磁场的强度可能与几个高斯一样弱。 此外，通过使用这种磁信息记录元件，可以产生可以实现高集成度的磁信息记录装置（存储器）。

公开(公告)号：US20080258058A1

公开(公告)日：2008-10-23

申请号：US11884680

申请日：2006-01-27

申请人： Ken Harada ,  Tetsuya Akashi ,  Yoshihiko Togawa ,  Tsuyoshi Matsuda ,  Noboru Moriya

发明人： Ken Harada ,  Tetsuya Akashi ,  Yoshihiko Togawa ,  Tsuyoshi Matsuda ,  Noboru Moriya

IPC分类号： G01N23/00 ,  G01J3/45

CPC分类号： H01J37/04 ,  G01N23/00 ,  G02B19/0014 ,  G02B19/0047 ,  G03H5/00 ,  H01J37/295 ,  H01J2237/1514 ,  H01J2237/228 ,  H01J2237/2614

摘要： A double-biprism electron interferometer is an optical system which dramatically increases the degree of freedom of a conventional one-stage electron interferometer. The double-biprism electron interferometer, however, is the same as the optical system of the single electron biprism interferometer in terms of the one-dimensional shape of an electron hologram formed by filament electrodes, the direction of an interference area and the azimuth of the interference fringes. In other words, the longitudinal direction of the interference area is determined corresponding to the direction of the filament electrodes, and the azimuth of the interference fringes only coincides with and is in parallel with the longitudinal direction of the interference area.An interferometer according to the present invention has upper-stage, intermediate-stage, and lower-stage electron biprisms, operates with an azimuth angle Φ among filament electrodes of the three electron biprisms to arbitrarily control an interference area and an azimuth θ of the interference fringes formed therein, eliminates Fresnel fringes generation, and allows independent control of an interference fringe spacing s and the azimuth θ of the interference fringes.

摘要翻译： 双二棱镜电子干涉仪是一种显着提高常规一级电子干涉仪自由度的光学系统。 然而，双二棱镜电子干涉仪与单电子双棱镜干涉仪的光学系统相同，就由灯丝电极形成的电子全息图的一维形状，干涉区域的方向和方位角 干涉条纹。 换句话说，干扰区域的长度方向根据灯丝电极的方向确定，并且干涉条纹的方位角仅与干涉区域的纵向方向一致并且平行。 根据本发明的干涉仪具有上级，中级和低级电子双极，与三个电子双极体的细丝电极之间的方位角Phi一起操作以任意地控制干涉区域和干涉的方位角θ 形成在其中的边缘消除了菲涅尔条纹生成，并且允许独立控制干涉条纹间距s和干涉条纹的方位角θ。

公开(公告)号：US08653472B2

公开(公告)日：2014-02-18

申请号：US12854262

申请日：2010-08-11

申请人： Ken Harada ,  Akira Sugawara ,  Noboru Moriya

发明人： Ken Harada ,  Akira Sugawara ,  Noboru Moriya

IPC分类号： G21K5/04

CPC分类号： H01J37/20 ,  H01J37/09 ,  H01J37/26 ,  H01J2237/2002 ,  H01J2237/206

摘要： The present invention is based on the property that the electric and magnetic fields are independent of each other and normal to each other and the property that the deflection of a charged particle beam by the electromagnetic field follows the rule of linear combination. The present invention employs a system that creates a region in which there exist both electromagnetic field and controls the deflection of a charged particle beam in each of the electric and magnetic fields.

摘要翻译： 本发明是基于电场和磁场彼此独立并且彼此正常的特性以及通过电磁场的带电粒子束的偏转遵循线性组合规则的性质。 本发明采用一种系统，其产生存在电磁场的区域，并控制每个电场和磁场中的带电粒子束的偏转。

公开(公告)号：US20110073759A1

公开(公告)日：2011-03-31

申请号：US12854262

申请日：2010-08-11

申请人： Ken HARADA ,  Akira Sugawara ,  Noboru Moriya

发明人： Ken HARADA ,  Akira Sugawara ,  Noboru Moriya

IPC分类号： H01J3/14

CPC分类号： H01J37/20 ,  H01J37/09 ,  H01J37/26 ,  H01J2237/2002 ,  H01J2237/206

摘要： The present invention is based on the property that the electric and magnetic fields are independent of each other and normal to each other and the property that the deflection of a charged particle beam by the electromagnetic field follows the rule of linear combination. The present invention employs a system that creates a region in which there exist both electromagnetic field and controls the deflection of a charged particle beam in each of the electric and magnetic fields.

