Abstract:
A method for wavelength-resolving and high spatial resolution fluorescence microscopy in which fluorescence labels in a sample are repeatedly excited to emit fluorescence radiation and frames including images of isolated labels are produced with a microscope. The positions of the images of the isolated fluorescing labels are localized with a localization precision exceeding the optical resolution of the imaging beam path of the microscope. The imaging beam path of the microscope has a diffractive element which, during the imaging, diffracts the image of the sample comprising the isolated fluorescing labels into a first diffraction order so that each frame contains the first diffraction order images of the isolated fluorescing labels. A parameter of the first diffraction order images of the isolated fluorescing labels is evaluated and an indication of the wavelength of the isolated fluorescing labels is derived from this evaluated parameter.
Abstract:
To enable an imaging apparatus to achieve high resolution and sufficient color reproducibility.A diffraction grating 1 is provided on the incident light side of a spectral image sensor 10, the diffraction grating 1 including scatterers such as scatterers 3, slits 5, and scatterers 7 which are disposed in that order. An electromagnetic wave is scattered by the scatterers to produce diffracted waves, and by using the fact that interference patterns between the diffracted waves change with wavelengths, signals are detected for respective wavelengths by photoelectric conversion elements 12B, 12G, and 12R in each photodiode group 12.
Abstract:
A blazed grating is disclosed as well as mode hop-free tunable lasers and a process for fabricating gratings of this type. The grating lies in a general plane and includes a plurality of elongate beams carrying mutually parallel respective reflection surfaces spaced apart from one another with a predefined pitch, each of these reflection surfaces having a normal direction inclined at a grating angle α to the normal direction of the general plane. The grating includes a plurality of resilient suspension arms connected to the beams and intended to be fastened to a grating support. A first pair of comb electrodes is provided for applying a mechanical force to this assembly, being placed on a first side of the grating, along an axis transverse to the beams, and designed so as to allow the pitch of the grating to be modified in response to the application of the mechanical force.
Abstract:
A low-cost optics, broadband, astigmatism-corrected practical spectrometer. An off-the-shelf cylindrical lens is used to remove astigmatism over the full bandwidth, providing better than 0.1 nm spectral resolution and more than 50% through-put over a bandwidth of 400 nm centered at 800 nm. The spectrometer includes a first spherical mirror disposed along an optical path in an off-axis (tilted) orientation; a diffraction grating disposed along the optical axis in a location optically downstream from the first mirror; a second spherical mirror disposed along the optical path in an off-axis orientation in a location optically down-stream from the diffraction grating; a cylindrical optic disposed in the optical path; and a detector disposed in the optical path in a location optically downstream from the second spherical mirror.
Abstract:
For achieving balance between manufacturing effort and spectrometer accuracy, a spectral decomposition device is not completely integrated into a substrate stack, but, for example, after manufacturing the substrate stack in the manufacturing process, the opportunity of compensating inaccuracies in substrate stack manufacturing is given by mounting a component with a suitable optical functional element to a window, like, e.g., an entry, exit or intermediate window of the substrate stack, to at least partially cover the respective window, wherein the optical functional element is, for example, an entry aperture, an exit aperture or also part of an optics or an optical element having a spectrally decomposing effect. The substrate stack may be manufactured on wafer level and the manufacturing tolerances in this manufacturing may be loosened, as the subsequent substrate stack-individual mounting or even window-individual mounting of the components may compensate the fluctuations which resulted in substrate stack manufacturing.
Abstract:
A spectrometer includes: an entrance aperture, a collimator, intended to produce, from a light source, a collimated input light (5), a plurality of gratings arranged in a 2-D matrix, a plurality of detectors, and an exit aperture.
Abstract:
A spectral analytical unit for acting on a parallel light bundle having different wavelengths. The spectral analytical unit includes a diffraction grating on which the light bundle falls, the diffraction grating splitting the different wavelengths through diffraction in first spectral directions defining a light bundle diffraction order 1 without recycle, and the diffraction grating bending the light bundle in second directions defining a light bundle diffraction order 0 without recycle, a detector line made up of a plurality of elements, optics for focusing the split light bundle diffraction order 1 without recycle on the detector line, evaluation electronics connected to the detector line for obtaining data related to a created spectrum, and a deflecting device wherein the diffraction order 0 light bundle without recycle meets on the deflecting device which is so directed and positioned that this light bundle falls on the diffraction grating thereby creating a reflected diffraction order 1 light bundle with first recycle and a reflected diffraction order 0 light bundle with first recycle whereby the diffraction order 1 without recycle and the reflected diffraction order 1 light bundle with first recycle each of a part wavelength range are impressed through the optics on a single element of the detector line.
Abstract:
For spectrally filtering at least one input beam, a first reflective element is configured to tilt to multiple tilt orientations that each corresponds to a different angle of propagation of at least one input beam. One or more optical elements are configured to change at least some of the relative angles of propagation of the input beam for different tilt orientations of the first reflective element. A spectrally dispersive element is configured to receive the input beam at a location at which the central ray of the input beam is incident at different points on the spectrally dispersive element for each of the tilt orientations, and configured to disperse spectral components of the input beam at different respective angles in a spectral plane. The first reflective element is configured to tilt to select at least one and fewer than all of the dispersed spectral components to be directed to a selected output path.
Abstract:
The present invention relates to an apparatus and to a method of optical spectrum analysis of an optical spectrum of a light beam (4), comprising the steps of selecting a certain part of the optical spectrum of the light beam (4) to provide a filtered light beam (12), detecting the filtered light beam (12) to provide an electrical signal corresponding to a power amplitude (O(λ)) of the filtered light beam (12), detecting the filtered light beam (12) to provide an electrical signal corresponding to a wavelength of the filtered light beam (12), and providing the power amplitude as a function of the wavelength of the filtered light beam (12).
Abstract:
Photometric methods for determining optical pathlength of liquid samples containing analytes dissolved or suspended in a solvent are provided that rely on determining a relationship between the light absorption properties of the solvent and the optical pathlength of liquid samples containing the solvent. This relationship is used to establish the optical pathlength for samples containing an unknown concentration of analyte but having similar solvent composition. Methods are also provided for determining the concentration of analyte in such samples where both the optical pathlength and the concentration of analyte are unknown. The methods may rely on separately determining, at different wavelengths of light, light absorption by the solvent and light absorption by the analyte. Light absorption by the analyte, together with the optical pathlength so determined, is used to calculate the concentration of the analyte.