公开(公告)号：US20200166445A1

公开(公告)日：2020-05-28

申请号：US16676458

申请日：2019-11-07

Applicant: CHROMA ATE INC.

Inventor： Cheng-Ting TSAI ,  Lan-Sheng YANG ,  Shao-En CHUNG

IPC: G01N13/00

Abstract: A condensing system is used to generate a condensing layer on a surface of a test object. The condensing system includes airflow generating device and a passage device. The airflow generating device is used to generate condensing airflow. The condensing airflow has a dew point higher than a temperature of the surface of the test object. The passage device is connected to the airflow generating device, and the condensing airflow flows from the airflow generating device into the passage device. The passage device includes a flow-uniforming module. The flow-uniforming module includes at least one uniforming board. Each of the at least one uniforming board has at least a first hole.

公开(公告)号：US20190257753A1

公开(公告)日：2019-08-22

申请号：US16260743

申请日：2019-01-29

Applicant: CHROMA ATE INC.

Inventor： Chien-Hsun CHU ,  Lan-Sheng YANG

IPC: G01N21/64 ,  C12Q1/686 ,  C12Q1/6816

Abstract: An automatic fluorescence detection system includes a base and an optical assembly. The base has a detecting region. The optical assembly includes a fluorescent image-capturing device, an illumination device and a field lens. The illumination device includes a first annular illumination module and a second annular illumination module surrounding a center axis of the fluorescent image-capturing device. Lights emitted by the first annular illumination module and the second annular illumination module travel along a light-traveling path to project onto the detecting region. A distance between the first annular illumination module and the center axis is smaller than that between the second annular illumination module and the center axis. The field lens is disposed in correspondence with the detecting region. Spacing between the field lens and the detecting region is ranged from 15.0 cm to 30.0 cm.

公开(公告)号：US10291116B2

公开(公告)日：2019-05-14

申请号：US15674278

申请日：2017-08-10

Applicant: CHROMA ATE INC.

Inventor： Tsz-Lang Chen ,  Ming-Chieh Lin ,  Wen-Min Yang

IPC: G05F1/10 ,  H02M3/10 ,  H02M1/08 ,  G05F1/00 ,  H02M1/00

Abstract: An output control method for a controller includes the following steps. At each of detection time points, the controller detects a detection voltage value and a detection current value of a load. In a voltage control mode, the controller generates a setting parameter to control the power amplifier according to part of the detection voltage values. In a current control mode, the controller generates the setting parameter to control the power amplifier according to part of the detection current values. When the controller switches to the voltage control mode or the current control mode, the controller determines a ratio between the detection current value and the detection voltage value at one of the detection time points and the setting parameter is generated according to the ratio. Therefore, the bandwidth is substantially the same no matter if the controller operates in the voltage control mode or the current control mode.

公开(公告)号：US20180375470A1

公开(公告)日：2018-12-27

申请号：US16013917

申请日：2018-06-20

Applicant: CHROMA ATE INC.

Inventor： Cheng-Ting TSAI ,  Lan-Sheng YANG

IPC: H02S50/10 ,  G02B27/30 ,  H01L31/0224 ,  H01L31/048

CPC classification number: H02S50/10 ,  G02B27/30 ,  H01L31/022425 ,  H01L31/048 ,  H02S50/15

Abstract: A method for inspecting a solar cell and configured to inspect a peeling state of a three-dimensional pattern of the solar cell includes obliquely illuminating the three-dimensional pattern of the solar cell using a light beam. An image of the solar cell is normally captured. An intensity of the light beam is increased to increase a contrast between the three-dimensional pattern and a shadow of the three-dimensional pattern in the image and increase a contrast between an ink pattern of the solar cell and the shadow in the image to overexpose the ink pattern in the image. Determine if the three-dimensional pattern is peeling according to the shadow of the three-dimensional pattern in the image.

公开(公告)号：US20180323481A1

公开(公告)日：2018-11-08

申请号：US15912222

申请日：2018-03-05

Applicant: CHROMA ATE INC.

Inventor： Chih-Ming TSAI ,  Chao-Hsu CHEN ,  Han-Chou LIAO ,  Chung-Yu SIANG

IPC: H01M10/48 ,  H01M10/44 ,  G01R19/165 ,  H01M10/42

Abstract: A method is provided for testing a semi-finished battery cell. The semi-finished battery cell is charged with a constant current when a voltage difference between the first conductor and the second conductor is less than a voltage threshold. The semi-finished battery cell is charged with a constant voltage when the voltage difference between the first conductor and the second conductor is equal to or larger than the voltage threshold. An overall electric quantity is obtained after a default time period, wherein the overall electric quantity is an electric quantity charged to the semi-finished battery cell with the constant current during the default time period. Accordingly, an insulation related to electrodes of the semi-finished battery cell is determined as poor when the overall electric quantity is larger than an electric quantity threshold.

公开(公告)号：US10034410B1

公开(公告)日：2018-07-24

申请号：US15497231

申请日：2017-04-26

Applicant: CHROMA ATE INC.