摘要翻译： 本发明是基于电场和磁场彼此独立并且彼此正常的特性以及通过电磁场的带电粒子束的偏转遵循线性组合规则的性质。 本发明采用一种系统，其产生存在电磁场的区域，并控制每个电场和磁场中的带电粒子束的偏转。

公开(公告)号：US20110031395A1

公开(公告)日：2011-02-10

申请号：US12850961

申请日：2010-08-05

申请人： Ken Harada ,  Akira Sugawara

发明人： Ken Harada ,  Akira Sugawara

IPC分类号： H01J37/26

CPC分类号： H01J37/28 ,  H01J37/295 ,  H01J2237/1514 ,  H01J2237/2611 ,  H01J2237/2614

摘要： A first electron biprism is disposed in a condenser optical system and an observation region of a specimen is irradiated simultaneously with two electron beams of different angles. The two electron beams that have simultaneously transmitted the specimen are spatially separated and focused with a second electron biprism disposed in an imaging optical system and two electron microscopic images of different irradiation angles are obtained. The two picture images are obtained by a detecting unit. Based on the two picture images, a stereoscopic image or two images having different kinds of information of the specimen is/are produced and displayed on a display device.

摘要翻译： 第一电子双棱镜设置在聚光镜系统中，并且与两个不同角度的电子束同时照射样本的观察区域。 同时透射样品的两个电子束在空间上分离并且与设置在成像光学系统中的第二电子双棱镜聚焦，并且获得两个不同照射角度的电子显微镜图像。 两个图像由检测单元获得。 基于两个图像，产生并显示具有样本的不同种类的信息的立体图像或两个图像并显示在显示装置上。

公开(公告)号：US07808814B2

公开(公告)日：2010-10-05

申请号：US12219238

申请日：2008-07-17

申请人： Yoshihiko Togawa ,  Ken Harada ,  Tsuyoshi Matsuda ,  Yoshichika Otani ,  Takashi Kimura

发明人： Yoshihiko Togawa ,  Ken Harada ,  Tsuyoshi Matsuda ,  Yoshichika Otani ,  Takashi Kimura

IPC分类号： G11C11/02

CPC分类号： H01F10/06 ,  G11C11/14 ,  G11C11/161 ,  G11C11/1675 ,  G11C19/0808 ,  H01L43/08

摘要： The magnetization state of a ferromagnetic material is controlled by applying a current pulse to it while externally applying a weak magnetic field to it. The magnetic state of a ferromagnetic material can be switched between a uniformly magnetized state and a multiple magnetic domain structure by controlling the direction and intensity of the magnetic field applied to it and the intensity and pulse width of the current pulse. When an external magnetic field is applied, the possibility of occurrence of the reversal of the magnetic state upon application of the current pulse shows a hysteresis, and the reversal of the magnetic state can be controlled reliably. The intensity of the magnetic field to be applied may be as weak as a few gauss. Furthermore, by using such magnetic information recording elements, a magnetic information recording device (memory) that can achieve a high degree of integration can be produced.

摘要翻译： 铁磁材料的磁化状态通过向外部施加弱磁场而施加电流脉冲来控制。 通过控制施加到其的磁场的方向和强度以及电流脉冲的强度和脉冲宽度，铁磁材料的磁状态可以在均匀磁化状态和多磁畴结构之间切换。 当施加外部磁场时，在施加电流脉冲时发生磁状态反转的可能性显示滞后，并且可以可靠地控制磁状态的反转。 要施加的磁场的强度可能与几个高斯一样弱。 此外，通过使用这种磁信息记录元件，可以产生可以实现高集成度的磁信息记录装置（存储器）。

公开(公告)号：US20090206258A1

公开(公告)日：2009-08-20

申请号：US12270422

申请日：2008-11-13

申请人： Hiroto KASAI ,  Ken Harada

发明人： Hiroto KASAI ,  Ken Harada

IPC分类号： G01N23/04

CPC分类号： H01J37/26 ,  H01J37/141 ,  H01J37/20 ,  H01J2237/14 ,  H01J2237/20 ,  H01J2237/201 ,  H01J2237/2802

摘要： An electron beam observation device includes a mechanism which disposes a specimen at an upstream side in an electron beam traveling direction outside an objective lens, from which an image is transferred under a magnification of ⅕ to 1/30, in addition to an inside of the objective lens in which a specimen is disposed at a time of ordinary observation.