Inventor： Sheng-Chin Chuang ,  Kuei-Wen Lien ,  Chung-Lin Liu ,  Ming-Ju Chuang ,  Hsiu-Wei Kuo ,  Ming-Hui Wang ,  Chih-Hsien Wang

IPC: H05K7/20 ,  H05K5/02

Abstract: A support apparatus is configured to support electronic components. The support apparatus includes a tray and a plurality of recessed structures. The tray has a cavity therein and at least one intake hole communicated with the cavity. The recessed structures are disposed on the tray and recessed toward the cavity. Each of the recessed structures is configured to accommodate at least a part of a corresponding one of the electronic components and includes a support surface and a plurality of first spacers. The support surface has an exhaust hole communicated with the cavity. The first spacers are disposed on the support surface of a corresponding one of the recessed structures. When a corresponding one of the electronic components is supported on the first spacers, any adjacent two of the first spacers and the corresponding electronic component form a first flow channel.

公开(公告)号：US09954255B2

公开(公告)日：2018-04-24

申请号：US14884822

申请日：2015-10-16

Applicant: CHROMA ATE INC.

Inventor： James E. Hopkins

IPC: H01M10/48 ,  H01M10/42 ,  G01B21/32 ,  H01M2/10

CPC classification number: H01M10/48 ,  G01B21/32 ,  H01M2/1061 ,  H01M10/4285 ,  H01M2220/30

Abstract: A measurement fixture for a battery cell is provided when the battery cell is connected to an apparatus. The measurement fixture comprises a chamber, a pressure sensor and an expansion sensor. The chamber defines a sealed space for receiving the battery cell. The pressure sensor is mounted to the chamber to sense a change of pressure in the sealed space due to a volume change of the battery cell to calculate pressure in the battery cell and the volume change of the battery cell non-contactly. The expansion sensor is mounted to the chamber to sense a deformation of the battery cell to calculate a correlation between the pressure in the battery cell and the volume change of the battery cell non-contactly.

公开(公告)号：US09841737B2

公开(公告)日：2017-12-12

申请号：US14961535

申请日：2015-12-07

Applicant: CHROMA ATE INC.

Inventor： Chih-Cherng Lu ,  Chia-Ching Ting ,  Chuan-Tse Lin

IPC: G05B11/01 ,  G01R31/28 ,  G01R31/36 ,  G01R35/00 ,  G01R31/319

CPC classification number: G05B11/01 ,  G01R31/2834 ,  G01R31/3191 ,  G01R31/3641 ,  G01R35/00 ,  G01R35/005

Abstract: An automatic test system and method are provided. The automatic test system includes at least one formation apparatus and a test fixture. The formation apparatus receives a first control command from a network and executes a test procedure according to the first control command. The test procedure includes a charging mode and a discharging mode. The test fixture is selectively coupled to the formation apparatus. During the test procedure, when the test fixture is coupled to the formation apparatus, the test fixture generates a first measurement result. The test fixture transmits the first measurement result to the formation apparatus via a wireless communication interface of the test fixture.

公开(公告)号：US09678158B2

公开(公告)日：2017-06-13

申请号：US14644552

申请日：2015-03-11

Applicant: CHROMA ATE INC.

Inventor： Chien-Ming Chen

IPC: G01R31/00 ,  G01R31/3185 ,  G01R31/28 ,  G01R1/04

CPC classification number: G01R31/318513 ,  G01R1/04 ,  G01R31/2863

Abstract: An apparatus for testing a package-on-package semiconductor device includes a top cover, a lower base, a heat dissipation module, and a plurality of probes. The lower base is disposed under the top cover so as to form an internal accommodation space for receiving an upper chip. The heat dissipation module includes a heat sink arranged in the internal accommodation space and attached to an upper surface of the upper chip. The probes are arranged in the lower base so as to electrically connect the upper chip with a lower chip. By the heat sink arranged in the internal accommodation space formed of the top cover and the lower base, heat generated from the upper chip during operation of the upper chip can be greatly dissipated so that the performance and the service life of the upper chip can be improved.

公开(公告)号：US20170045552A1

公开(公告)日：2017-02-16

申请号：US15195794

申请日：2016-06-28

Applicant: CHROMA ATE INC.

Inventor： Mao-Sheng LIU ,  Hsiu-Wei KUO ,  Chao-Hsu CHEN

IPC: G01R1/067 ,  G01R31/36

CPC classification number: G01R1/06788 ,  G01R1/06738 ,  G01R31/364

Abstract: A probe includes a first electrical conductor, a second electrical conductor and a voltage measurer. The first electrical conductor has a first through hole, and the first through hole extends through two ends of the first electrical conductor. The second electrical conductor is detachably disposed on the first electrical conductor, and the second electrical conductor has a working surface and a second through hole. The working surface is located at an end of the second electrical conductor away from the first electrical conductor. Two ends of the second through hole that are opposite to each other are located at the working surface and an end of the first through hole, respectively. The first through hole is communicated with the second through hole. The voltage measurer is penetrating through the first through hole and the second through hole.

Abstract translation: 探头包括第一电导体，第二电导体和电压测量器。 第一电导体具有第一通孔，第一通孔延伸穿过第一电导体的两端。 第二电导体可拆卸地设置在第一电导体上，第二电导体具有工作表面和第二通孔。 工作表面位于第二电导体远离第一电导体的一端。 彼此相对的第二通孔的两端分别位于工作表面和第一通孔的端部。 第一通孔与第二通孔连通。 电压测量器穿过第一通孔和第二通孔。