摘要翻译： 一种电子束观察装置，其特征在于，具有将除了内部之外的1/5〜1/30的倍率下的图像转印到物镜外部的电子束行进方向的上游侧的样本配置的机构 在普通观察时放置样品的物镜。

公开(公告)号：US20090206256A1

公开(公告)日：2009-08-20

申请号：US12324937

申请日：2008-11-28

申请人： Ken HARADA ,  Hiroto Kasai

发明人： Ken HARADA ,  Hiroto Kasai

IPC分类号： G01N23/00 ,  A61N5/00

CPC分类号： H01J37/295 ,  H01J37/26 ,  H01J2237/0492 ,  H01J2237/1514 ,  H01J2237/1523 ,  H01J2237/228 ,  H01J2237/2588 ,  H01J2237/2614

摘要： A multi-biprism electron interferometer is configured so as to arrange a plurality of biprisms in an imaging optical system of a specimen. This generally requires a plurality of ports for the electron biprisms in a magnifying optical system from an objective lens onward and also requires electromagnetic lenses, which are combined with the respective electron biprisms and operated in association therewith, to provide the interference optical system with a degree of freedom. As a result, not only the electron biprism ports but also electromagnetic lenses need to be additionally configured in the imaging optical system of a conventional electron microscope so as to display the performance as the multi-biprism electron interferometer. The present invention arranges an upper electron biprism upstream of the specimen in the traveling direction of the electron beam and forms an image of the electron biprism on the specimen (object plane) using an imaging action of a pre-field of the objective lens. A double-biprism interference optical system is constructed of a lower electron biprism disposed downstream of the objective lens up to the first image plane of the specimen. No new electromagnetic lens needs to be added in this optical system.

摘要翻译： 多双棱镜电子干涉仪被配置为在样本的成像光学系统中布置多个双棱镜。 这通常需要用于来自物镜的放大光学系统中的电子双棱镜的多个端口，并且还需要电磁透镜，其与相应的电子双棱镜组合并且与其相关联地操作，以提供具有一定程度的干涉光学系统 的自由。 结果，不仅需要在常规电子显微镜的成像光学系统中另外配置电子双棱镜端口，而且还需要电磁透镜，以显示作为多双棱镜电子干涉仪的性能。 本发明在电子束的行进方向上将样品上游的上电子双棱镜布置，并使用物镜的前场的成像动作在样本（物体面）上形成电子双棱镜的图像。 双二棱镜干涉光学系统由设置在物镜的下游直到样品的第一像面的较低电子双棱镜构成。 在该光学系统中不需要添加新的电磁透镜。

公开(公告)号：US07538323B2

公开(公告)日：2009-05-26

申请号：US10585359

申请日：2005-01-07

申请人： Ken Harada ,  Tetsuya Akashi ,  Yoshihiko Togawa ,  Tsuyoshi Matsuda ,  Noboru Moriya

发明人： Ken Harada ,  Tetsuya Akashi ,  Yoshihiko Togawa ,  Tsuyoshi Matsuda ,  Noboru Moriya

IPC分类号： G01B15/00

CPC分类号： H01J37/295 ,  H01J2237/1514 ,  H01J2237/2614

摘要： The present invention provides a technique enabling to control fringe spacing s and an interference width W independently of each other, which are important parameters for an interferometer using an electron biprism.In the present invention, two electron biprisms 9u, 9b are used in two stages along the optical axis, and fringe spacing s and an interference width W are controlled independently of each other by controlling a voltage applied to an electrode of each of the electron biprisms. Also Fresnel diffraction can be suppressed.

摘要翻译： 本发明提供一种能够彼此独立地控制边缘间隔s和干涉宽度W的技术，这是使用电子双棱镜的干涉仪的重要参数。 在本发明中，沿着光轴两级分别使用两个电子双极子9u，9b，通过控制施加到每个电子双极性电极的电压，彼此独立地控制边缘间隔s和干涉宽度W 。 也可以抑制菲涅尔衍射。